Patent classifications
G01N21/453
Interferometric System and Method of Measurement of Refractive Index Spatial Distribution
An interferometric system and a method of measurement of refractive index spatial distribution for use in digital holographic microscopy to observe samples in reflected as well as transmitted radiation or to observe luminescent samples comprises a first branch and a second branch with a plurality of optical elements. The first branch comprises a diffraction grating located in a plane optically conjugated with the object plane in order to create an achromatic hologram with spatial carrier frequency in the output image plane.
Shearing interferometry measurement device for microscopy
Object interference in biological samples generated by lateral shearing interference microscopes is addressed by a shearing microscope slide comprising a periodic structure having alternating reference and sample regions. In some embodiments, the reference regions are configured to provide references that remove sample overlap in a sheared microscopic measurement. A system for generating sheared microscopic measurements is also provided that comprises an inlet configured to receive a sample material, an outlet configured to release a portion of the sample material, and a periodic structure having a plurality of interleaved reference and sample channels. In some cases, the sample channels are configured to accommodate a flow of sample material from the inlet to the outlet and the reference channels are configured to provide references that remove sample overlap in a sheared microscopic measurement.
ANALYSIS METHOD INCLUDING THE DETERMINATION OF A POSITION OF A BIOLOGICAL PARTICLE
A method of analyzing a sample receiving a particle of interest, including: defining a reference point located on a first interface of the sample, or at a known distance from the sample, along the optical axis of the optical system; acquiring a reference image transmission of the sample, the object plane of the optical system being located at a known distance from the reference point along an axis parallel to the optical axis of the optical system, and the particle of interest being located outside of the object plane; using the reference image, digitally constructing a series of reconstructed images, each associated with a predetermined offset of the object plane along the optical axis of the optical system; and using the series of reconstructed images, determining the distance along an axis parallel to the optical axis of the optical system, between the particle of interest and the reference point.
DEVICE AND METHOD FOR MOTILITY-BASED LABEL-FREE DETECTION OF MOTILE OBJECTS IN A FLUID SAMPLE
Systems and methods for detecting motile objects (e.g., parasites) in a fluid sample by utilizing the locomotion of the parasites as a specific biomarker and endogenous contrast mechanism. The imaging platform includes one or more substantially optically transparent sample holders. The imaging platform has a moveable scanning head containing light sources and corresponding image sensor(s) associated with the light source(s). The light source(s) are directed at a respective sample holder containing a sample and the respective image sensor(s) are positioned below a respective sample holder to capture time-varying holographic speckle patterns of the sample contained in the sample holder. The image sensor(s). A computing device is configured to receive time-varying holographic speckle pattern image sequences obtained by the image sensor(s). The computing device generates a 3D contrast map of motile objects within the sample use deep learning-based classifier software to identify the motile objects.
MULTI-SPECTRAL MICROSCOPIC IMAGING SPANNING THE VISIBLE AND SHORT-WAVE INFRARED RANGE
According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising: an array of light sensitive areas, each being sensitive to detect light spanning a wavelength range of at least 400-1200 nm; at least one light source configured to generate light at a plurality of wavelengths within the wavelength range, comprising at least one wavelength in a visible part of the wavelength range and at least one wavelength in a short-wave infrared, SWIR, part of the wavelength range, and arranged to illuminate the microscopic object with the generated light such that at least part of the light is scattered by the microscopic object; wherein the device is configured to transmit the scattered light and non-scattered light, from the same light source, to the array of light sensitive areas configured to detect an interference pattern formed between the scattered light and the non-scattered light, for each wavelength.
DEVICE AND A METHOD FOR IMAGING OF MICROSCOPIC OBJECTS
According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising: an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm; at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object; wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light; the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.
Microscope with rotating beam system
A microscope comprising a coherent light source producing a coherent light beam, a light beam guide system comprising a beam splitter configured to split the coherent light beam into a reference beam and a sample illumination beam, a sample holder configured to hold a sample to be observed, a sample illumination device configured to direct the sample illumination beam through the sample and into a microscope objective, a beam reuniter configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.
Interferometric speckle visibility spectroscopy
Interferometric speckle visibility spectroscopy methods, systems, and non-transitory computer readable media for recovering sample speckle field data or a speckle field pattern from an off-axis interferogram recorded by one or more sensors over an exposure time and determining sample dynamics of a sample being analyzed from speckle statistics of the speckle field data or the speckle field pattern.
Fiber splitter device for digital holographic imaging and interferometry and optical system comprising said fiber splitter device
An optical fiber splitter device comprising at least two optical fibers of different lengths is disclosed for partial or complete compensation of the optical path difference between waves interfering to generate a hologram or an interferogram. Various implementations of this fiber splitter device are described in apparatuses for holographic and interferometric imaging of microscopic and larger samples.
IMAGING THROUGH SCATTERING MEDIA
Example embodiments provide digital holographic techniques and associated systems for imaging through scattering media in a strictly one-sided observation in which the observer (e.g. the controller of the camera) has no access to the object plane nor does the observer introduce a fluorescing agent to the object plane. An example imaging system comprises a laser source, a digital sensor array, and a processing system. The processing system transmits light from the laser source to a target object; detects interference formed on the digital sensor array by a reference beam from the transmitted light and reflected light from the target object, the reflected light either travelling through or being reflected by a scattering medium located between the target object and the digital sensor array; jointly estimating, based on the detected interference, parameters defining the scattering behavior of the particular scattering medium and an image of the target object; and outputting the jointly estimated scattering parameters and an image of the target object.