There is provided a quantitative method for determining a level of a sanding surface preparation of a carbon fiber composite surface, prior to the carbon fiber composite surface undergoing a post-processing operation. The quantitative method includes fabricating a ladder panel of levels of sanding correlating to an amount of sanding of sanding surface preparation standards for a reference carbon fiber composite surface of reference carbon fiber composite structure(s); using surface analysis tools to create target values for quantifying the levels of sanding; measuring, with the surface analysis tools, sanding surface preparation location(s) on the carbon fiber composite surface of a test carbon fiber composite structure, to obtain test result measurement(s); comparing the test result measurement(s) to the levels, to obtain test result level(s); determining if the test result level(s) meet the target values; and determining whether the carbon fiber composite surface is acceptable to proceed with the post-processing operation.

A system includes a sensor for measuring a skin parameter. The sensor includes at least three spatially separated light sources for providing unpolarized visible light, a detector located at a first distance from each of the light sources selected from the range of 10-80 mm and at a second distance from the skin, and a polarizer including one or more of a segmented polarizer and a spatially varying polarizer. In a sensing mode, the light sources are configured to sequentially illuminate the skin with the light with optical axes at an angle of incidence selected from the range of 10°-80°, and the detector is configured to sequentially detect light reflected from the skin and generate corresponding detector signals.

A system includes a sensor for measuring a skin parameter. The sensor includes at least three spatially separated light sources for providing unpolarized visible light, a detector located at a first distance from each of the light sources selected from the range of 10-80 mm and at a second distance from the skin, and a polarizer including one or more of a segmented polarizer and a spatially varying polarizer. In a sensing mode, the light sources are configured to sequentially illuminate the skin with the light with optical axes at an angle of incidence selected from the range of 10°-80°, and the detector is configured to sequentially detect light reflected from the skin and generate corresponding detector signals.

A producing method of a power storage device exteriorly formed with a device case includes producing an uninspected power storage device and appearance inspecting. The appearance inspecting includes irradiating an inspection light to a to-be-inspected region, photographing diffuse reflection lights of the inspection light, detecting an appearance of the to-be-inspected region of the device case, and determining propriety of the appearance of the detected to-be-inspected region. The appearance inspecting further includes detection enabling of applying a detection enabling process for allowing detection of the appearance to a difficult-to-detect region which is difficult to detect the appearance due to high glossiness or a possible difficult-to-detect region.

Disclosed is an instrument analyzing elemental composition of a sample, including a measurement assembly including: an exciter generating an excitation directed at a target position to cause emission from the sample; a detector assembly receiving the emission from the sample at the target position, arranged to generate one or more measurement signals that are descriptive of the emission; an imaging apparatus for capturing images of an area around the target position; and a controller for carrying out a measurement, arranged to operate the exciter to generate the excitation and to carry out analysis of the elemental composition of the sample based on the measurement signals. The controller performs reliability analysis associated with the measurement by operating the imaging apparatus to capture images of the sample, determining estimated reliability of the measurement based on the captured images, and selectively issuing an indication of measurement reliability based on the estimated reliability.

Disclosed is an instrument analyzing elemental composition of a sample, including a measurement assembly including: an exciter generating an excitation directed at a target position to cause emission from the sample; a detector assembly receiving the emission from the sample at the target position, arranged to generate one or more measurement signals that are descriptive of the emission; an imaging apparatus for capturing images of an area around the target position; and a controller for carrying out a measurement, arranged to operate the exciter to generate the excitation and to carry out analysis of the elemental composition of the sample based on the measurement signals. The controller performs reliability analysis associated with the measurement by operating the imaging apparatus to capture images of the sample, determining estimated reliability of the measurement based on the captured images, and selectively issuing an indication of measurement reliability based on the estimated reliability.

Various embodiments of the present invention relate to an apparatus and method for measuring the surface of an electronic device, the apparatus comprising: a seating portion on which the electronic device is seated; a first light source for irradiating first light on the surface of the electronic device; a first camera for photographing the surface using the first light; a second light source for irradiating second light on the surface of the electronic device; a second camera for photographing the surface using the second light; and an analyzer electronically connected to the first light source, the first camera, the second light source, and the second camera, wherein the analyzer is setup to analyze the color of the surface acquired using the first light source and the first camera; and the gloss of the surface acquired using the second light source and the second camera, so as to analyze the color and gloss of the surface of the electronic device using quantified and digitized data, thereby enabling quality inspection of the surface of the electronic device without deviation. Various other embodiments are possible.

Various embodiments of the present invention relate to an apparatus and method for measuring the surface of an electronic device, the apparatus comprising: a seating portion on which the electronic device is seated; a first light source for irradiating first light on the surface of the electronic device; a first camera for photographing the surface using the first light; a second light source for irradiating second light on the surface of the electronic device; a second camera for photographing the surface using the second light; and an analyzer electronically connected to the first light source, the first camera, the second light source, and the second camera, wherein the analyzer is setup to analyze the color of the surface acquired using the first light source and the first camera; and the gloss of the surface acquired using the second light source and the second camera, so as to analyze the color and gloss of the surface of the electronic device using quantified and digitized data, thereby enabling quality inspection of the surface of the electronic device without deviation. Various other embodiments are possible.

An evaluation device evaluates an image clarity of a print image. The evaluation device includes: an object that is projected onto a measurement surface of a recording medium; an illuminator that makes the object projected onto the measurement surface; an imager that images the measurement surface on which the object has been projected to obtain image data; and a hardware processor that, based on a distribution of parameters related to a brightness of the image data, quantifies a degree of the image clarity into a numerical value and defines the numerical value as an evaluation value of the image clarity.

Provided is a grain gloss measurement apparatus capable of accurately measuring gloss of grain. A grain gloss measurement apparatus includes a light source to emit light to a measurement region for grain in an oblique direction, a light receiver to receive the light reflected from the measurement region, and a gloss value calculation device to calculate a gloss value of the grain based on the reflected light received by the light receiver. The light source includes a first light source to emit light to the measurement region from one side and a second light source to emit light from another side that is opposite to the first light source across the measurement region. The light emitted from the first light source and the light emitted from the second light source have different wavelengths. The light receiver is disposed on the same side as the second light source, and the gloss value calculation device includes an image processing unit to identify a grain zone in the measurement region based on the light of the second light source that is reflected off the grain and received by the light receiver.