A method and an LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate are described. The method comprises the steps of i) providing an LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source (A) that emits over the whole range of 8 to 14 micrometers, b) an LWIR detecting device (B) and c) a ToF distance sensor (C), ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, ii) irradiating the provided substrate with the infrared light emitting source and iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.

A method and an LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate are described. The method comprises the steps of i) providing an LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source (A) that emits over the whole range of 8 to 14 micrometers, b) an LWIR detecting device (B) and c) a ToF distance sensor (C), ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, ii) irradiating the provided substrate with the infrared light emitting source and iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.

A biological indicator includes: a BI housing; a germinant container inside the BI housing and housing a germinant composition; a germinant releaser configured to release the germinant composition from the germinant container; a germinant releaser support supporting the germinant releaser and configured to bring the germinant releaser into contact with the germinant container upon application of a force to the germinant releaser support or the germinant container; a first spore carrier inside the BI housing, the first spore carrier having a plurality of spores deposited at a first surface thereof; and an imaging window at a first surface of the BI housing. A BI reader is configured to detect and quantify the presence of live spores in the BI, and includes an excitation source, a camera for capturing images of the spores over time, and a processor for analyzing the images to determine the presence of live spores.

A biological indicator includes: a BI housing; a germinant container inside the BI housing and housing a germinant composition; a germinant releaser configured to release the germinant composition from the germinant container; a germinant releaser support supporting the germinant releaser and configured to bring the germinant releaser into contact with the germinant container upon application of a force to the germinant releaser support or the germinant container; a first spore carrier inside the BI housing, the first spore carrier having a plurality of spores deposited at a first surface thereof; and an imaging window at a first surface of the BI housing. A BI reader is configured to detect and quantify the presence of live spores in the BI, and includes an excitation source, a camera for capturing images of the spores over time, and a processor for analyzing the images to determine the presence of live spores.

In particular, a method performed by one or more devices is disclosed, the method comprising: obtaining a first intensity information item (210) representative of a spectral image (208) resulting from an soiling (202, 302) of a textile (200, 304); obtaining a second intensity information item (212, 214) representative of a spectral image (216) characteristic of at least one property of at least one part of the textile (200, 304); determining at least one treatment parameter, wherein the determination of the treatment parameter takes place dependent both on the composition of the soiling (202, 302) from the first intensity information item (210) and on the at least one property of at least the part of the textile (200, 304) from the second Intensity information item (212, 214); and outputting or triggering an outputting of the at least one treatment parameter.

In particular, a method performed by one or more devices is disclosed, the method comprising: obtaining a first intensity information item (210) representative of a spectral image (208) resulting from an soiling (202, 302) of a textile (200, 304); obtaining a second intensity information item (212, 214) representative of a spectral image (216) characteristic of at least one property of at least one part of the textile (200, 304); determining at least one treatment parameter, wherein the determination of the treatment parameter takes place dependent both on the composition of the soiling (202, 302) from the first intensity information item (210) and on the at least one property of at least the part of the textile (200, 304) from the second Intensity information item (212, 214); and outputting or triggering an outputting of the at least one treatment parameter.

A simple optical layout for a grazing angle probe mount that allows coupling to a mid-infrared (MIR), laser-based spectrometer is provided. The assembly enables doing reflectance measurements at high incident angles. In the case of optically thin films and deposits on MIR reflective substrates, a double pass effect, accompanied by absorption by the chemicals or biological samples deposited in an Infrared Reflection-Absorption Infrared Spectroscopy (IRRAS) modality is achieved. The optical system includes a probe that allows the passage of MIR light through the same sampling area twice. Initially, the infrared beam produces a spot on the surface, and then the light is returned in back reflection to the sample surface producing a new little slightly larger spot onto the selfsame position.

A method for inspecting a surface of a wafer, includes steps of: irradiating a surface of the wafer with a laser beam having three or more distinct wavelengths; detecting a reflected light from the surface of the wafer when the surface of the wafer is irradiated with the laser beam; and determining whether a foreign matter exists on the surface of the wafer based on reflectances of the surface of the wafer with respect to the laser beam having the three or more distinct wavelengths, wherein the step of determining whether the foreign matter exists includes a step of determining whether the foreign matter is a metal or a non-metal.

A method for inspecting a surface of a wafer, includes steps of: irradiating a surface of the wafer with a laser beam having three or more distinct wavelengths; detecting a reflected light from the surface of the wafer when the surface of the wafer is irradiated with the laser beam; and determining whether a foreign matter exists on the surface of the wafer based on reflectances of the surface of the wafer with respect to the laser beam having the three or more distinct wavelengths, wherein the step of determining whether the foreign matter exists includes a step of determining whether the foreign matter is a metal or a non-metal.

A terahertz scanner for detecting irregularities, such as chemical or structural variations, in a sample and methods of use thereof are described. The described terahertz scanner and algorithms allow for direct, high-sensitivity, high-throughput, and non-invasive detection of irregularities that range from chemical contaminant to material defects in a variety of substrates and settings.