Patent classifications
G01N2201/0655
Light measurement device and light measurement method
A spectrometry device includes a light source, an integrator configured to have an internal space in which a long afterglow emission material is disposed and output detection light from the internal space, a spectroscopic detector, an analysis unit configured to analyze a photoluminescence quantum yield of the long afterglow emission material, and a control unit configured to control switching between presence and absence of input of excitation light to the internal space and an exposure time in the spectroscopic detector. The control unit controls the light source so that the input of the excitation light to the internal space is maintained in a first period and the input of the excitation light to the internal space is stopped in a second period, and controls the spectroscopic detector so that an exposure time in the second period becomes longer than an exposure time in the first period.
Quality measurement method and quality measurement device for long sheet material
The quality measurement method for a long sheet material W includes measuring cellulose fibers, % moisture, and % ash of the paper web W by using area cameras 1102 to 1106 having an infrared light receiving element and a light source 1100 having an infrared light emitting LED element. Performance check for the infrared cameras 1102 to 1106 over the entire width and correction of measured values are performed by using consistency between measured values for the same point in an overlap area measured by adjacent cameras and reference samples 1107 at the off-sheet positions provided at both sides.
COMPACT IN-LINE NON-CONTACT OPTICAL PROPERTY MEASUREMENT SYSTEM
Disclosed herein are compact, on line, real-time, non-contact optical property measurement systems and methods thereof capable of measuring optical quality such as haze, clarity, luminance of a film during the film manufacturing process. More specifically, the optical property measurement system can move in the transverse direction along the film while the film is on the line, thereby measuring the optical property of the film in real time at various locations on the film in both the transverse and machine direction.
QUALITY MEASUREMENT METHOD AND QUALITY MEASUREMENT DEVICE FOR LONG SHEET MATERIAL
The quality measurement method for a long sheet material W includes measuring cellulose fibers, % moisture, and % ash of the paper web W by using area cameras 1102 to 1106 having an infrared light receiving element and a light source 1100 having an infrared light emitting LED element. Performance check for the infrared cameras 1102 to 1106 over the entire width and correction of measured values are performed by using consistency between measured values for the same point in an overlap area measured by adjacent cameras and reference samples 1107 at the off-sheet positions provided at both sides.
LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD
A spectrometry device includes a light source, an integrator configured to have an internal space in which a long afterglow emission material is disposed and output detection light from the internal space, a spectroscopic detector, an analysis unit configured to analyze a photoluminescence quantum yield of the long afterglow emission material, and a control unit configured to control switching between presence and absence of input of excitation light to the internal space and an exposure time in the spectroscopic detector. The control unit controls the light source so that the input of the excitation light to the internal space is maintained in a first period and the input of the excitation light to the internal space is stopped in a second period, and controls the spectroscopic detector so that an exposure time in the second period becomes longer than an exposure time in the first period.
Optics cup with curved bottom
The present invention relates to a system for conducting the identification and quantification of micro-organisms, e.g., bacteria, in biological samples. More particularly, the invention relates to a system comprising a disposable cartridge and an optics cup or cuvette having a tapered surface; wherein the walls are angled to allow for better coating and better striations of the light. The system may utilize the disposable cartridge in the sample processor and the optics cup or cuvette in the optical analyzer, wherein the optics cup also has a floor in the shape of an inverted arch.
INSPECTION DEVICE
An inspection device is disclosed and includes: an illuminator and a camera, the illuminator including: a housing; light source disposed in the housing; and a light guide plate having an end surface, an upper surface provided with a large number of two-dimensionally arrayed transparent hemispherical bodies formed thereon, and a lower surface, the light guide plate disposed in the housing in a state where the end surface faces the light source so as to introduce light from the light source, to reflect the light downward by the hemispherical bodies, and to irradiate an article placed below the lower surface with the light; and the camera being disposed above the upper surface of the light guide plate 6 to receive reflected light from the article and to photograph the article.
Illumination system for recognizing material and method of recognizing material using the same
An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.
ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZING MATERIAL USING THE SAME
An illumination system includes a measurement stage on which a measurement target is located, a light-providing part having illumination sections providing multi-directional incident lights to the measurement target, a light-receiving part receiving single-directional reflection lights reflected by the measurement target according to the multi-directional incident lights, and a processing part that performs acquiring a first distribution of intensities the single-directional reflection lights with respect to the multi-directional incident lights, acquiring, from the first distribution, a second distribution of intensities of multi-directional reflections lights with respect to a single-directional incident light, and determining material of the measurement target based on parameters of the second distribution. A method of recognizing material using the illumination system and a computer readable non-transitory recording medium recording a program embodying the method are provided.
Apparatus and method for performing spectroscopic analysis of a subject using a frustum shaped reflective cavity
This invention relates to a light delivery and collection device for performing spectroscopic analysis of a subject. The light delivery and collection device comprises a reflective cavity with two apertures. The first aperture receives excitation light which then diverges and projects onto the second aperture. The second aperture is applied to the subject such that the reflective cavity substantially forms an enclosure covering an area of the subject. The excitation light interacts with the covered area of the subject to produce inelastic scattering and/or fluorescence emission from the subject. The reflective cavity reflects the excitation light as well as the inelastic scattering and/or fluorescence emission that is reflected and/or back-scattered from the subject and redirects it towards the subject. This causes more excitation light to penetrate into the subject hence enabling sub-surface measurement and also improves the collection efficiency of the inelastic scattering or fluorescence emission. The shape of the reflective cavity is optimized to further improve the collection efficiency.