A spectroscopic measurement apparatus includes a light source, an integrator, a spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, a sample attachment portion for attaching the measurement object, and a filter attachment portion for attaching a filter unit. The filter unit has a transmission spectrum in which an attenuation rate for excitation light is larger than an attenuation rate for up-conversion light, and attenuates the light output from the light output portion. The analysis unit analyzes luminous efficiency of the measurement object on the basis of the transmission spectrum data and the spectroscopic spectrum data acquired by the spectroscopic detector.

Disclosed herein are light diffuser devices comprising a sphere having at least two openings, a track, a light source, a cart, and one or more plates, and their methods of use. Also, disclosed here are light diffuser systems comprising a light diffuser device and a portable infrared gas analyzer.

A system and method of non-contact measurement of the dopant content of semiconductor material by reflecting infrared (IR) radiation off of the material into an integrating sphere to scatter the received radiation and passing portions of the radiation through band pass filters of differing wavelength ranges, comparing the level of energy passed through each filter and calculating the dopant content by referencing a correlation curve made up of known wafer dopant content for that system.

An approximation B′f(Id,λ) of a fluorescence spectral emissivity coefficient by a standard illumination light Id is obtained at following steps from spectral power distributions R(Ik,λ) of sample radiation lights radiated from a fluorescence whitened sample when the fluorescence whitened sample is sequentially illuminated with a plurality of excitation lights Ik having different spectral power distributions, and a spectral power distribution Id(λ) of the standard illumination light Id. Spectral power distributions Rf(Ik,λ) of fluorescence are obtained from the spectral power distributions R(Ik,λ) by respective excitation lights Ik (first step). The spectral power distributions Rf(Ik,λ) of fluorescence by the respective excitation lights Ik are linearly combined with a given weighting coefficient Wk, and an approximation R′f(Id,λ) of a spectral power distribution of fluorescence by the standard illumination light Id is obtained by equation (second step: #11). From the approximation R′f(Id,λ) and the spectral power distribution Id(λ) of the standard illumination light Id, the approximation B′f(Id,λ) is obtained by equation (third step: #12).

This invention relates to an apparatus for retro-reflection measurement. By using the one or more sampling devices each consists of a holed mirror and an circular aperture, and corresponding one or more measuring devices, it realize the retro-reflection measurement in one or more observation angles at one time. By flexibly selecting the size of the circular apertures and holed mirrors, it can accurately adjust the measuring annular bands and corresponding observation angles. Without any other intermediate devices, it can realize complete annular band of light measurement which ensures the measurement accuracy. At the same time, filters and monitor device can be set flexibly to realize various measurement functions. It has the advantages of speed measurement, high accuracy, small volume, wide application, comprehensive functions, and can be widely applied in laboratory, industrial production line and field measurement etc.

A spectroscopic measurement apparatus includes a light source, an integrator, a first spectroscopic detector, a second spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, and a sample attachment portion for attaching the measurement object. The first spectroscopic detector receives the light output from the integrator, disperses the light of a first wavelength region, and acquires first spectrum data. The second spectroscopic detector receives the light output from the integrator, disperses the light of a second wavelength region, and acquires second spectrum data. The first wavelength region and the second wavelength region include a wavelength region partially overlapping each other.

A system (100) for viewing and ascertaining optical characteristics of gemstones, said system including a first and second integrating sphere (150,150a), wherein each integrating sphere (150,150a) is in optical communication with each other and having a spacer portion (116) disposed therebetween, a first light source (118) engaged with the first sphere (150) and for providing light to the interior of the first sphere (150) and a second light source (118a) engaged with the second sphere (150a) and for providing light to the interior of the second sphere (150a); at least one optical image acquisition device (110) in communication with the interior of one of the spheres for acquisition of an optical image of a gemstone disposed in a region between the spheres; a transparent platform (117) for supporting the gemstone between the two integrating spheres (150,150a); and a control module (120) in communication with the optical image acquisition device (110), for controlling the acquisition of optical images of gemstones thereof; wherein said optical image of the gemstone is processed by a processor to ascertain one or more optical characteristics of the gemstone.

Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.

A calibration device includes one or more processors. The one or more processors acquire a measured value obtained when a spectroscopic light source configured to output uniform light with a predetermined spectroscopic wavelength and configured to change the spectroscopic wavelength outputs the uniform light while changing the spectroscopic wavelength of the uniform light and a spectroscopic measurement unit to be calibrated spectroscopically measures the outputted uniform light. The one or more processors acquire a target value for each of the spectroscopic wavelengths obtained when the spectroscopic measurement unit measures the uniform light. The one or more processors calculate a transformation matrix for transforming the measured value, based on the measured value and the target value.

A method for moisture testing of a fully assembled photovoltaic (PV) module. An assembled PV module is probed with short wave IR probe energy in the range of 1700-2000 nm. Energy reflected from the assembled PV module is collected and directed to a sensor. Noise is removed from a signal of the sensor with reference to the probe energy. Absorption is of the probe energy is determined. The absorption is correlated to moisture in the PV module. A preferred system that carries out the method provides a signal-to-noise ratio (as defined by standard deviation/mean of measured reflectance) of at least 3800.