An inspection system is provided for the inspection of a lateral surface of a three-dimensional test object. The inspection system includes a conveying structure; (ii) a facet mirror; and (iii) an optical inspection device. In this context, the inspection system is arranged to rotate the conveying structure and the facet mirror in a coordinated manner and in opposite directions of rotation in such a way that each of a plurality of object carriers, as they pass through an inspection area, is imaged onto the inspection device by exactly one of the facets of the facet mirror. A corresponding method for inspection is also provided.

A method and apparatus (1) for monitoring particles flowing in a stack are disclosed. The method comprises emitting light from a light source along an optical path for scattering from the particles, rotating a rotatable monitoring assembly (15) mounted in the optical path, and detecting the scattered light using a detector. The rotatable monitoring assembly (15) contains at least two in apertures, and the method further comprises rotating the rotatable monitoring assembly (15) into a plurality of different configurations. In an operation configuration, light passes through the rotatable monitoring assembly (15) and into the stack unimpeded. In a zero-check configuration, the rotatable monitoring assembly (15) blocks the light from reaching the stack. In a span-check configuration, light of varying intensity passes from the light source through the rotatable monitoring assembly (15) into the stack. In a contamination-check configuration, the light is reflected through the rotatable monitoring assembly (15) onto the detector, without entering the stack. In the safety-shutter configuration, the rotatable monitoring assembly (15) protects optical components in the instrument from particles in the stack.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

An inspection system is provided for the inspection of a lateral surface of a three-dimensional test object. The inspection system includes a conveying structure; (ii) a facet mirror; and (iii) an optical inspection device. In this context, the inspection system is arranged to rotate the conveying structure and the facet mirror in a coordinated manner and in opposite directions of rotation in such a way that each of a plurality of object carriers, as they pass through an inspection area, is imaged onto the inspection device by exactly one of the facets of the facet mirror. A corresponding method for inspection is also provided.

An object is to provide a light irradiation apparatus irradiating a light to a sample in a reaction vessel while stirring the sample more efficiently. A rotating stage can rotate around a first axis being a central axis thereof. A holding mechanism holds reaction vessels whose longitudinal directions are a direction of the central axis on a circumference around the first axis on the rotating stage at equal intervals. Rotation mechanisms hold bottoms of the reaction vessels and rotate the reaction vessels around second axes being central axes of the reaction vessels, respectively. Light irradiation mechanisms are arranged on a circumference outside of the rotating stage and at least one light emitting diode is disposed in each light irradiation mechanism. Stirring mechanisms are arranged in the vicinity of the reaction vessels and rotate stir bars around axes of directions orthogonal to the second axes by magnetic force, respectively.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

A method and apparatus (1) for monitoring particles flowing in a stack are disclosed. The method comprises emitting light from a light source along an optical path for scattering from the particles, rotating a rotatable monitoring assembly (15) mounted in the optical path, and detecting the scattered light using a detector. The rotatable monitoring assembly (15) contains at least two in apertures, and the method further comprises rotating the rotatable monitoring assembly (15) into a plurality of different configurations. In an operation configuration, light passes through the rotatable monitoring assembly (15) and into the stack unimpeded. In a zero-check configuration, the rotatable monitoring assembly (15) blocks the light from reaching the stack. In a span-check configuration, light of varying intensity passes from the light source through the rotatable monitoring assembly (15) into the stack. In a contamination-check configuration, the light is reflected through the rotatable monitoring assembly (15) onto the detector, without entering the stack. In the safety-shutter configuration, the rotatable monitoring assembly (15) protects optical components in the instrument from particles in the stack.