G01N2201/125

Block-to-Block Reticle Inspection

Block-to-block reticle inspection includes acquiring a swath image of a portion of a reticle with a reticle inspection sub-system, identifying a first occurrence of a block in the swatch image and at least a second occurrence of the block in the swath image substantially similar to the first occurrence of the block and determining at least one of a location, one or more geometrical characteristics of the block and a spatial offset between the first occurrence of the block and the at least a second occurrence of the block.

Reconfigurable integrated circuits for adjusting cell sorting classification

Aspects of the present disclosure include reconfigurable integrated circuits for characterizing particles of a sample in a flow stream. Reconfigurable integrated circuits according to certain embodiments are programmed to calculate parameters of a particle in a flow stream from detected light; compare the calculated parameters of the particle with parameters of one or more particle classifications; classify the particle based on the comparison between the parameters of the particle classifications and the calculated parameters of the particle; and adjust one or more parameters of the particle classifications based on the calculated parameters of the particle. Methods for characterizing particles in a flow stream with the subject integrated circuits are also described. Systems and integrated circuit devices programmed for practicing the subject methods, such as on a flow cytometer, are also provided.

LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION APPARATUS, SPECTRUM DETECTION METHOD AND LIGHTING CORRECTION METHOD
20220373453 · 2022-11-24 ·

A light emitting apparatus has light emitting units. The light emitting units can be respectively provided with current densities, so that the light emitted by each of the light emitting unit has a light intensity, wherein the current densities are different from each other, or partial of the current densities are different from each other. A number of the light emitting units can be larger than or equal to four, all of the four lighting frequencies of the four light emitting units are different from each other, or partial of the four lighting frequencies of the four light emitting units are identical to each other, and the light emitting apparatus and the object under test rotate relative to each other. A light emitting method, a spectrum detection method and a lighting correction method are also illustrated for increasing SNR, correcting the light intensity or the spectrum signal.

SPECTRAL IMAGING SYSTEM AND METHOD FOR LOW SIGNAL DETECTION AND PROCESSING
20220364992 · 2022-11-17 ·

Hardware and control software for use in the field of digital imaging and spectroscopy. More particularly, a hardware and software system that simultaneously measures electromagnetic energy as quantities of photons in distinct wavelength regions across the ultraviolet, visible, and infrared spectrum. The system records the measurements as digital data and employs a processor (preferably a programmable processor) that executes processing steps to enhance the spatial and spectral fidelity of the recorded signals. More specifically, the electro-optical sensor hardware is engineered to maximize the light collection efficiency, especially for low light intensities, by using multiple detectors, each of which is optimized individually to maximize its sensitivity to specific wavelength regions of interest. The detector system also employs a variable amplification process that is dependent on the signal intensity so that low signals can be increased for better detection while high signals are amplified less to stay within the dynamic range of the optical sensor that is used to convert the analog signal to a digital value. Solutions to existing problems of low light detection are provided as are new capabilities for data collection and analysis in previously undetectable low signal regimes. The systems and methods are applicable to a broad array of imaging applications in diverse fields from biomedical imaging to astronomy and remote sensing.

SYSTEMS AND METHODS FOR THE IN-LINE MEASUREMENT OF ALKALI METAL-CONTAINING STRUCTURES AND ALKALI ION-CONTAINING STRUCTURES
20230160821 · 2023-05-25 ·

Embodiments of the present disclosure generally relate to systems and methods for in-line measurement of alkali metal-containing structures or alkali ion-containing structures of, e.g., electrodes. In an embodiment, a system for processing an electrode is provided. The system includes a first processing chamber for forming an electrode comprising an alkali metal-containing structure. The system further includes a metrology station coupled to and in-line with the first processing chamber, the metrology station comprising: a source of radiation for delivering radiation to the alkali metal-containing structure, and an optical detector for receiving an emission of radiation emitted from the alkali metal-containing structure, and a processor configured to determine a characteristic of the alkali metal-containing structure of the electrode based on the emission of radiation.

System for determining a composition of a sample using wavelength dependent variability measurement with multiple time intervals

Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.

INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING DETECTING AND ANALYZING MOLECULES

Apparatus and methods for analyzing single molecule and performing nucleic acid sequencing. An integrated device includes multiple pixels with sample wells configured to receive a sample, which, when excited, emits radiation; at least one element for directing the emission radiation in a particular direction; and a light path along which the emission radiation travels from the sample well toward a sensor. The apparatus also includes an instrument that interfaces with the integrated device. Each sensor may detect emission radiation from a sample in a respective sample well. The instrument includes an excitation light source for exciting the sample in each sample well.

X-ray analyzer

A fluorescent X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit while maintaining a state in which an input element of the input unit is held, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.

Integrated device with external light source for probing detecting and analyzing molecules

Apparatus and methods for analyzing single molecule and performing nucleic acid sequencing. An integrated device includes multiple pixels with sample wells configured to receive a sample, which, when excited, emits radiation; at least one element for directing the emission radiation in a particular direction; and a light path along which the emission radiation travels from the sample well toward a sensor. The apparatus also includes an instrument that interfaces with the integrated device. Each sensor may detect emission radiation from a sample in a respective sample well. The instrument includes an excitation light source for exciting the sample in each sample well.

Block-to-block reticle inspection

Block-to-block reticle inspection includes acquiring a swath image of a portion of a reticle with a reticle inspection sub-system, identifying a first occurrence of a block in the swatch image and at least a second occurrence of the block in the swath image substantially similar to the first occurrence of the block and determining at least one of a location, one or more geometrical characteristics of the block and a spatial offset between the first occurrence of the block and the at least a second occurrence of the block.