An analytical method for determining a concentration of an analyte is disclosed. In this method, an image of an optical test strip having a body fluid applied thereto is obtained with a camera of a mobile device. Local temperature information is received at a current location of the mobile device from a temperature source such as a remote weather information service or temperature sensor. Additional local temperature information is received by the mobile device from a thermochromic field provided on the test strip and/or on a color reference card. A processor determines a correction temperature and/or a correction temperature function using the local temperature information. The processor also determines the analyte concentration from the image captured and taking into account the correction temperature information.

Systems and methods for calibrating non-spatial measurements of a device under test (DUT) for misalignment between the DUT and a non-spatial measurement device are disclosed herein. A system for generating a misalignment calibration database can include, for example, a non-spatial measurement device and a high-precision translation stage. The system can generate a misalignment calibration database by taking measurements of a DUT at multiple misalignment locations. A system for measuring a DUT can include, for example, a spatial measurement device, a non-spatial measurement device, a translation stage, and/or a carrier tray. The system can capture measurements of the DUT at a first position and calibrate the measurements for misalignment using calibration data corresponding to the first position. For example, the system can retrieve calibration data from a calibration misalignment system that was taken at the same and/or different locations proximate the position of the DUT.

A calibration apparatus for calibrating an emission spectroscopy analyzer that monitors plasma generated in a plasma processing apparatus. The calibration apparatus comprises a base substrate; a plurality of light emitting devices disposed on the base substrate, each light emitting device of the plurality of light emitting devices is configured to emit light having different wavelengths from other light emitting devices of the plurality of light emitting devices; a reflector disposed on the base substrate, the reflector configured to reflect the light emitted by the plurality of light emitting devices toward an outside of the base substrate in a plan view; and a control device disposed on the base substrate, the control device configured to control the plurality of light emitting devices.

A device may determine a calibration value for a spectrometer using light from a first light source; deactivate the first light source after determining the calibration value; perform measurement with regard to a sample based on the calibration value, wherein the measurement of the sample is performed using light from a second light source; determine that the calibration value is to be updated; and update the calibration value using the light from the first light source.

A device may determine a calibration value for a spectrometer using light from a first light source; deactivate the first light source after determining the calibration value; perform measurement with regard to a sample based on the calibration value, wherein the measurement of the sample is performed using light from a second light source; determine that the calibration value is to be updated; and update the calibration value using the light from the first light source.

A device may determine a calibration value for a spectrometer using light from a first light source; deactivate the first light source after determining the calibration value; perform measurement with regard to a sample based on the calibration value, wherein the measurement of the sample is performed using light from a second light source; determine that the calibration value is to be updated; and update the calibration value using the light from the first light source.

A device may determine a calibration value for a spectrometer using light from a first light source; deactivate the first light source after determining the calibration value; perform measurement with regard to a sample based on the calibration value, wherein the measurement of the sample is performed using light from a second light source; determine that the calibration value is to be updated; and update the calibration value using the light from the first light source.

A device may determine a calibration value for a spectrometer using light from a first light source; deactivate the first light source after determining the calibration value; perform measurement with regard to a sample based on the calibration value, wherein the measurement of the sample is performed using light from a second light source; determine that the calibration value is to be updated; and update the calibration value using the light from the first light source.

A device may determine a calibration value for a spectrometer using light from a first light source; deactivate the first light source after determining the calibration value; perform measurement with regard to a sample based on the calibration value, wherein the measurement of the sample is performed using light from a second light source; determine that the calibration value is to be updated; and update the calibration value using the light from the first light source.

The invention relates to a method for measuring a concentration of a gas in a gas mixture, said method comprising that: a light beam modulated in a ramp shape and/or in a step shape in its wavelength and additionally periodically modulated, in particular in its wavelength, is transmitted from a light source, in particular a laser, into a measurement zone; the modulated light beam passes through a gas mixture in the measurement zone and is detected as reception light by a detector, wherein the reception light is converted by the detector into a detector signal; a derivative signal is determined based on the detector signal by performing a transformation of the detector signal into the frequency range, in particular by a Fourier transform of the detector signal, wherein an evaluation of the detector signal transformed into the frequency range is performed, in particular only, for an n-fold of the frequency of the modulated light beam in order to obtain the derivative signal; and at least two measurement values of a phase of the derivative signal are determined and a correction function is calculated based on the determined measurement values of the phase of the derivative signal in order to correct the derivative signal with the correction function.