A method of non-destructive detection of surface and near surface abnormalities in a metallic product. The method comprises positioning a sample having a surface under a source of an incident radiation. The surface of the sample is then irradiated with the incident radiation from the source. A scattered radiation is detected and a radiation pattern from the detected scattered radiation is produced. Said radiation pattern is then analysed and the output indicative of the scattered radiation from the sample is produced. Said produced output is then compared with a threshold value, the threshold value indicative of a maximum acceptable detected surface abnormality. Finally, the presence of a surface abnormality is identified when the output exceeds the threshold value.

The present invention provides a novel method for identifying a molecular structure by a single crystal X-ray analysis. A single crystal that gives an X-ray diffraction spectrum sufficient for determining a structure of a molecule can be efficiently obtained by including a test molecule in a metal complex, and then crystallizing the test-molecule included in the metal complex. By analyzing this single crystal by an X-ray analysis, it is possible to determine a structure of the test molecule without obtaining a single crystal of the test molecule. With the novel method according to the present invention, the structure of a test molecule in a trace amount of a sample can also be determined.

A method of non-destructive detection of surface and near surface abnormalities in a metallic product. The method comprises positioning a sample having a surface under a source of an incident radiation. The surface of the sample is then irradiated with the incident radiation from the source. A scattered radiation is detected and a radiation pattern from the detected scattered radiation is produced. Said radiation pattern is then analysed and the output indicative of the scattered radiation from the sample is produced. Said produced output is then compared with a threshold value, the threshold value indicative of a maximum acceptable detected surface abnormality. Finally, the presence of a surface abnormality is identified when the output exceeds the threshold value.

A compact and small size multichannel collimator for neutrons with energies up to 50 keV is provided. The collimator has a multichannel structure composed of collimating channels (in air, vacuum or in the non-interacting atmosphere of Helium-4) alternating with “full” channels made with absorbent materials for slow neutrons. The geometry of the individual collimating and absorbing channels can be arbitrary. The geometry with channels of square section, such as to create a perfect checkerboard, is preferred from the point of view of ease of construction.

A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.

The present invention provides a novel method for identifying a molecular structure by single crystal X-ray analysis. A single crystal that gives an X-ray diffraction spectrum sufficient for determining the structure of the molecule can be efficiently obtained by including a test molecule in a metal complex and then crystallizing the test-molecule-including metal complex. By analyzing this single crystal by X-ray analysis, it is possible to determine the structure of the test molecule without obtaining a single crystal of the test molecule. With the method according to the present invention, the structure of a test molecule in a trace amount of sample can also be determined.

A system (100) for producing analysis data indicative of presence of one or more predetermined components in a sample (110) is presented. The system includes source equipment (120) for directing a particle stream (130) towards the sample (110), detector equipment (140) for measuring a distribution of particles scattered from the sample (110) as a function of a scattering angle (), and processing equipment (170) for producing the analysis data based on the measured distribution of the scattered particles and on reference information indicative of an effect of the one or more predetermined components on the distribution of the scattered particles. The scattering angle related to each scattered particle is an angle between an arrival direction of the particle stream and a trajectory (160) of the scattered particle. The system utilizes different directional properties of scattering related to different isotopes, different chemical substances, and different isomers.

A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.

According to one embodiment, a crystal phase information extraction apparatus includes a first estimation unit and a second estimation unit. The first estimation unit estimates first crystal phase information on a first polycrystalline material. The second estimation unit performs, using the first crystal phase information, iterative optimization on diffraction data acquired from a second polycrystalline material having a component ratio of a crystal phase of interest smaller than that of the first polycrystalline material, and estimates second crystal phase information on the second polycrystalline material.

A component residual stress testing platform based on neutron diffraction and experimental method thereof are provided, the testing platform includes a component support, a rotating mainshaft, a first thrust cylindrical roller bearing, a first cylindrical roller bearing, a bearing spacing sleeve, a second cylindrical roller bearing, a sleeve, and a first fixed baffle. The rotating mainshaft is disposed on the component support. The first thrust cylindrical roller bearing, the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing are sleeved on the rotating mainshaft, the sleeve is sleeved outside the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing, a component to be tested is sleeved on the sleeve. The testing platform can support, move, tilt and rotate the component to be tested in a process of a residual stress testing.