A rock modeling method is disclosed. An effective rock property of a rock sample is determined based on a digital rock. Instead of upscaling rock properties, the digital rock is constructed by upscaling relationships and rock physics models of segmented rock materials. Relationships between different scalar, elastic, and petrophysical properties of different segmented rock materials are established at the high-resolution scale where the pore structure is resolved. These relationships are then applied to the same rock material at the macro-scale. Finally, the effective rock properties are computed using Darcy-like solver to get the final values at a representative rock volume. Embodiments allow for performing non-destructive fluid/solid substitution and other reproducible digital experiments to study control factors that affect these relationships within rocks. Accordingly, for unconventional reservoirs, organic matter porosity can be filled with organic matter (kerogen) to build a rock physics model based on kerogen maturity and pore size.

A rock modeling method is disclosed. An effective rock property of a rock sample is determined based on a digital rock. Instead of upscaling rock properties, the digital rock is constructed by upscaling relationships and rock physics models of segmented rock materials. Relationships between different scalar, elastic, and petrophysical properties of different segmented rock materials are established at the high-resolution scale where the pore structure is resolved. These relationships are then applied to the same rock material at the macro-scale. Finally, the effective rock properties are computed using Darcy-like solver to get the final values at a representative rock volume. Embodiments allow for performing non-destructive fluid/solid substitution and other reproducible digital experiments to study control factors that affect these relationships within rocks. Accordingly, for unconventional reservoirs, organic matter porosity can be filled with organic matter (kerogen) to build a rock physics model based on kerogen maturity and pore size.

A method includes capturing a photon emission microscope (PEM) image of an integrated circuit (IC), and identifying emission sites in the PEM image, where the emission sites are associated with a leakage current. A set of common nets is found that connects multiple emission sites using layout data and/or netlist data in computer-aided design (CAD) data. From the layout data and/or netlist data, a critical net is identified from the set of common nets connecting a threshold number of emission sites. The critical net is cross-mapped, by a processor, tip netlist data in the CAD data. A particular device is identified from the netlist data that has an output pin connected to the critical net. The particular device identified from the netlist data is cross-mapped, by a processor, to the layout data, wherein the critical net connects at least two devices at the identified emission sites including the particular device.

A method includes capturing a photon emission microscope (PEM) image of an integrated circuit (IC), and identifying emission sites in the PEM image, where the emission sites are associated with a leakage current. A set of common nets is found that connects multiple emission sites using layout data and/or netlist data in computer-aided design (CAD) data. From the layout data and/or netlist data, a critical net is identified from the set of common nets connecting a threshold number of emission sites. The critical net is cross-mapped, by a processor, tip netlist data in the CAD data. A particular device is identified from the netlist data that has an output pin connected to the critical net. The particular device identified from the netlist data is cross-mapped, by a processor, to the layout data, wherein the critical net connects at least two devices at the identified emission sites including the particular device.

Methods and systems for imaging a sample with a charged particle microscope comprises after scanning a region of interest (ROI) of a sample with an electron beam and acquiring X-rays emitted from the sample, scanning the ROI with an ion beam and acquiring ion-induced photons emitted from the sample. A spatial distribution of multiple elements in the sample may be determined based on both the acquired X-rays and the acquired ion-induced photons.

An analysis and observation device includes an analysis unit, a primary storage device that reads a substance library in which types of substances are associated with a plurality of characteristics, and a processor that executes processing based on the substance library. The substance library is configured by storing hierarchical information of superclasses each of which represents a general term of a substance and subclasses each of which represents a type of the substance. A processor includes: a spectrum acquirer that acquires an intensity distribution spectrum; a characteristic extractor that extracts a characteristic of a substance based on the intensity distribution spectrum; a substance estimator that estimates the type of the substance from subclasses based on the extracted characteristic; and a user interface controller that causes a display to display the estimated subclass and the superclass to which the subclass belongs in a hierarchical manner.

An analysis and observation device includes an analysis unit, a primary storage device that reads a substance library in which types of substances are associated with a plurality of characteristics, and a processor that executes processing based on the substance library. The substance library is configured by storing hierarchical information of superclasses each of which represents a general term of a substance and subclasses each of which represents a type of the substance. A processor includes: a spectrum acquirer that acquires an intensity distribution spectrum; a characteristic extractor that extracts a characteristic of a substance based on the intensity distribution spectrum; a substance estimator that estimates the type of the substance from subclasses based on the extracted characteristic; and a user interface controller that causes a display to display the estimated subclass and the superclass to which the subclass belongs in a hierarchical manner.

Systems and methods related to the use of a proton/deuteron cyclotron for materials analysis and other industrial applications are provided. The methods, apparatuses and uses include positioning a target material for irradiation on a sample holder, focusing a hydrogen ion beam or a deuteron ion beam, such as a negative hydrogen ion or negative deuteron ion beam, from the cyclotron to the target material, irradiating the target material to induce a (d,*) or a (p,*) reaction thereby producing a radiation emission, and detecting the radiation emission using a detector, wherein the particle beam produced by the cyclotron has an energy in a range of from and including 1 MeV to 3 MeV and has a beam current in a range of from and including 5 pA to 100 nA.

An object of the invention is to easily acquire an image of a position corresponding between each section in an imaging device that acquires an image of a plurality of sample sections. The imaging device according to the invention calculates, according to a correspondence relationship between a characteristic point and a first observation region in a first sample section, coordinates of a second observation region of a second sample section, and generates an observation image at the calculated coordinates (see FIG. 7B).

A novel method for cross-section sample preparation has a sample oriented normal to an SEM/GFIS or other imaging column via a stage, and is operated upon by an FIB to form the cross-section pre-lamella within the sample, followed by an approximate 90° rotation with no tilt of the stage for cut out by the FIB. Asymmetric trenches are milled to have a three-dimensional depth profile to ensure that the FIB has clear line of sight to a face of the resulting pre-lamella when the sample has been rotated. The three-dimensional depth profile further minimizes overall milling time required for the preparation of the pre-lamella.