A method for automatically cleaning a probe card includes the following operations. A first wafer is tested in a chamber of a testing machine. A yield of the first wafer is monitored by a tool online monitor system (TOMS). An instruction file is transmitted by the TOMS to a tester, in which the instruction file compiles a first program code of the TOMS into a second program code of the tester. The second program code of the tester is received by the tester. A general purpose interface bus (GPIB) command is transferred to a testing machine by the tester. A cleaning operation is performed by the testing machine.

Probe cards for probing highly-scaled integrated circuits are provided. A probe card includes a backplane and an array of probes extending from the backplane. Each of the probes includes a cantilever member and a probe tip. A first end of the cantilever member is coupled to the backplane, such that the cantilever member extends from the backplane. The probe tip extends from a second end of the cantilever member. The probes are fabricated from semiconductor materials. Each probe is configured to transmit electrical signals between the backplane and a device under test (DUT), via corresponding electrodes of the DUT. The probes are highly-scaled such that the feature size and pitch of the probes matches the highly-scaled feature size and pitch of the DUT's electrodes. The probes comprise atomic force microscopy (AFM) probes that are enhanced for increased electrical conductivity, elasticity, lifetime, and reliability.

Embodiments of the present disclosure provide a method and apparatus for displaying measurement parameters. The method comprises: in response to receiving an input signal indicating to display one or more measurement parameters of an electrical device, reading from a memory a first data associated with the one or more measurement parameters for display, and generating an update request for the first data; sending the update request to the electrical device; and in response to receiving, from the electrical device, a second data associated with the one or more measurement parameters, writing the second data to the memory as updated data to replace the first data. According to embodiments of the present disclosure, a large amount of measurement data of a power distribution system can be collected and displayed, data display is decoupled from data communication, and the impact of communication delay is eliminated, thereby improving the user's experience.

A method for automatically creating installation-specific measuring profiles for an insulation monitoring system, includes: assisting in a computer-controlled manner by means of an assist system via guided instructions for acquiring installation data; and executing the instructions by means of one more sensor devices. The method further includes pre-selecting, assisting, recording, evaluating, detecting, and optimizing steps.

The present invention relates to an improved recording of context information for a measurement. For this purpose, it is suggested to receive context information from a user and to generate a dataset comprising the received context information. The context information may comprise one or more voice annotation. By using voice annotations for specifying context information of a measurement, a very simple and easy format for acquiring the context information from a user is achieved.

A method of debugging a printed circuit board with at least one boundary-scan compliant device is presented. The method uses an electronic processing unit and includes the steps of: retrieving boundary-scan properties of the at least one boundary-scan compliant device, the properties including a listing of boundary-scan compliant circuit terminals of the at least one boundary-scan compliant device; retrieving connectivity properties; selecting and displaying a circuit graph of at least a part of the devices mounted on the printed circuit board, the circuit graph including at least one of the devices mounted on the printed circuit board and a least one further device from the devices which has a circuit terminal interconnected to a circuit terminal of the device for visualizing at least the device, the further device and interconnects between the circuit terminals of the devices.

A testing device for testing a medium voltage starter or breaker and method of use. The testing device is configured to test starter motors in the 2,300 volts to 13,800 volts range while protecting the technician from high voltages. The testing device is electrically connectable to a variety of different medium voltage starter motors via an umbilical connector harness adapted for each specific starter. A tester control board is organized to indicate the functionality of the medium voltage starter electrical components. The control board is used to isolate circuits in open and closed positions and visual indicators are used to verify proper operation of the starter coil, primary contacts, and auxiliary contacts.

A measurement apparatus and a method for controlling a measurement apparatus is provided. The measurement apparatus comprises an ultrasonic sensor for receiving a further user input. The further user input may be used to identify a specific user. Accordingly, the measurement apparatus can be automatically configured based on data related to the identified user. Since the ultrasonic sensor may be operated even if the ultrasonic sensor is covered by a protecting element, the robustness of the measurement apparatus can be further improved.

An apparatus and method for detecting the flow of electrical current through an electrical connector or outlet to an electrical load.

A diagnostic test instrument for testing power system equipment may include a chassis having a number of bays capable of receiving test circuitry modules, which may be field inserted by a user desiring to perform a particular test. The instrument may include controller circuitry that may sense in each of the bays whether a respective test circuitry module is inserted therein, and then interrogate respective test circuitry modules in each respective bay to identify a type of the respective test circuitry module. Available testing capabilities may be identified according to the type of each of the respective test circuitry modules identified in respective bays. The controller circuitry may output configuration instructions to test circuitry modules, and respective test ports included in each of the respective test circuitry modules may be selectively illuminated as a configuration instruction to visually identify an assigned functionality of the respective test ports.