Disclosed is a fixture including: a base including a bearing surface for bearing a T-CON board, and a limit mechanism for limiting displacement of the T-CON board in a direction parallel to the bearing surface; and a probe assembly for jointing with an upgrading lead port of the T-CON board, wherein the probe assembly is installed on the base and has an adjustable relative position with the bearing surface in a direction perpendicular to the bearing surface. When in upgrading, the T-CON board is arranged on the bearing surface of the base firstly, the position of the T-CON board is fixed by the limit mechanism, and the probe assembly is aligned with the upgrading lead port of the T-CON board, and is adjusted and moved in the direction perpendicular to the bearing surface so as to joint with the upgraded lead port of the T-CON board.

Disclosed is a fixture including: a base including a bearing surface for bearing a T-CON board, and a limit mechanism for limiting displacement of the T-CON board in a direction parallel to the bearing surface; and a probe assembly for jointing with an upgrading lead port of the T-CON board, wherein the probe assembly is installed on the base and has an adjustable relative position with the bearing surface in a direction perpendicular to the bearing surface. When in upgrading, the T-CON board is arranged on the bearing surface of the base firstly, the position of the T-CON board is fixed by the limit mechanism, and the probe assembly is aligned with the upgrading lead port of the T-CON board, and is adjusted and moved in the direction perpendicular to the bearing surface so as to joint with the upgraded lead port of the T-CON board.

Disclosed is a fixture including: a base including a bearing surface for bearing a T-CON board, and a limit mechanism for limiting displacement of the T-CON board in a direction parallel to the bearing surface; and a probe assembly for jointing with an upgrading lead port of the T-CON board, wherein the probe assembly is installed on the base and has an adjustable relative position with the bearing surface in a direction perpendicular to the bearing surface. When in upgrading, the T-CON board is arranged on the bearing surface of the base firstly, the position of the T-CON board is fixed by the limit mechanism, and the probe assembly is aligned with the upgrading lead port of the T-CON board, and is adjusted and moved in the direction perpendicular to the bearing surface so as to joint with the upgraded lead port of the T-CON board.

Disclosed is a fixture including: a base including a bearing surface for bearing a T-CON board, and a limit mechanism for limiting displacement of the T-CON board in a direction parallel to the bearing surface; and a probe assembly for jointing with an upgrading lead port of the T-CON board, wherein the probe assembly is installed on the base and has an adjustable relative position with the bearing surface in a direction perpendicular to the bearing surface. When in upgrading, the T-CON board is arranged on the bearing surface of the base firstly, the position of the T-CON board is fixed by the limit mechanism, and the probe assembly is aligned with the upgrading lead port of the T-CON board, and is adjusted and moved in the direction perpendicular to the bearing surface so as to joint with the upgraded lead port of the T-CON board.

A test socket includes: a first body including a fixing portion configured to receive a sample having a plurality of test terminals; a second body facing the first body and coupled with the first body such that the second body rotates relative to the first body about a hinge pin; a test board provided on the second body and configured to test the sample, wherein the test board has a plurality of first openings provided therein; and a plurality of interface pins penetrating through the first openings, wherein each of the plurality of interface pins includes a contact pin and a spring, wherein the contact pin is provided in a first end portion of each of the plurality of interface pin and is configured to come into contact with a test terminal of the plurality of test terminals, and the spring elastically supports the contact pin.

A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.