G01R1/24

RF DISTRIBUTION VOLUME AND ELECTRONIC DEVICE
20230239999 · 2023-07-27 ·

The present disclosure relates to an electronic device (10) comprising at least one electrically conductive structure (11) with a tubular shape having outer and inner surfaces (11c, 11d) covered by an insulating layer (12), and one or more integrated circuits (13) positioned within the electrically conductive structure (11).

RF DISTRIBUTION VOLUME AND ELECTRONIC DEVICE
20230239999 · 2023-07-27 ·

The present disclosure relates to an electronic device (10) comprising at least one electrically conductive structure (11) with a tubular shape having outer and inner surfaces (11c, 11d) covered by an insulating layer (12), and one or more integrated circuits (13) positioned within the electrically conductive structure (11).

High density waveguide assembly for millimeter and 5G applications
11506686 · 2022-11-22 · ·

Embodiments of the present disclosure use a customizable ganged waveguide that comprises a top metal plate and a bottom metal plate with trenches that come together in a way so as to form waveguide channels. The waveguide assembly of the present invention also comprises a waveguide adapter affixed to a first end of the ganged waveguide and operable to conduct the signal to a tester. Further, it comprises an air barrier affixed to a second end of the ganged waveguide to prevent air from flowing from the ganged waveguide to a printed circuit board connected at the second end. Finally, it comprises a tuning plate comprising double ridge slots configured to allow maximal signal to be transferred to the printed circuit board from the ganged waveguide.

High density waveguide assembly for millimeter and 5G applications
11506686 · 2022-11-22 · ·

Embodiments of the present disclosure use a customizable ganged waveguide that comprises a top metal plate and a bottom metal plate with trenches that come together in a way so as to form waveguide channels. The waveguide assembly of the present invention also comprises a waveguide adapter affixed to a first end of the ganged waveguide and operable to conduct the signal to a tester. Further, it comprises an air barrier affixed to a second end of the ganged waveguide to prevent air from flowing from the ganged waveguide to a printed circuit board connected at the second end. Finally, it comprises a tuning plate comprising double ridge slots configured to allow maximal signal to be transferred to the printed circuit board from the ganged waveguide.

Probe apparatus

A probe apparatus of a millimeter or submillimeter radio frequency band comprises transition layers having outermost layers on opposite surfaces of the probe apparatus. An internal transition cavity extends through the transition layers for guiding electromagnetic radiation within the probe apparatus. A probe layer disposed between the transition layers, the probe layer having a lateral transmission line for interacting with the electromagnetic radiation guided by the internal transmission cavity.

Probe apparatus

A probe apparatus of a millimeter or submillimeter radio frequency band comprises transition layers having outermost layers on opposite surfaces of the probe apparatus. An internal transition cavity extends through the transition layers for guiding electromagnetic radiation within the probe apparatus. A probe layer disposed between the transition layers, the probe layer having a lateral transmission line for interacting with the electromagnetic radiation guided by the internal transmission cavity.

Intelligent Wafer-Level Testing of Photonic Devices

A wafer includes a semiconductor substrate, multiple photonics devices and a test coupler. The multiple photonics devices are fabricated on the substrate and have multiple respective ports. The test coupler is disposed on the wafer and is configured to couple an optical test signal between a tester and the multiple ports of the multiple photonics devices during testing of the photonics devices.

Intelligent Wafer-Level Testing of Photonic Devices

A wafer includes a semiconductor substrate, multiple photonics devices and a test coupler. The multiple photonics devices are fabricated on the substrate and have multiple respective ports. The test coupler is disposed on the wafer and is configured to couple an optical test signal between a tester and the multiple ports of the multiple photonics devices during testing of the photonics devices.

PASSIVE INTERMODULATION TEST LEAD
20170287596 · 2017-10-05 · ·

The invention is directed to a cable assembly (1) comprising a coaxial cable (2) with an inner conductor (3) and a shield (4) and a dielectric (5) arranged between the inner conductor (3) and the shield (4). The cable assembly (1) further comprises an outer jacket (7) which encompasses the coaxial cable (2). One or several spacers (10) are arranged between the coaxial cable (2) and the outer jacket (7) such that the outer jacket (7) and the coaxial cable (2) are spaced a distance apart.

PASSIVE INTERMODULATION TEST LEAD
20170287596 · 2017-10-05 · ·

The invention is directed to a cable assembly (1) comprising a coaxial cable (2) with an inner conductor (3) and a shield (4) and a dielectric (5) arranged between the inner conductor (3) and the shield (4). The cable assembly (1) further comprises an outer jacket (7) which encompasses the coaxial cable (2). One or several spacers (10) are arranged between the coaxial cable (2) and the outer jacket (7) such that the outer jacket (7) and the coaxial cable (2) are spaced a distance apart.