The present invention relates to a measuring apparatus, comprising: an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals; the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by the EUT itself, to a measuring unit; the measuring unit to measure the electrical rn signals provided by the coupling network; and—a processing unit to process the N test signals and the measured electrical signals, to obtain: the electromagnetic signals, noise or EMI generated by the EUT; and—the Z, Y or S parameters of the EUT or any other meaningful set of parameters that can be computed from the aforementioned ones or from voltages and currents. The invention also relates to a measuring method adapted to perform method steps with the apparatus of the invention.

The present invention is related to a signal spectrum analysis technology based on linear frequency modulation transformation (LFM) and fast digital pulse compression, which comprises two parts: a circuit for linear frequency modulation signal and an algorithm for fast digital pulse compression. Wherein, in the circuit the modulated chirp signals are obtained by the input signals mixing with the LO chirp signal and then filtered by the band-pass filter the intermediate frequency (IF) chirp signals are produced. The IF signals are composed of the chirp signals with the same frequency band and the chirp rate, but different initial times. Due to the IF chirp signals being orthogonal to each other, the spectrum of the input signals is extracted by the initial time and the orthogonal accumulation. The full spectrum of the input signal is obtained by changing the start position of the sampling data sets along the time axis. The present invention achieves fast high-resolution spectrum analysis by combining the circuit for linear frequency modulation signal and the algorithm for fast digital pulse compression.

A frequency spectrum detection system including: a frequency-scan light source, a phase modulator, an optical filter, an optical fiber, a photodetector, a power divider, an electric amplifier, a combiner, an electric filter, and an oscilloscope. The frequency-scan light source, the phase modulator, the optical filter, the photodetector, and the electric amplifier form a ring-shaped optoelectronic oscillator resonant cavity, which is configured to generate a frequency-scan signal. The combiner is configured to receive a signal to be measured. The phase modulator is configured to modulate the combined electrical signal onto a frequency-scan optical signal. The optical filter is configured to selectively attenuate or amplify one sideband of double sidebands of the double-sideband phase-modulated optical signal. The photodetector is configured to detect a signal filtered by the optical filter.

A wideband spectrum analyzer includes at least one signal input, and at least one signal channel with a first filter module and a second filter module. The first filter module and the second filter module are connected with the at least one signal input downstream of the at least one signal input in a series connection. The first filter module includes first switches, and several different highpass filters being arranged in a parallel connection. The first switches are configured to selectively connect one of the highpass filters with an input of the first filter module and an output of the first filter module. The second filter module includes second switches, and several different lowpass filters being arranged in a parallel connection. The second switches are configured to selectively connect one of the lowpass filters with an input of the second filter module and an output of the second filter module.

A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.

A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. First peak-to-peak voltage signals are detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board including the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signals and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge (ESD) test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board including the integrated circuit. First peak-to-peak voltage signals are detected by sequentially radiating the plurality of first electromagnetic waves on a second test board including an electromagnetic wave receiving module. A frequency spectrum is detected by radiating a second electromagnetic wave on a housing including a third test board including the electromagnetic wave receiving module. A second peak-to-peak voltage signal is generated based on the weak frequency band, the first peak-to-peak voltage signals and the frequency spectrum. An ESD characteristic associated with an electronic system including the integrated circuit is predicted based on the second peak-to-peak voltage signal.

A digital receiver comprising at least two reception pathways, the method carries out a digital inter-correlation of the signals obtained as output from at least two filters of different central frequencies and different ranks, the rank and the central frequency of the filters being chosen as a function of a determined frequency-wise search domain. For a determined search domain, the various sampling frequencies of the reception pathways are chosen so that the ambiguous frequencies resulting from the spectral aliasings vary as a monotonic function of the true frequency of the signals.

A digital receiver comprising at least two reception pathways, the method carries out a digital inter-correlation of the signals obtained as output from at least two filters of different central frequencies and different ranks, the rank and the central frequency of the filters being chosen as a function of a determined frequency-wise search domain. For a determined search domain, the various sampling frequencies of the reception pathways are chosen so that the ambiguous frequencies resulting from the spectral aliasings vary as a monotonic function of the true frequency of the signals.