Patent classifications
G01R27/2617
Method of calculating dielectric constant and dielectric loss of polymer material
A method of calculating a dielectric constant and a dielectric loss of a polymer material including the following steps is provided: providing a polymer having an optimized molecular geometry; analyzing a dipole moment autocorrelation function of the polymer having the optimized molecular geometry; fitting the dipole moment autocorrelation function of the polymer having the optimized molecular geometry via a relaxation function to obtain a corresponding fitting function; calculating a static permittivity of the polymer having the optimized molecular geometry; and obtaining a complex permittivity spectrum via the fitting function and the static permittivity, so as to calculate a corresponding dielectric constant and dielectric loss of the polymer having the optimized molecular geometry.
Dielectric Constant Measurement Method, Dielectric Measurement Device and Dielectric Measurement Program
A permittivity measuring method includes measuring a set of phases at sampling frequencies of at least three points in each of a first-half portion and a second-half portion of a phase characteristic of electromagnetic waves that passed through a measurement target, if the mode of the phase changes of both sets of phases belongs to a phase group in which change of the at least three points in the first half and change of at least three points in the second half are both monotonic change, maximal values, or minimal values, calculating the permittivity using the phase slope of the phases in the first-half portion and the phases in the second-half portion, and if the mode of the phase changes does not belong to the phase group, calculating the permittivity by fitting the phases of either the first half or the second half to a quadratic function.
Method for measuring quick changes in low surface conductivity of dielectrics under electromagnetic interference of line voltage and equipment to perform this type of measurement
The method for measuring of quick changes of low surface conductivity of dielectrics under electromagnetic interference of line voltage is based on a comparison measurement on a voltage divider and synchronisation of measuring pulses with periodic sinusoidal course of interference when voltage with pre-set parameters of square pulse is brought to the tested dielectric surface and potential is sampled in the voltage divider consisting of the measured dielectric surface and a resistor with preselected resistivity in certain time intervals both before application of the measuring pulse and immediately before its end, and then based on a difference between the values measured using a differential amplifier, the value corresponding to that measured without effect of electromagnetic interference 60 Hz is derived and the result is the possibility to measure quick changes of low surface conductivity of dielectric surface.
The equipment for measurement of quick changes of low surface conductivity of dielectrics under electromagnetic interference of line voltage contains the sensing element (1) monitoring electromagnetic interference and the block (2) monitoring electromagnetic interference that is connected to the sensing element, and the comparative block (3) for control of generation of time sequences is connected to the first output from the block (2) and the block (4) for generation of pulses is also connected to the first output from the block (2), and the output of the block (4) are square pulses 1 ms/±5 V, and the first output 10 μs/±5 V and the second output 10 μs/±5 V are connected to inputs of the block (6) of logic elements, and another output of the block (2) monitoring electromagnetic interference is connected to the comparative element (5), the output of which is connected to the fourth input of the block (6) of logic elements, and the first output of the bloc (6) of logic elements is connected through the block (7) for modulation of pulses to the with the output as pulse 0 to 300 mV to the tested surface in the block (8) of the voltage divider surface/divider-resistor where output from this block (8) of the voltage divider surface/resistor-divider is connected through the block (11) of the voltage follower to the divider with very high input impedance to signal inputs of the first sample-and-hold amplifier (9) and of the second sample-and-hold amplifier (10), and the second input for control of sampling of the first sample-and-hold amplifier (9) and the second input for control of sampling of the second sample
Method for measuring multiple parameters of drilling fluid
A method and apparatus for measuring multiple parameters of drilling fluid using electric field perturbation, permittivity curves, time domain analysis and frequency domain analysis to identify constituents of drilling fluid and ratios of the drilling fluid constituents on a real time basis and to measure volumes and densities of the constituents on a real time basis.
Method for process monitoring
Provided is a method for process monitoring in automation technology based at least on one capacitive and/or conductive measuring probe for determining at least one process variable of at least one medium in a container, an apparatus suitable for executing the method, as well as a computer program and a computer readable medium. The method includes method steps of ascertaining whether the measuring probe is at least partially in contact with the medium and registering as a function of time at least an electrical conductivity of the medium, a dielectric constant of the medium and/or a degree of coverage of the measuring probe by the medium. The method also includes a step of monitoring the process running within the container based on the electrical conductivity, the dielectric constant and/or the degree of coverage as a function of time.
MEASURING DEVICE FOR DETERMINING A DIELECTRIC VALUE
A measuring device for determining the dielectric value of a medium has at least the following components: a measuring sensor with at least one first electrically conductive electrode and a high-frequency unit which is designed to couple a high-frequency signal at least into the first electrode and determine the dielectric value of the medium using a corresponding reflection signal. The measuring device is characterized in that the first electrode is wound on a measuring rod which can be brought into contact with the medium. By winding the electrode, the measuring sensor can be advantageously configured to be significantly shorter without limiting the sensitivity of the measuring device. In this manner, the measuring device can also be used in the event of constricted installation conditions.
METHOD FOR DESIGNING BATTERY MODULE
Provided is a method for designing a battery module including a cell assembly in which a plurality of battery cells are stacked and a module case having an internal space in which the cell assembly is accommodated, the method including: a) setting a lowermost portion of the module case with respect to a direction of gravity as a design side, and setting a region between the design side and the cell assembly as a design space; and b) obtaining a relative permittivity ε.sub.r of the design space satisfying Equation 1 ε.sub.rε.sub.0A.sub.0/T.sub.1≤PCy by assuming that a shape of the design space is a form of a film having an area of A.sub.0 and a thickness of T.sub.0.
COMBINED PROCESSING OF BOREHOLE IMAGERS AND DIELECTRIC TOOLS
Systems and methods for obtaining a calibrated permittivity dispersion measurements of a subsurface formation by measuring an impedance of the subsurface formation using a borehole imager at a first one or more frequencies; measuring a permittivity of the subsurface formation using a reference tool at a second one or more frequencies; calculating a first dispersion curve of the permittivity of the subsurface formation based at least in part on the measured impedance of the subsurface formation at the first one or more frequencies; extrapolating the permittivity of the subsurface formation to the second one or more frequencies using the calculated first dispersion curve of the permittivity of the subsurface formation; calibrating the permittivity of the subsurface formation based at least in part on the extrapolated permittivity of the subsurface formation and the measured permittivity of the subsurface formation; and generating a second dispersion curve of the permittivity of the subsurface formation based at least in part on one or more of the calibrated permittivity of the subsurface formation at the first one or more frequencies and the measured permittivity of the subsurface formation at the second one or more frequencies.
Sensing using inverse multiple scattering with phaseless measurements
A permittivity sensor, for determining an image of a distribution of permittivity of a material of an object in a scene, comprising an input interface, a hardware processor, and an output interface is provided. The input interface is configured to accept phaseless measurements of propagation of a known incident field through the scene and scattered by the material of the object in the scene. The hardware processor is configured to solve a multi-variable minimization problem over unknown phases of the phaseless measurements and unknown image of the permittivity of the material of the object by minimizing a difference of a nonlinear function of the known incident field and the unknown image with a product of known magnitudes of the phaseless measurements and the unknown phases. Further, the output interface is configured to render the permittivity of the material of the object provided by the solution of the multi-variable minimization problem.
Measuring device for determining a distance in a conducting structure
The invention relates to a distance-measuring device for determining a distance between a reflection body in a conducting structure and a coupling region for electromagnetic waves, which region is provided on an end section of the conducting structure, said measuring device comprising a transmitting and receiving device, and a conduction junction (1) provided on the coupling region, for coupling the transmitting and receiving device to the conducting structure containing a medium, in order to couple an electromagnetic wave into the conducting structure, and to decouple the electromagnetic wave, reflected on the reflection body, from the conducting structure. Said measuring device also comprises an evaluation device for determining the distance between the coupling region and the reflection body from the complex reflection coefficient between the coupled electromagnetic wave and the decoupled electromagnetic wave. The invention also relates to the corresponding method.