An inspection apparatus used for inspecting a bare circuit board is provided, where the bare circuit board includes an antenna. The inspection apparatus includes a holding stage, a probing device, and a measurement device. The holding stage can hold the bare circuit board. The measurement device is electrically connected to the probing device and electrically connected to the antenna via the probing device. The measurement device can input a first testing signal to the antenna. The antenna can input a second testing signal to the measurement device after receiving the first testing signal. The measurement device can measure the antenna according to the second testing signal, where the first testing signal and the second testing signal both pass through no active component.

The present invention provides a method for detecting and adjusting failed back-drills in PCBs in the process of fabricating a PCB so that the failed back-drill can be screened out or repaired. This is accomplished, by after detecting poor back drills in a PCB, measuring the actual thickness of each PCB board. Next, the measured actual thickness of each PCB board is compared with .the theoretical thickness of each PCB board. The back drill depth for each area of the PCB board is then adjusted for its theoretical thickness and percent variation from the measured thickness.to adjust the poor back drill.

An electronic load testing system is configured to emulate aspects of an integrated circuit (IC). A control module of the system is configured to be electrically coupled to a first location on a printed circuit board (PCB) of an electronic assembly, and a load module is configured to be electrically coupled to a second location on the PCB. The load module includes a load cell configured to selectively conduct current from a power supply of the electronic assembly. The first location and the second location are spaced apart and in electronic communication via one or more traces of the PCB. The control module is configured to communicate with the load module via the one or more traces of the PCB. In some examples, the load module and the IC have an equivalent form factor, such that the load module can be installed in place of the IC.

An apparatus for producing a printed circuit board on a substrate, has a table for supporting the substrate, a function head configured to effect printing conductive and non-conductive materials on the substrate, a positioner configured to effect movement of the function head relative to the table, and a controller configured to operate the function head and the positioner to effect the printing of conductive and non-conductive materials on the substrate. The apparatus optionally has a layout translation module configured to convert PCB files or multilayer PCB files to printing data for controlling the function head to print conductive material and nonconductive material onto the substrate. The apparatus has a testing head to verify conductors which operates automatically. The translation module also prints nonconductive material component alignment areas and nonconductive material substrate stiffeners.

Provided is a test device for roll-to-roll board of flexible circuit boards. The test device comprises a detection probe frame, front and rear ends of the detection probe frame being connected to a sliding frame, and a bottom of the sliding frame being connected to a magnetic plate; wherein the magnetic plate is consisted of a square panel in the middle and four isosceles trapezoidal panels in upright direction; the four isosceles trapezoidal panels is movable and is capable of being rotated towards the square panel; a bottom of the square panel is provided with 4×4 centralized ports, the angle between the centralized port and a vertical line of the panel is 30°; the upper surface of the magnetic plate is provided with four catching splints, the catching splint is movable on the magnetic plate.

Provided is an analyzing apparatus including a charge amount analyzing unit configured to analyze, by using a device simulator configured to simulate a transient change of a charge in a semiconductor device having a first main terminal and a second main terminal, a change of a charge amount at any one of the terminals when a power source voltage applied between the first main terminal and the second main terminal is changed by a displacement voltage smaller than an initial voltage after a current flowing between the first main terminal and the second main terminal is stabilized with the semiconductor device being set to an ON state and the power source voltage being set to the initial voltage, and a capacitance calculating unit configured to compute a terminal capacitance at any one of the terminals based on the change of the charge amount analyzed by the charge amount analyzing unit.

Provided is an analyzing apparatus including a charge amount analyzing unit configured to analyze, by using a device simulator configured to simulate a transient change of a charge in a semiconductor device having a first main terminal and a second main terminal, a change of a charge amount at any one of the terminals when a power source voltage applied between the first main terminal and the second main terminal is changed by a displacement voltage smaller than an initial voltage after a current flowing between the first main terminal and the second main terminal is stabilized with the semiconductor device being set to an ON state and the power source voltage being set to the initial voltage, and a capacitance calculating unit configured to compute a terminal capacitance at any one of the terminals based on the change of the charge amount analyzed by the charge amount analyzing unit.

A reference via in a set of plated vias on a printed circuit board is located. A reference lead is applied to the reference via. A test via in the set of plated vias is located. A test lead is applied to the test via. An electrical conductance between the reference via and the test via is measured. A property of a core layer of the printed circuit board is identified based on the electrical conductance.

An apparatus is configured to print a circuit board using conductive and nonconductive printing materials in accordance with parameters. A database stores information correlating characteristics of printing materials with shelf life and/or age of the printing materials, and/or environmental conditions. The apparatus either prompts operator to make printing parameter adjustments or automatically optimizes printing parameters based on information stored in the database and the environmental conditions. The apparatus optionally further optimizes printing parameters based on age of a print head and positioning mechanisms.

An example apparatus includes a block configured to connect mechanically to a circuit board. The circuit board includes a first conductive path running to a first electrical contact on the circuit board and a second conductive path running to a second electrical contact on the circuit board. The first electrical contact and the second electrical contact are arranged in an area of the circuit board. The block includes a component having a surface that is configured to cover at least part of the area. A conductive layer is attached to at least part of the surface. The conductive layer is for creating a short circuit between the first electrical contact and the second electrical contact following connection of the block to the circuit board.