Various technologies described herein pertain to a testing apparatus that enables an analog frequency response of a device under test to be analyzed. The testing apparatus includes a laser source and an optical resonator. The laser source is optically injection locked to the optical resonator. The testing apparatus also includes a modulator configured to apply a time-varying voltage to the optical resonator. The time-varying voltage causes the laser source optically injection locked to the optical resonator to generate a frequency modulated optical signal that can include time-varying chirps. The testing apparatus further includes an interferometer (e.g., variable delay, fixed length) configured to receive the frequency modulated optical signal from the laser source optically injection locked to the optical resonator. The interferometer outputs an optical test signal having a range of frequencies. The frequencies in the optical test signal are based at least in part on the time-varying chirps.

The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.

The present invention relates to a method for determining at least one physical characteristic value of an electromechanical oscillatory system, which comprises a piezoelectric element and at least one additional element coupled, with respect to oscillation, to the piezoelectric element, the piezoelectric element having an electrode and a counter electrode. The method comprises the following steps: (a) applying an electrical alternating voltage between the electrode and the counter electrode for the duration of an excitation interval in order to induce mechanical oscillation of the oscillatory system or of a sub-system of the oscillatory system, so that after the excitation interval has expired, the oscillatory system or the sub-system performs a free oscillation without excitation, (b) after the end of the excitation and during the free oscillation of the oscillatory system or of the sub-system without excitation: (i) measuring a time curve of a voltage U between the electrode and the counter electrode, or (ii) short-circuiting the electrode and the counter electrode with a line and measuring a time curve of a current I through the line, and (c) determining the at least one physical characteristic value of the electromechanical oscillatory system from the time curve of the voltage U, which time curve was measured in step b) i), or the time curve of the current I, which time curve was measured in step b) ii).

A method for improving the accuracy of a final inspection (FI) test of an acoustic wave device includes gating the feedthrough/cross-coupling (e.g., electromagnetic (EM) path) signal of the FI test data response for the tested acoustic wave device and adding a feedthrough/cross-coupling signal (e.g., EM path signal) from an engineering (EVB) test data (e.g., for a similar or identical surface acoustic device). This results in FI test data with time domain recovery of EM path signal from an EVB test, which can be compared against EVB test data (e.g. for a similar or identical surface acoustic device) to determine if the tested acoustic wave device passes inspection.

An integrated circuit includes a multiplexer circuit coupled to receive a first clock signal and a second clock signal and coupled to provide an output clock signal to a channel. A protection circuit is coupled to receive a feedback signal from the channel. The protection circuit causes the multiplexer circuit to provide oscillations in the second clock signal to the output clock signal in response to the feedback signal indicating that the channel is idle to cause the channel to be in a protection mode that reduces degradation from bias temperature instability. The protection circuit causes the multiplexer circuit to provide oscillations in the first clock signal to the output clock signal in response to the feedback signal indicating that the channel is active.

The invention relates to a test system, comprising: a test instrument, wherein the test instrument comprises an input port configured to acquire a test signal, a display configured to display a graphical representation of the test signal, and an application interface configured to forward the test signal. The test system further comprises a test application module, which is configured to receive the forwarded test signal from the application interface, wherein the test application module comprises a processing unit configured to further process the received test signal, and an instrument interface configured to forward a result of the further processing back to the test instrument and/or to a further device.

A graphene-based broadband radiation sensor and methods for operation thereof are disclosed. The radiation sensor includes an electrical signal path for carrying electrical signals and one or more resonance structures connected to the electrical signal path. Each resonance structure includes a resonator having a resonant frequency. Each resonance structure also includes a graphene junction connected in series with the resonator, the graphene junction including a graphene layer and having an impedance that is dependent on a temperature of the graphene layer. Each resonance structure further includes a heating element that is thermally coupled to the graphene layer and is configured to receive an incident photon, where the temperature of the graphene layer increases in response to the heating element receiving the incident photon.

Various technologies described herein pertain to a testing apparatus that enables an analog frequency response of a device under test to be analyzed. The testing apparatus includes a laser source and an optical resonator. The laser source is optically injection locked to the optical resonator. The testing apparatus also includes a modulator configured to apply a time-varying voltage to the optical resonator. The time-varying voltage causes the laser source optically injection locked to the optical resonator to generate a frequency modulated optical signal that can include time-varying chirps. The testing apparatus further includes an interferometer (e.g., variable delay, fixed length) configured to receive the frequency modulated optical signal from the laser source optically injection locked to the optical resonator. The interferometer outputs an optical test signal having a range of frequencies. The frequencies in the optical test signal are based at least in part on the time-varying chirps.

A semiconductor device may include: first to n-th through-electrodes; first to n-th through-electrode driving circuits suitable for charging the first to n-th through-electrodes to a first voltage level, or discharging the first to n-th through-electrodes to a second voltage level; and first to n-th error detection circuits, each suitable for storing the first voltage level or the second voltage level of a corresponding through-electrode of the first to n-th through-electrodes as a down-detection signal and an up-detection signal, and outputting a corresponding error detection signal of first to n-th error detection signals by sequentially masking the down-detection signal and the up-detection signal.

Method and system for temperature-dependent frequency compensation. For example, the method for temperature-dependent frequency compensation includes determining a first frequency compensation as a first function of temperature using one or more crystal oscillators, processing information associated with the first frequency compensation as the first function of temperature, and determining a second frequency compensation for a crystal oscillator as a second function of temperature based on at least information associated with the first frequency compensation as the first function of temperature. The one or more crystal oscillators do not include the crystal oscillator, and the first frequency compensation as the first function of temperature is different from the second frequency compensation as the second function of temperature.