A circuit includes a test circuit in an integrated circuit to test signal timing of a logic circuit under test in the integrated circuit. The signal timing includes timing measurements to determine if an output of the logic circuit under test changes state in response to a clock signal. The test circuit includes a bit register that specifies which bits of the logic circuit under test are to be tested in response to the clock signal. A configuration register specifies a selected clock source setting from multiple clock source settings corresponding to a signal speed. The selected clock source is employed to perform the timing measurements of the specified bits of the bit register.

Semiconductor devices that include test circuitry to measure internal signal wire propagation delays during memory access operations, and circuity configured to store delay information that is used to configure internal delays based on the measured internal signal propagation circuit delays. The semiconductor device includes a test circuit configured to measure a signal propagation delay between a command decoder and a bank logic circuit based on time between receipt of a test command signal directly from the command decoder and a time of receipt of the test command signal routed through the bank logic circuit.

A duty timing detector includes: a control logic, the control logic being configured to: receive an input toggle signal and an output toggle signal that corresponds to the input toggle signal, and generate a difference signal using a difference between a duty of the input toggle signal and a duty of the output toggle signal; a first low-pass filter configured to output a DC input voltage based on a pulse width of the input toggle signal; a second low-pass filter configured to output a DC difference voltage based on a pulse width of the difference signal; a compensation circuit configured to compensate the duty of the output toggle signal using the DC input voltage and the DC difference voltage; and an oscillator configured to generate a duty-compensated output toggle signal, and to provide the duty-compensated output toggle signal to the control logic.

A switching activity report of simulated switching activities of a semiconductor circuit is accessed. A plurality of glitch bottleneck ratios corresponding to a plurality of pins in the semiconductor circuit are determined, comprising by: setting an initial bottleneck ratio on a leaf output pin; and backward traversing the semiconductor circuit to determine a plurality of glitch bottleneck ratios of pins in a fan-in cone of the leaf output pin. A plurality of total glitch powers associated with the plurality of pins is determined, a total glitch power of the plurality of total glitch powers being determined based on a glitch bottleneck ratio and a glitch power of a corresponding pin. One or more critical bottleneck pins among the plurality of pins are identified based on the plurality of total glitch powers. One or more gates associated with the one or more critical bottleneck pins are adjusted to reduce corresponding one or more total glitch powers of the one or more gates.

Aspects of the invention include a phase rotator, that is located at a built-in self-test (BIST) path of a receiver, receiving a clock signal from an on-chip clock. The phase rotator shifts the phases of the clock signal. The phase rotator transmits the shifted clock signal to a binary sequence generator, that is located at the receiver. The binary sequence generator outputs a binary sequence, where the binary sequence generator is driven by the shifted clock signal.

A system comprises a plurality of regions, wherein ones of the plurality of regions are partitioned from others of the plurality of regions and at least one of the plurality of regions is a region under test. The system comprises at least one noise generator configured to generate noise in at least the region under test, and at least one noise monitor configured to monitor one or more effects of the noise generated in the region under test. The system comprises a test controller configured to: cause the at least one noise generator to generate the noise in at least the region under test; receive information from the at least one noise monitor indicative of the one or more effects of the noise generated in the region under test; and determine one or more conditions based on at least a portion of the received information.

A power glitch signal detection circuit, a security chip and an electronic apparatus are disclosed. The power glitch signal detection circuit comprises: a latch and a signal output module, wherein a first input of the latch is connected to a power supply voltage, a first output of the latch is connected to a ground voltage, a second input of the latch is connected to a third output of the latch, a third input of the latch is connected to a second output of the latch, and the second output or the third output is connected to the signal output module. The power glitch signal detection circuit could detect a power glitch on the power supply voltage or the ground voltage, and the power glitch signal detection circuit has the advantages of low power consumption, small area, high speed, high sensitivity and strong portability.

A method determines scattering parameters, S-parameters, for a device under test for a first frequency range. The method includes receiving S-parameters for the device under test for a second frequency range, the second frequency range greater than the first frequency range. Generally, the S-parameters for the device under test for the second frequency range can be determined using known methods. The method further includes measuring an actual response of the device under test, determining a desired signal of the device under test, and determining the S-parameters for the device under test for the first frequency range based the S-parameters for the second frequency range, actual response of the device under test and the desired signal of the device under test.

A duty timing detector includes: a control logic, the control logic being configured to: receive an input toggle signal and an output toggle signal that corresponds to the input toggle signal, and generate a difference signal using a difference between a duty of the input toggle signal and a duty of the output toggle signal; a first low-pass filter configured to output a DC input voltage based on a pulse width of the input toggle signal; a second low-pass filter configured to output a DC difference voltage based on a pulse width of the difference signal; a compensation circuit configured to compensate the duty of the output toggle signal using the DC input voltage and the DC difference voltage; and an oscillator configured to generate a duty-compensated output toggle signal, and to provide the duty-compensated output toggle signal to the control logic.

Methods for detecting a glitch at a high sampling rate are provided. In some embodiments, a method includes the following steps: S1, acquiring to-be-identified data; S2, processing the to-be-identified data to obtain normal sampling data; and S3, performing glitch identification on the to-be-identified data to obtain a glitch position of the normal sampling data. In other embodiments, the disclosure provides a system for detecting a glitch at a high sampling rate and for implementing the method for detecting a glitch at a high sampling rate. The system includes an acquisition unit and a glitch identification unit. The acquisition unit acquires and processes the to-be-identified data to obtain the normal sampling data, and the glitch identification unit performs glitch identification on the to-be-identified data to obtain the glitch position of the normal sampling data.