A real-time clock module includes an oscillation circuit, a storage unit that stores adjustment data used to adjust an oscillation frequency of the oscillation circuit, a data abnormality determination circuit that compares first data based on the adjustment data with second data based on the adjustment data to determine whether or not at least one of the first data and the second data is abnormal, and a flag register that holds a data abnormality flag in which a first value indicating that the first data and the second data are normal, or a second value indicating that at least one of the first data and the second data is abnormal is set, based on a signal from the data abnormality determination circuit.

Methods and structures are described for detecting clock anomalies. Example methods include measuring a duration of a first phase of the clock signal, monitoring a duration of a second phase of the clock signal, and determining whether the duration of the second phase has exceeded the measured duration of the first phase. If so, a clock stop detection signal is asserted. Example structures include a detector circuit having an input for sensing the clock signal. The circuit is operable to measure a duration of a first clock phase instance, to monitor a duration of a second clock phase instance, and to assert an output if the duration of the second clock phase instance exceeds the measured duration of the first clock phase instance.

A debug system for debugging a logic design includes an adaptor and a debug station connected to the adaptor. The logic design includes a plurality of design modules. The adaptor is configured to receive an emulation output of the logic design. The emulation output includes a design snapshot of the logic design and input signals to the logic design that both are recorded during an emulation process of the logic design. The debug station is configured to generate, based on the emulation output and a netlist of a design module of the logic design, an emulation history of the design module.

Methods and apparatus are described for detecting anomalies in a clock signal. Example methods include sensing a clock signal that exhibits alternating phases during normal operation; responsive to sensing the start of a first phase, generating a pulse; and if the pulse terminates before sensing the end of the first phase, asserting a clock stopped detection signal. Example clock anomaly detection apparatus includes a clock signal input for coupling to a clock signal that, during normal operation, oscillates between first and second clock states. An anomaly detection output is asserted if the clock signal remains in the first clock state longer than a first phase expected duration or remains in the second clock state longer than a second phase expected duration.

In an information processing apparatus, a control unit receives operation instructions. Each time receiving an operation instruction, the control unit detects the number of operating circuits that are to operate in accordance with the received operation instruction, in a circuit group of circuits that operate in synchronization with a clock signal. In addition, each time receiving an operation instruction, the control unit determines whether power supply noise that is likely to cause a timing error in the circuit group will occur, on the basis of a result of comparing an increase in the number of operating circuits per prescribed time period with a threshold, and lowers the frequency of the clock signal when determining that the power supply noise will occur.

Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).

In certain aspects, a duty-cycle monitor includes a first oscillator, and a flop having a signal input, a clock input, and an output, wherein the signal input is coupled to an input of the duty-cycle monitor, and the clock input is coupled to the first oscillator. The duty-cycle monitor also includes a first counter having a count input, an enable input, and a count output, wherein the count input of the first counter is coupled to the first oscillator, and the enable input of the first counter is coupled to the output of the flop. The duty-cycle monitor also includes a second counter having a count input, an enable input, and a count output, wherein the count input of the second counter is coupled to the first oscillator, and the enable input of the second counter is coupled to the output of the flop.

Circuitry, systems, and methods for fault detection and reporting comprise a fault detection circuit configured to detect one or more fault conditions that cause a state change in a fault pin voltage representative of a transceiver failure. Once the state of the fault pin voltage changes, a transceiver input generates a fault detection code. In embodiments, in response to the transceiver input receiving a first signal, the fault detection code is shifted to a transceiver output that may communicate the fault detection code to a controller. Once the transceiver input receives a second signal, the fault pin voltage may be reset to clear the fault detection code before resuming operations, including detecting additional fault conditions as they arise.

An Information Handling System (IHS) includes multiple hardware devices, and a baseboard Management Controller (BMC) in communication with the plurality of hardware devices. The BMC includes a first processor configured to execute a custom BMC firmware stack, and a second processor including executable instructions for receiving a request to perform a test on the first processor in which the request is received through a secure communication session established with a remote IHS. The instructions further perform the acts of controlling the first processor to perform the test according to the request, the first processor generating test results associated with the test, and transmitting the test results to the remote IHS through the secure communication session.

In an approach, a processor receives an input indicative of a set of registers, the set of registers being configured for obtaining output data from a design-under-test (DUT) in a field-programmable gate array (FPGA) module. A processor executes a set of instructions for monitoring the output data in the set of registers;. A processor generates data indicative of at least one portion of changes of the output data in the set of registers during the execution of the set of instructions. A processor causes a separate machine to analyze the data via utilizing an interface to send the data to the separate machine.