The present invention discloses a bias current generation circuit. An operation amplifier compares an input voltage having a zero-temperature coefficient and a feedback voltage to generate a driving voltage. An output transistor generates a bias current according to the driving voltage. A variable resistive circuit is electrically coupled to the output transistor through a feedback node to generate the feedback voltage according to the bias current and includes series-coupled resistors and switch transistors. Each of the resistors has a resistance having a positive temperature coefficient and includes a current input terminal and a current output terminal. Each of the switch transistors is electrically coupled between the current output terminal of one of the resistors and a ground terminal. One of the switch transistors turns on according to a control voltage variable according to the temperature variation to enable resistors to generate the resistance having a negative temperature coefficient.

A semiconductor device includes a substrate having a main surface, and a temperature-sensitive diode structure having a trench formed in the main surface, a polysilicon layer embedded in the trench, a p-type anode region formed in the polysilicon layer, and an n-type cathode region formed in the polysilicon layer.

An electronic circuit is disclosed. The electronic circuit includes a reference voltage generator, which includes a first candidate circuit configured to generate a first candidate reference voltage, a second candidate circuit configured to generate a second candidate reference voltage, and a selector circuit configured to select one of the first and second candidate reference voltages. The reference voltage generator also includes a third circuit configured to generate a power supply voltage based on the selected candidate reference voltage.

The objective is to provide a function of detecting loss of a current detection function, at a time when a switching device has an open failure, in an arm that has the current detection function and a temperature detection function and in which two or more switching devices are connected in parallel with one another. A switching apparatus includes a current detector and a temperature detector provided in at least one of the two or more switching devices that are connected in parallel with one another and a controller that determines an overcurrent in the switching device in which the current detector is provided, that determines an overheating state and a temperature-rising failure in the switching device in which the temperature detector is provided, based on an output of the temperature detector, and that controls the switching devices.

An over temperature compensation control circuit is coupled to a conversion unit. The over temperature compensation control circuit includes a detection circuit, a temperature control resistor, and a comparison unit. The detection circuit provides a current signal responsive to an input voltage according to a voltage signal responsive to the input voltage of the conversion unit. The temperature control resistor generates a temperature control voltage according to the current signal. The comparison unit compares the temperature control voltage with a reference voltage to generate a control signal. The control signal represents whether a temperature of the conversion unit reaches an over temperature protection point.

In an example semiconductor device, the voltage/temperature conditions of the semiconductor device and associated calibration codes of multiple instances of ZQ calibrations are pre-stored in a register array. When a pre-stored voltage/temperature condition occurs again, ZQ calibration is not performed. Instead, the associated pre-stored calibration code is retrieved from the register array and provided to the IO circuit. When a voltage/temperature condition of the semiconductor device does not match any pre-stored voltage/temperature condition in the register array, a ZQ calibration is performed. When the ZQ calibration is performed, a register in the register array is selected according to an update policy and updated by the calibration code newly provided by the ZQ calibration along with the voltage/temperature condition at the time when the ZQ calibration is performed.

A fault-tolerant multiphase voltage regulator includes a plurality of power stages, each of which is configured to deliver a phase current to a processor, and a controller. The controller is configured to: control the plurality of power stages to regulate an output voltage provided to the processor; detect and disable a faulty power stage; generate a throttling signal to indicate that one or more of the power stages is faulty and disabled; communicate the throttling signal to the processor over a physical line running between the processor and the controller; and place the multiphase voltage regulator in a self-test mode in which the processor is operated at a known computational load and the controller operates each power stage independently to determine if any of the power stages is faulty under the known computational load. A corresponding method of operating a fault-tolerant power distribution system is also described.

The present invention discloses a bias current generation circuit. An operation amplifier compares an input voltage having a zero-temperature coefficient and a feedback voltage to generate a driving voltage. An output transistor generates a bias current according to the driving voltage. A variable resistive circuit is electrically coupled to the output transistor through a feedback node to generate the feedback voltage according to the bias current and includes series-coupled resistors and switch transistors. Each of the resistors has a resistance having a positive temperature coefficient and includes a current input terminal and a current output terminal. Each of the switch transistors is electrically coupled between the current output terminal of one of the resistors and a ground terminal. One of the switch transistors turns on according to a control voltage variable according to the temperature variation to enable resistors to generate the resistance having a negative temperature coefficient.

An electronic circuit is disclosed. The electronic circuit includes a reference voltage generator, which includes a first candidate circuit configured to generate a first candidate reference voltage, a second candidate circuit configured to generate a second candidate reference voltage, and a selector circuit configured to select one of the first and second candidate reference voltages. The reference voltage generator also includes a third circuit configured to generate a power supply voltage based on the selected candidate reference voltage.

In an example semiconductor device, the voltage/temperature conditions of the semiconductor device and associated calibration codes of multiple instances of ZQ calibrations are pre-stored in a register array. When a pre-stored voltage/temperature condition occurs again, ZQ calibration is not performed. Instead, the associated pre-stored calibration code is retrieved from the register array and provided to the IO circuit. When a voltage/temperature condition of the semiconductor device does not match any pre-stored voltage/temperature condition in the register array, a ZQ calibration is performed. When the ZQ calibration is performed, a register in the register array is selected according to an update policy and updated by the calibration code newly provided by the ZQ calibration along with the voltage/temperature condition at the time when the ZQ calibration is performed.