A trimmable resistor circuit and a method for operating the trimmable resistor circuit are provided. The trimmable resistor circuit includes first sources/drains and first gate structures alternatively arranged in a first row, second sources/drains and second gate structures alternatively arranged in a second row, third sources/drains and third gate structures alternatively arranged in a third row, first resistors disposed between the first row and the second row, and second resistors disposed between the second row and the third row. In the method for operating the trimmable resistor circuit, the first gate structures in the first row and the third gate structures in the third row are turned on. Then, the second gate structures in the second row are turned on/off according to a predetermined resistance value.

A trimmable resistor circuit and a method for operating the trimmable resistor circuit are provided. The trimmable resistor circuit includes first sources/drains and first gate structures alternatively arranged in a first row, second sources/drains and second gate structures alternatively arranged in a second row, third sources/drains and third gate structures alternatively arranged in a third row, first resistors disposed between the first row and the second row, and second resistors disposed between the second row and the third row. In the method for operating the trimmable resistor circuit, the first gate structures in the first row and the third gate structures in the third row are turned on. Then, the second gate structures in the second row are turned on/off according to a predetermined resistance value.

A chip resistor includes an insulated substrate having a rectangular parallelepiped shape, a first front electrode and a second front electrode created on both longitudinal ends of the insulated substrate, and a resistive element making a connection between the first and second front electrodes. The resistive element is formed in a meandering shape with a first region and a second region continuing in series via a jointing section between a pair of connecting portions. Moreover, in the first region, a first trimming groove for rough adjustment is formed to elongate a current path of the resistive element. In the second region, a second trimming groove is formed for fine adjustment extending in a direction angled with respect to a straight line along a direction in which the first trimming groove extends.

A chip resistor includes a substrate, two top electrodes, a resistor element, two back electrodes, and two side electrodes. The substrate has a top surface, a back surface and two side surface. The top and back surfaces face away in the thickness direction of the substrate. The side surfaces, spaced apart in a predetermined direction orthogonal to the thickness direction, are connected to the top and back surfaces. The top electrodes, spaced apart in the predetermined direction, are in contact with the top surface. The resistor element, disposed on the top surface, is connected to the top electrodes. The back electrodes, spaced apart in the predetermined direction, are in contact with the back surface. The side electrodes, held in contact with the side surfaces, are connected to the top and back electrodes. Each back electrode has a first and a second layer. The first layer is in contact with the back surface. The second layer, covering a part of the first layer, is made of a material containing metal particles and synthetic resin.

An electrical resistance strain gage includes a uniformly distributed electrical resistance of the active measuring area and a discrete electrical trim resistance within an active measuring are. The trim resistance may include an electrical conductor in an electrically parallel circuit such that the electrical conductor may be selectively electrically removed from the strain gage to trim the electrical resistance of the strain gage. The trim resistance does not modify the active strain sensing area or uniform grid length.

An electrical resistance strain gage includes a uniformly distributed electrical resistance of the active measuring area and a discrete electrical trim resistance within an active measuring are. The trim resistance may include an electrical conductor in an electrically parallel circuit such that the electrical conductor may be selectively electrically removed from the strain gage to trim the electrical resistance of the strain gage. The trim resistance does not modify the active strain sensing area or uniform grid length.

A resistance adjustment circuit has a plurality of conductive patterns placed in parallel to one another on a flat surface formed from an insulating body so as to extend in a first direction, and also has a resistive element that spans two conductive patterns and is electrically connected to the conductive patterns at superimposing parts superimposed on the conductive patterns. A plurality of resistive elements are provided so as to be spaced in the first direction and are connected in parallel to one another across the two conductive patterns. Part of the conductive patterns can be selectively cut between the superimposing parts of resistive elements disposed adjacently. The combined resistance of the resistance adjustment circuit can be adjusted by reducing parallel connections of resistive elements or combining parallel connections of resistive elements with their series connections.

An analog circuit arrangement (1) to variably set a voltage U.sub.out, within defined voltage limits, has a non-inverting adder (10) with a positive input (11). A voltage divider (20), with at least a first stage (21) and a second stage (22), is connected to the positive input (11) of the adder (10). At least one stage has a parallel circuit of n resistors (R1, R2, . . . , Rn) that are each connected in series in a conduction path (L1, L2, . . . , Ln) to an overcurrent protection device (F1, F2, . . . , Fn). At least one device (30) actively changes one or more of the overcurrent protection devices (F1, F2, . . . , Fn) into a state that interrupts the respective affected conduction path (L1, L2, . . . , Ln).

To provide a resistance device which has a small temperature dependence, in which a resistance value is adjustable in a wide range of from a high resistance value to a low resistance value, and which has a small circuit area, and to provide a current detection circuit including the resistance device. The resistance device is to be connected between two terminals, and a resistance value thereof is variable, the resistance device including: a reference resistor; a series variable resistor circuitry including at least one parallel variable resistor circuit which is connected in series to each other, and which each includes a resistor and a trimming element connected in parallel to the resistor; and a parallel variable resistor circuitry including at least one series variable resistor circuit which is connected in parallel to each other, and which each includes a resistor and a trimming element connected in series to the resistor.

To provide a resistance device which has a small temperature dependence, in which a resistance value is adjustable in a wide range of from a high resistance value to a low resistance value, and which has a small circuit area, and to provide a current detection circuit including the resistance device. The resistance device is to be connected between two terminals, and a resistance value thereof is variable, the resistance device including: a reference resistor; a series variable resistor circuitry including at least one parallel variable resistor circuit which is connected in series to each other, and which each includes a resistor and a trimming element connected in parallel to the resistor; and a parallel variable resistor circuitry including at least one series variable resistor circuit which is connected in parallel to each other, and which each includes a resistor and a trimming element connected in series to the resistor.