A gas sensor includes a sensing element having an electrode pad a metal terminal, and a separator that has insertion holes in which the metal terminal is held. The metal terminal includes a main body and an elastic portion that is integrally connected to the main body and is elastically connected to the electrode pad at a predetermined contact point. The main body includes a front-end-side restricting portion and a rear-end-side restricting portion that restrict the movement of the main body by contacting wall surfaces of the insertion hole when the main body moves in a direction intersecting the direction of an axial line. The contact point is located between the front-end-side restricting portion and the rear-end-side restricting portion in the direction of the axial line. The front-end-side restricting portion and the rear-end-side restricting portion are connected to each other so that a flat board portion is interposed therebetween.

A contact socket module for use in an automated test equipment (ATE) for testing electronic components (DUTs) being carried by a carrier comprises: a plurality of groups of spring contacts, wherein each spring contact comprises a DUT sided contact tip, a retracting plate being moveable, and a controller controlling the movement of the retracting plate, wherein the retracting plate and the spring contacts act mechanically on each other. In a first position the DUT sided contact tips are adapted to contact to contact portions of the electronic components, and in a second position, the DUT sided contact tips are adapted to release the contact to the contact portions of the electronic components.

According to a certain embodiment, a pin plunger includes: a first contact member; a second contact member that faces the first contact member and is apart from the first contact member; a spring arranged between the first contact member and the second contact member; and a housing that houses the first contact member, the second contact member, and the spring. The housing comprises a bimetal inside or outside the housing. The bimetal comprises a first metal and a second metal, the first metal having a thermal expansion coefficient different from a thermal expansion coefficient of the second metal. The elastic force decreased or increased by contracting or expanding of the spring due to a temperature change is compensated with a warping force due to stretching of the first metal and the second metal.

According to a certain embodiment, a pin plunger includes: a first contact member; a second contact member that faces the first contact member and is apart from the first contact member; a spring arranged between the first contact member and the second contact member; and a housing that houses the first contact member, the second contact member, and the spring. The housing comprises a bimetal inside or outside the housing. The bimetal comprises a first metal and a second metal, the first metal having a thermal expansion coefficient different from a thermal expansion coefficient of the second metal. The elastic force decreased or increased by contracting or expanding of the spring due to a temperature change is compensated with a warping force due to stretching of the first metal and the second metal.

A mounting assembly for an electrical fixture has an upper unit and a lower unit. The upper unit includes a first portion of a detent mechanism and an upper contact for connection to a power source. The lower unit is configured for connection to an electrical fixture and includes a second portion of a detent mechanism and a lower contact for connection to the electrical fixture. When the lower unit engages the upper unit, the first portion and the second portion of the detent mechanism cooperate to releasably retain the upper unit and lower unit together and the upper contact and lower contact touch to create an electric pathway between the power source and the electrical fixture.

Embodiments of the present disclosure are directed towards socket contact techniques and configurations. In one embodiment, an apparatus may include a socket substrate having a first side and a second side disposed opposite to the first side, an opening formed through the socket substrate, an electrical contact disposed in the opening and configured to route electrical signals between the first side and the second side of the socket substrate, the electrical contact having a cantilever portion that extends beyond the first side, wherein the first side and surfaces of the socket substrate in the opening are plated with a metal. Other embodiments may be described and/or claimed.

The inspection socket includes: a contact terminal 80 including a barrel 82 having a flange section 90, a device-side terminal 84, and a board-side terminal 86; housings 10, 30, and 50 having through holes 10c, 30c, and 50c into which the contact terminal 80 is inserted; and housings 20 and 40 having through holes 20c and 40c into which the contact terminal 80 is inserted, the through holes 20c and 40c being larger than the outer diameter of the contact terminal 80 excluding the flange section 90 and smaller than the outer diameter of the flange section 90. The housings 20 and 40 are sandwiched between the housings 10, 30, and 50, the flange section 90 is contained in the through hole 50c, and the through holes 10c, 30c, and 50c are designed to have, for impedance matching, a gap from the outer periphery of the contact terminal 80.

An example device can include a mounting device having a first connector bracket fixedly positioned on the mounting device, a plurality of pogo pins positioned within the first connector bracket, and an adjustment control mechanism positioned about at least one pogo pin of the plurality of pogo pins. A computing device has a second connector bracket fixedly positioned on the computing device, the second connector bracket forming a plurality of openings for receiving the plurality of pogo pins, wherein the adjustment control mechanism is to fixedly position the plurality of pogo pins within the plurality of openings to maintain electrical connection of the first connector bracket and the second connector bracket during adjustment of the computing device relative to the mounting device.

A base of a connector defines an accommodation portion for accommodating a card-type device. The base has holding portions with surfaces directed to the accommodation portion. The holding portions hold held portions of terminals 40. Heat conductive members are provided on the surfaces of the holding portions. The heat conductive members are sandwiched between the card-type device and the holding portions when the card-type device is connected to the connector 10. In this way, heat conductive paths, which include the conductive members, are formed between the card-type device and held portions of the terminals 40.

An integrated circuit assembly may be formed comprising an electronic socket having at least one conductive pin, wherein a portion of the conductive pin extends from the electronic socket. The integrated circuit assembly further comprises a conductive interposer including at least one conductive via having a conductive layer on a sidewall thereof. The conductive interposer is abutted against the electronic socket, such that the at least one conductive pin is inserted into the at least one conductive via and is biased against the conductive layer of the at least one conductive via. In further embodiments, an integrated circuit package may be electrically attached to the conductive interposer.