A method and apparatus are provided for controlling a drive terminal of a power transistor by applying a turn-off voltage to the drive terminal at a turn-off time, measuring a gate current at the drive terminal to detect a predetermined gate current slope, determining a first time increment after the turn-off time when the predetermined gate current slope is detected, determining a second time increment which is proportional to the first time increment and which expires within a Miller plateau for the power transistor, and lowering the gate current at the drive terminal to a predetermined current level upon expiration of the second time increment in order to reduce overvoltages at the power transistor.

A programmable or configurable non-contact solid state switch device and method are provided for emulating a high reliability switch. The switch device senses position information related to a switch and is calibrated using a learning operation to learn position information of mechanical features of the switch and to map the positions of these features. Electrical outputs or functions are assigned to the mapped positions and stored such that the switch device generates the outputs when their corresponding positions are sensed. A switch device is uniquely configured to the mechanical system in which it operates.

The present disclosure discloses a composite switching circuit, including a plurality of first semiconductor devices connected in series; and at least one second semiconductor device each connected in parallel to one of the plurality of first semiconductor devices. The composite switching circuit is connected to an input source. The second semiconductor device is turned off during a preset period to transfer a current flowing through the second semiconductor device to the first semiconductor devices connected in parallel to the second semiconductor device.

In one embodiment, an insulated gate bipolar transistor (IGBT) device may include an NMOS portion and a PNP portion, where the PNP portion is coupled to the NMOS portion. The PNP portion may include a base and a collector. The IGBT may further include a flyback clamp, where the flyback clamp is coupled between the base and the collector of the PNP portion.

A semiconductor device includes a semiconductor element, a die pad, an encapsulating member, and a plurality of leads. The die pad has a front surface on which the semiconductor element is mounted. The encapsulating member covers and seals the semiconductor element. The plurality of leads each have a first end connected to the semiconductor element in an inside of the encapsulating member and a second end led out from a side surface of the encapsulating member. A lower surface of a package including the semiconductor element, the die pad, and the encapsulating member is located on a back surface side of the die pad and has a convexly curved shape.

A semiconductor module including a semiconductor element which is bonded to a wiring pattern part and connects or disconnects two main electrode terminals to or from each other according to a drive signal applied to a gate electrode terminal, includes a deterioration detecting circuit configured to use one main electrode terminal of the two main electrode terminals of the semiconductor element with an applied DC voltage, as a reference potential, and detect deterioration of a joining part of the semiconductor element on the basis of a gate voltage which is the voltage between the one main electrode terminal and the gate electrode terminal and an inter-main-electrode voltage which is the voltage between the one main electrode terminal and the other main electrode terminal, and outputs an alarm signal.

A power conversion apparatus includes a semiconductor module including a semiconductor device and a control circuit unit controlling the semiconductor module. The semiconductor module has main and subsidiary semiconductor devices connected in parallel. The control circuit unit performs control such that the subsidiary semiconductor device is turned on after the main semiconductor device is turned on, and the main semiconductor device is turned off after the subsidiary semiconductor device is turned off. The control circuit unit performs control such that, one of the turn-on and turn-off switching timings has a switching speed faster than that of the other of the switching timings. The semiconductor module is configured such that, at a high-speed switching timing, an induction current directed to turn off the subsidiary semiconductor device is generated in a control terminal of the subsidiary semiconductor device depending on temporal change of a main current flowing to the main semiconductor device.

A system, a switch assembly and an associated method. The system includes a number of switch assemblies, each including a switch module, isolation circuits, a detection unit, and a drive unit. The switch module includes power switch devices connected in parallel. The switch modules are connected in series. The isolation circuits each are connected in series to a gate terminal of at least one corresponding power switch device of the power switch devices. Each isolation circuit includes a capacitor or a controllable switch. The detection unit detects faults in at least one of the power switch devices. The drive unit is coupled to the switch module via the isolation circuits for driving the power switch devices of the corresponding switch module, and when the fault is detected, the drive unit is for turning on the power switch devices parallel connected to the at least one of faulty power switch devices.

A control circuit for an electronic switch includes a first power switch receiving a common input signal and a first voltage input and a second power switch receiving the common input signal and a second voltage input. The first and second power switches switchably connect the first voltage input and the second voltage input, respectively, to a common output in response to the common input signal. The second voltage input is opposite in polarity to the first voltage input, and the first power switch and the second power switch are configured to asynchronously connect the first voltage input and the second voltage input, respectively, to the common output in response to the common input signal, the electronic switch being switched according to the first voltage input or the second voltage input being connected to the common output.

A semiconductor device includes a plurality of first transistor cells and a plurality of second transistor cells that are electrically connected in parallel between a collector electrode and an emitter electrode. A gate voltage on each of the plurality of first transistor cells is controlled by a first gate interconnection. A gate voltage on each of the plurality of second transistor cells is controlled by a second gate interconnection. A drive circuit is configured to: apply an ON-voltage of the semiconductor device to each of the first and second gate interconnections when the semiconductor device is turned on; and after a lapse of a predetermined time period since start of application of the ON-voltage, apply an OFF-voltage of the semiconductor device to the second gate interconnection and apply an ON-voltage to the first gate interconnection.