H03K17/6872

INPUT SUPPLY CIRCUIT AND METHOD FOR OPERATING AN INPUT SUPPLY CIRCUIT
20230047185 · 2023-02-16 ·

Embodiments of input supply circuits and methods for operating an input supply circuit are described. In one embodiment, an input supply circuit includes a bias circuit configured to define a voltage threshold in response to an input signal, and an input buffer configured to generate an output signal in response to the voltage threshold. Other embodiments are also described.

Integrated circuit having a differential transmitter circuit
11581875 · 2023-02-14 · ·

In an integrated circuit, a first current source is coupled between a first supply voltage and a first node. An output stage includes a first current steering PMOS transistor coupled to the first node, a first current steering NMOS transistor including a first current electrode coupled to the first current steering PMOS transistor at a second node, a second current steering PMOS coupled to the first node, and a second current steering NMOS transistor including a first current electrode coupled to the second current steering PMOS transistor at a third node. Voltage at the second node is used to drive a gate of the second current steering PMOS transistor, and voltage at the third node is used to drive a gate of the first current steering PMOS transistor. First and second programmable slew rate pre-drivers provide outputs to the gates of the first and second current steering NMOS transistors, respectively.

Analog comparator circuit for communication interfaces within a vehicle

A vehicle analog comparator circuit for communication interfaces designed to detect an actuation of an actor. The circuit comprises a unit for producing a supply voltage for supplying the actor, a unit for producing a reference voltage to be compared with the supply voltage, a transistor input stage, a node point EDMx between the actor, the unit for producing a supply voltage and the transistor input stage, and a digital evaluation unit to process the output signal from the transistor input stage such that whether or not the actor is actuated is detected. The transistor input stage comprises a transistor circuit with a first transistor is connected to the node point EDMx, and a second transistor connected to the reference voltage. A collector resistance for limiting the collector current of the second transistor, as well as a base resistance for the two transistors. Alternatively, a current mirror is provided.

GATE DRIVER DEVICE

A gate driver device includes a first field effect transistor and a first driver circuit. The first field effect transistor includes a first gate electrode and a first backgate structure. The first driver circuit supplies a first backgate drive signal to the first backgate structure.

POWER RAIL AND SIGNAL CONDUCTING LINE ARRANGEMENT

An integrated circuit includes a first-voltage power rail and a second-voltage power rail in a first connection layer, and includes a first-voltage underlayer power rail and a second-voltage underlayer power rail below the first connection layer. Each of the first-voltage and second-voltage power rails extends in a second direction that is perpendicular to a first direction. Each of the first-voltage and second-voltage underlayer power rails extends in the first direction. The integrated circuit includes a first via-connector connecting the first-voltage power rail with the first-voltage underlayer power rail, and a second via-connector connecting the second-voltage power rail with the second-voltage underlayer power rail.

Driver device having an NMOS power transistor and a blocking circuit for stress test mode, and method of stress testing the driver device

A driver device includes: a voltage terminal; a ground terminal; an output terminal; a first nMOS power transistor having a drain electrically connected to the voltage terminal, a source electrically connected to the output terminal, and a gate; an overvoltage protection circuit configured to limit a gate-to-source voltage of the first nMOS power transistor in a normal operating mode for the driver device; a pulldown circuit configured to force the first nMOS power transistor off in a stress test mode for the driver device; and a blocking circuit configured to block current flow from the output terminal to the ground terminal through the overvoltage protection circuit and the pulldown circuit in the stress test mode. A method of stress testing the driver device is also described.

Apparatus and method for providing power isolation between a power input and a protected switch

There is provided an apparatus and method, the apparatus comprising a power input and a switch isolation circuit to provide isolation between the power input and a protected switch responsive to a timing signal. The switch isolation circuit comprises a switch isolation charge store, and a buffer circuit to receive power from the switch isolation charge store and coupled between the timing signal and the protected switch. The switch isolation circuit is configured to, in response to the timing signal having the first value, operate in a powered mode in which the switch isolation charge store receives power from the power input; and, in response to the timing signal having the second value, operate in an isolation mode in which the switch isolation charge store is isolated from the power input.

Input/output (I/O) circuit with dynamic full-gate boosting of pull-up and pull-down transistors

An aspect of the disclosure relates to an apparatus including an output driver, including: a first p-channel metal oxide semiconductor field effect transistor (PMOS FET); a second PMOS FET coupled in series with the first PMOS FET between an upper voltage rail and an output; a first n-channel metal oxide semiconductor field effect transistor (NMOS FET); and a second NMOS FET coupled in series with the first NMOS FET between the output and a lower voltage rail; a first predriver coupled to gates of the first and second PMOS FETs and first and second NMOS FETs; and a second predriver coupled to the gates of the first and second PMOS FETs and first and second NMOS FETs.

High-speed sampler
11711077 · 2023-07-25 · ·

A regeneration circuit includes a first inverting circuit and a second inverting circuit. The regeneration circuit also includes a first transistor coupled to an input of the second inverting circuit, and a second transistor coupled to an input of the first inverting circuit, a third transistor and a fourth transistor. A gate of the first transistor and a gate of the fourth transistor are coupled to a first input, and a gate of the second transistor and a gate of the fourth transistor are coupled to a second input. The regeneration circuit further includes a first switch and a second switch. The first switch and the third transistor are coupled in series between a first rail and the first transistor, and the second switch and the fourth transistor are coupled in series between the first rail and the second transistor.

SINGLE-ENDED-TO-DIFFERENTIAL CONVERTER
20180013423 · 2018-01-11 ·

A single-ended-to-differential converter for driving an LVDS (Low Voltage Differential Signaling) driving circuit includes a first converting circuit, a second converting circuit, and a controller. The first converting circuit converts an input signal into a first output signal. The first converting circuit has a tunable delay time. The second converting circuit converts the input signal into a second output signal. The second converting circuit has a fixed delay time. The controller generates a first control signal and a second control signal according to the first output signal and the second output signal, so as to adjust the tunable delay time of the first converting circuit.