Embodiments of input supply circuits and methods for operating an input supply circuit are described. In one embodiment, an input supply circuit includes a bias circuit configured to define a voltage threshold in response to an input signal, and an input buffer configured to generate an output signal in response to the voltage threshold. Other embodiments are also described.

In an embodiment an integrated device includes a first physical unclonable function module configured to generate an initial data group and management module configured to generate an output data group from at least the initial data group, authorize only D successive deliveries of the output data group on a first output interface of the device, D being a non-zero positive integer, and prevent any new generation of the output data group.

A Controller Area Network (CAN) transceiver determines a voltage differential signal from analog signaling and provides a digital output signal at a receiver output to a CAN controller based on the voltage differential signal. The analog signaling received from the CAN bus can operate with a first voltage level scheme of a first CAN protocol and a second voltage level scheme for a second CAN protocol. A first comparator compares the voltage differential signal to a first threshold which is set to a value which differentiates between a logic low bit and logic high bit in accordance with the second CAN protocol. Filtering circuitry selectively filters an output of the first comparator based on detection of noise on the CAN bus to provide a first digital signal indicative of activity on the CAN bus according to the second CAN protocol.

An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.

Methods and apparatus relating to an adaptive multibit bus for energy optimization are described. In an embodiment, a 1-bit interconnect of a processor is caused to select between a plurality of operational modes. The plurality of operational modes comprises a first mode and a second mode. The first mode causes transmission of a single bit over the 1-bit interconnect at a first frequency and the second mode causes transmission of a plurality of bits over the 1-bit interconnect at a second frequency based at least in part on a determination that an operating voltage of the 1-bit interconnect is at a high voltage level and that the second frequency is lower than the first frequency. Other embodiments are also disclosed and claimed.

A circuit receives an input signal having a first level and a second level. A logic circuit includes a finite state machine circuit, an edge detector circuit, and a timer circuit. The finite state machine circuit is configured to set a mode of operation of the circuit. The edge detector circuit is configured to detect a transition between the first and second level. The timer circuit is configured to determine whether the first or second level is maintained over an interval, which starts from a transition detected by the edge detector circuit. The finite state machine circuit is configured to change the mode of operation based on the timer circuit determining that the first or second level has been maintained over the interval.

A NCL circuit is disclosed with a combinational logic circuit between DI register banks, an input register bank having at least a first input register positioned upstream of an output register bank having at least a first output register. A completion logic circuit that sends a handshaking signal to the upstream input registers indicating that all the downstream circuits are ready for any one of two wavefronts, meaningful data wavefront and a NULL wavefront from the combination logic circuit. The NCL circuit may further have one or more observation points on outrail groups of the input registers, observing propagation of startup values to the combination logic circuit. The NCL circuit may also have one or more multiplexers allowing for selection of a primary input or the feedback signal, to control the start up values to the combinational logic circuit will powering on.

Methods and apparatus relating to an adaptive multibit bus for energy optimization are described. In an embodiment, a 1-bit interconnect of a processor is caused to select between a plurality of operational modes. The plurality of operational modes comprises a first mode and a second mode. The first mode causes transmission of a single bit over the 1-bit interconnect at a first frequency and the second mode causes transmission of a plurality of bits over the 1-bit interconnect at a second frequency based at least in part on a determination that an operating voltage of the 1-bit interconnect is at a high voltage level and that the second frequency is lower than the first frequency. Other embodiments are also disclosed and claimed.

Integrated circuits are described that utilize internal state machine-driven logic elements (e.g., flops) within input and/or output wrapper chains that are used to test internal core logic of the integrate circuit. One or more individual logic elements of the wrapper chains within the integrated circuit is implemented as a multi-flop state machine rather than a single digital flip-flop. As multi-flop state machines, each enhanced logic element of a wrapper chain is individually configurable to output pre-selected values so as to disassociate the state machine-driven flops from signal transmission delays that may occur in the input or output wrapper chains of the integrated circuit.

Integrated circuits are described that utilize internal state machine-driven logic elements (e.g., flops) within input and/or output wrapper chains that are used to test internal core logic of the integrate circuit. One or more individual logic elements of the wrapper chains within the integrated circuit is implemented as a multi-flop state machine rather than a single digital flip-flop. As multi-flop state machines, each enhanced logic element of a wrapper chain is individually configurable to output pre-selected values so as to disassociate the state machine-driven flops from signal transmission delays that may occur in the input or output wrapper chains of the integrated circuit.