A semiconductor device includes an internal clock generation circuit configured to generate an internal clock; a plurality of unit circuits configured to have a first unit circuit and a second unit circuit operating while being synchronized with an internal clock; a plurality of transfer circuits including a first transfer circuit configured to provide a first transfer path having a first delay time, and a second transfer circuit configured to provide a second transfer path having a second delay time different from the first delay time; and a delay compensation circuit configured to compare a first clock input to the first unit circuit through the first transfer path with a second clock input to the second unit circuit through the second transfer path, and to adjust the second delay time so that the adjusted second delay time matches the first delay time.

Systems and methods for integrating injection-locked oscillators into transceiver arrays are disclosed. In one aspect, there is provided an injection-locked oscillator (ILO) distribution system including a master clock generator configured to generate a master clock signal. The ILO distribution system also includes an ILO distribution circuit including an ILO and configured to receive the master clock signal. The ILO is configured to generate a reference clock signal based on the master clock signal. The ILO distribution circuit is further configured to generate an output signal indicative of an operating frequency of the ILO. The ILO distribution system further includes an injection-locked detector (ILD) configured to receive the master clock signal and the output signal. The ILD is further configured to determine whether the ILO is in a locked state or in an unlocked state based on the master clock signal and the output signal.

A DLL circuit comprising a delay circuit, a phase detector and a counting control circuit. The delay circuit is configured to receive a reference clock signal, and delay the reference clock signal to output a delayed clock signal. The phase detector is configured to detect a phase difference between the reference clock signal and the delayed clock signal to generate a phase difference signal. The counting control circuit is configured to generate a control delay signal according to the phase difference signal. The delay circuit delays the reference clock signal according to the control delay signal to output the delayed clock signal. When the counting control circuit is in the first mode, the counting control circuit has a first update frequency. When the counting control circuit is in the second mode, the counting control circuit has a second update frequency.

Provided herein are delay locked loops (DLLs) with calibration for external delay. In certain embodiments, a timing alignment system includes a DLL including a detector that generates a delay control signal based on comparing a reference clock signal to a feedback clock signal, and a controllable delay line configured to generate the feedback clock signal by delaying the reference clock signal based on the delay control signal. The timing alignment system further includes a delay compensation circuit that provides an adjustment to the controllable delay line to compensate for a delay of the feedback clock signal in reaching the detector.

A clock generating circuit includes a first frequency multiplier configured to generate a second clock signal having a second frequency based on a first clock signal having a first frequency, and a second frequency multiplier configured to generate a third clock signal having a third frequency based on the second clock signal. The first frequency multiplier includes a circuit configured to control a duty cycle of the first clock signal, a delay circuit configured to receive the duty controlled clock signal, and delay the received signal based on a duty cycle of the second clock signal to output a first delay clock signal, and an XOR gate configured to perform an XOR computation using the duty controlled clock signal and the first delay clock signal to output the second clock signal. The second frequency is greater than the first frequency, and the third frequency is greater than the second frequency.

A delay line includes first to n-th delay cells and a dummy delay cell, ‘n’ being an integer greater than or equal to 3. The first to n-th delay cells sequentially delay an input signal to respectively generate first to n-th output signals. The dummy delay cell delays the n-th output signal based on a delay control voltage to generate a dummy output signal. A delay amount of each of the first to (n−1)-th delay cells is adjusted on a basis of the delay control voltage and the output signal of the delay cell of a next stage of the corresponding delay cell, and a delay amount of the n-th delay cell is adjusted on a basis of the delay control voltage and the dummy output signal.

One embodiment of a duty-cycle corrector phase shift (DCCPS) circuit includes a voltage-controlled delay line circuit, a duty-cycle correct circuit, an error amplifier circuit, and DC sampler circuits. Another embodiment of a duty-cycle corrector phase shift circuit includes a digital-controlled delay line circuit, a duty-cycle correct circuit, DC sampler circuits, a comparator circuit, a counter circuit, a control circuit, and a lock detector circuit. In some instances, the DCCPS circuit provides a clock signal with a duty-cycle of approximately fifty percent (50%) and a given phase shift between an input clock signal and the output clock signal.

A duty-cycle corrector circuit produces a clock signal with a given duty cycle (e.g., fifty percent) or with a substantially given duty cycle. The DC corrector circuit includes a delay-locked loop (DLL) circuit and a duty-cycle correction (DCC) circuit. The DLL circuit is operable to adjust a delay between local clock signals until the phase difference between the local clock signals equals or is substantially equal to zero. The DCC circuit is operable to adjust the duty cycles of the local clock signals until the duty-cycle error equals or is substantially equal to zero. The duty-cycle error equals or substantially equals zero when the duty cycles of the local clock signals equal or are substantially equal to fifty percent.

A clock generating circuit includes a first delay line, a second delay line, a selected phase mixing circuit and, a delay control circuit. The first delay line delays, based on a delay control signal, an input clock signal to generate a first delay clock signal. The second delay line delays, based on the delay control signal, the input clock signal to generate a second delay clock signal. The selected phase mixing circuit generates, based on a first selection signal and a second selection signal, an output clock signal from at least one between the first delay clock signal and the second delay clock signal. The delay control circuit monitors duty cycles of the first delay clock signal and the second delay clock signal to generate the first selection signal and the second selection signal thereby selecting at least one between the first delay line and the second delay line.

An electronic device is disclosed. The electronic device comprises a first clock configured to operate at a frequency. First circuitry of the electronic device is configured to synchronize with the first clock. Second circuitry is configured to determine a second clock based on the first clock. The second clock is configured to operate at the frequency of the first clock, and is further configured to operate with a phase shift with respect to the first clock. Third circuitry is configured to synchronize with the second clock.