An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.

An analog to digital convertor circuit includes an input circuit and a switched capacitor circuit. The input circuit is configured to selectively drain a first current from a first node or drain a second current from a second node according to a first bit and a second bit that have opposite logic values. The switched capacitor circuit is configured to compensate a capacitance value of one of the first node and the second node according to the first bit and the second bit.

An analog-to-digital converter (ADC) includes a first ADC stage with a first sub-ADC stage configured to sample the analog input voltage in response to a first phase clock signal and output a first digital value corresponding to an analog input voltage in response to a second phase clock signal. A current mode DAC stage is configured to convert the analog input voltage and the first digital value to respective first and second current signals, determine a residue current signal representing a difference between the first and the second current signal, and convert the residue current signal to an analog residual voltage signal. A second ADC stage is coupled to the first ADC stage to receive the analog residual voltage signal, and convert the analog residue voltage signal to a second digital value. An alignment and digital error correction stage is configured to combine the first and the second digital values.

A digital-to-analog conversion device and method are provided. The control module is configured to split the input digital signal into n intermediate digital portions, divide the n intermediate digital portions by the corresponding conversion coefficients to obtain n intermediate digital signals and transmit the n intermediate digital signals to the n conversion modules. The n intermediate digital portions increase progressively. The conversion module is configured to perform digital-to-analog conversion on an intermediate digital signal to obtain a result including the conversion coefficient of the conversion module. The adder is configured to add output signals of the n conversion modules to obtain an analog signal. The feedback module is configured to obtain a feedback signal according to the analog signal. The control module is further configured to adjust the allocation of the n intermediate digital portions according to a target digital signal and the feedback signal.

A processing device is provided. The processing device comprises one or more interfaces configured to transmit information to a nonlinear device and processing circuitry configured to control the one or more interfaces and to. Further, the processing circuitry is configured to transmit an excitation signal to the nonlinear device and to receive response information from the nonlinear device. Further, the processing circuitry is configured to determine a linear response of the nonlinear device based on the response information and to determine a nonlinear response of the nonlinear device based on the determined linear response.

Described herein are apparatus and methods for a high bandwidth under-sampled successive approximation register (SAR) analog to digital converter (ADC) (SAR ADC) with non-linearity minimization. A method includes sampling, by a sampling switch triggered by a sampling clock in the SAR ADC, an input signal, determining, by a comparator in the SAR ADC, a value for a bit based on comparing the sampled input signal to a reference signal provided by a reference digital-to-analog (DAC) in the SAR ADC, wherein the input signal and the reference signal propagate through substantially similar input paths, resampling, by the sampling switch, the input signal for each successive bit, determining, by the comparator, a value for each successive bit based on comparing the resampled input signal and a reference signal for each successive bit, and outputting, by a digital controller, a digital result after determining a value for a last bit by the comparator.

Digital-to-analog converter (DAC) architecture, comprising: a matrix DAC array comprising a plurality of cells arranged in a first dimension and a second dimension, each cell comprising a local decoder configured to transition the cell between at least two states; and decoding circuitry configured to: receive a digital input signal; and control the plurality of local decoders based on a received digital input signal, wherein each incremental change in the digital input signal results in a transition of a single cell of the plurality of cells such that the plurality of cells transition in sequence, the sequence of transitions of the plurality of cells defining a path through the DAC array; wherein when the path proceeds in the first dimension, the path proceeds to an adjacent cell of the plurality of cells at least 50% of the time; and wherein when the path proceeds in the second dimension, the path proceeds to an adjacent cell of the plurality of cells at least 50% of the time.

An example apparatus includes: resistor ladder circuitry including a plurality of intermediate voltage nodes; a first plurality of switches having inputs coupled to a plurality of intermediate voltage nodes and having outputs; first level decoder circuitry configured to: receive a set of input bits; and open or close ones of the first plurality of switches based on a first subset of the input bits; a second plurality of switches having inputs coupled to the outputs of the first plurality of switches and having outputs coupled to a common node; and second level decoder circuitry configured to: receive the set of input bits; and open or close ones of the second plurality of switches based on a second subset of the input bits, the first and the second subsets sharing one of the input bits, wherein the output voltage is to be coupled to the common node.

A digital-to-analog conversion device and method are provided. The control module is configured to split the input digital signal into n intermediate digital portions, divide the n intermediate digital portions by the corresponding conversion coefficients to obtain n intermediate digital signals and transmit the n intermediate digital signals to the n conversion modules. The n intermediate digital portions increase progressively. The conversion module is configured to perform digital-to-analog conversion on an intermediate digital signal to obtain a result including the conversion coefficient of the conversion module. The adder is configured to add output signals of the n conversion modules to obtain an analog signal. The feedback module is configured to obtain a feedback signal according to the analog signal. The control module is further configured to adjust the allocation of the n intermediate digital portions according to a target digital signal and the feedback signal.

A current steering converter fabricated using a predetermined integrated circuit technology includes a unary portion having one or more current sources and a binary portion including a plurality of switches controlled by a decoder, the switches coupled to a converter output; and a plurality of devices commonly connected at a first end and coupled to each respective switch at a second end, wherein each device size comprises (W/L)*M, where W/L is a width and length of the device and M is an integer representing multiple number.