A sensor arrangement includes a switchable voltage source having a source output for alternatively providing a first and a second excitation voltage, an integrator having an integrator input and an integrator output, a sensor resistor having a first terminal coupled to the source output, a reference resistor having a first terminal coupled to a second terminal of the sensor resistor and a second terminal coupled to the integrator input, and a comparator having a first comparator input coupled to the integrator output.

A capacitor digital-to-analog converter (CDAC) includes a clock generator, a random reset control signal generator, a first capacitor array, a first reset circuit and an output buffer. The clock generator generates an internal clock signal and a reset control signal that are regularly toggled. The random reset control signal generator generates a random reset control signal that is irregularly toggled. The first capacitor array includes a plurality of capacitors connected to a first summation node, and generates a first summation voltage corresponding to a first input digital signal based on first and second reference voltages. The first reset circuit initializes the first summation node based on the random reset control signal. The output buffer generates a first analog output voltage by buffering the first summation voltage.

A method, apparatus, and energy metering system obtains mains samples of a mains power line signal, performs non-white noise (NWN) filtering of the mains power line signal, obtains adjustable clock source samples of an adjustable clock signal of an adjustable clock oscillator, determines a difference based on the mains samples and the adjustable clock source samples, adjusts an adjustable clock source frequency of the adjustable clock oscillator based on the difference, and applies the adjustable clock source frequency to an analog to digital converter (ADC) to determine a conversion rate of the ADC.

A successive approximation register analog-to-digital converter includes a capacitance digital-to-analog converter (CDAC) having, a voltage storing circuit connected to an output terminal of the CDAC and including a plurality of capacitors connected in parallel, an output voltage of the CDAC being stored in a selected one of the capacitors, a selector configured to output a voltage stored in the selected one of the capacitors, a comparator configured to compare a voltage input to an input terminal thereof, which is connected to an output terminal of the CDAC, with a reference voltage, and a successive approximation register configured to control the CDAC based on an output of the comparator, and cyclically control the voltage storing circuit and the selector, such that the output of the selector is output to the output terminal one or more cycles after the output voltage was stored in the selected one of the capacitors.

Described herein are techniques for mitigating bandwidth mismatch in time-interleaved (TI) analog-to-digital converters (ADC). The techniques described herein involve spreading the energy associated with spurious tones resulting from bandwidth mismatch across the frequency spectrum, thereby reducing the overall impact of each individual tone. In some embodiments, for example, the tones may disappear under the noise floor. Spreading the energy associated with the spurious tones can be achieved by increasing the periodicity of the phase oscillation. This, in turn, can be achieved by introducing, in the phase oscillation, artificial phase shifts in addition to the phase shifts arising due to bandwidth mismatch. In one example, increasing the periodicity of a phase oscillation from 4 phase samples to 8 phase samples can result in a reduction in the power of a tone as high as 7 dB.

Sensor circuits having a filter and methods for filtering a sensor signal are provided. In this case, a passband width of an adjustable low-pass filter or bandpass filter is adjusted on the basis of a comparison of a measure of a signal change of a sensor signal with a threshold value.

A successive approximation ADC includes: a comparator generating a judge signal related to an input analog and a reference signals; a SAR successively generating a register signal including a first and a second bit signals based on the judge signal and generating an AD conversion value of the input analog signal; a thermometer decoder switching different thermometer code conversion rules and converting the first bit signal to thermometer codes corresponding to the different thermometer code conversion rules in one AD conversion cycle; a first and a second DA converters respectively converting the thermometer codes to a first analog signal and the second bit signal to a second analog signal; an average value calculator averaging the AD conversion values by the thermometer codes. Two of the different thermometer codes have values that a high-order bit and a low-order bit groups by dividing total bits of the thermometer code equally are exchanged.

A dynamic voltage-to-delay device may have voltage lines for receiving input signals during reset phases, and a current source, connected to the first and second voltage lines, for increasing voltages on the voltage lines during active phases. The voltage-to-delay device may also have comparators, connected to the voltage lines, for generating first and second output signals during the active phases when the voltages on the voltage lines reach a threshold voltage, such that a delay between the output signals is representative of a difference between voltages of the input signals. The voltage-to-delay device may have at least two current sources. The comparators may have a tail node to which a voltage is applied during a reset phase, and a current source for reducing the voltage at the tail node, and thereby reducing a threshold voltage during an active phase.

Digital to analog conversion generates an analog output corresponding to a digital input by controlling unit elements or cells using data bits of the digital input. The unit elements or cells individually make a contribution to the analog output. Due to process, voltage, and temperature variations, the unit elements or cells may have mismatches. The mismatches can degrade the quality of the analog output. To extract the mismatches, a transparent dither can be used. The mismatches can be extracted by observing the analog output, and performing a cross-correlation of the observed output with the dither. Once extracted, the unit elements or cells can be adjusted accordingly to reduce the mismatches.

A successive approximation ADC includes: a comparator generating a judge signal related to an input analog and a reference signals; a SAR successively generating a register signal including a first and a second bit signals based on the judge signal and generating an AD conversion value of the input analog signal; a thermometer decoder switching different thermometer code conversion rules and converting the first bit signal to thermometer codes corresponding to the different thermometer code conversion rules in one AD conversion cycle; a first and a second DA converters respectively converting the thermometer codes to a first analog signal and the second bit signal to a second analog signal; an average value calculator averaging the AD conversion values by the thermometer codes. Two of the different thermometer codes have values that a high-order bit and a low-order bit groups by dividing total bits of the thermometer code equally are exchanged.