In an A/D converter circuit, time required for a first pulse signal to have passed through all first delay units of a first pulse delay circuit is defined as first turnaround time, and time required for a second pulse signal to have passed through all second delay units of a second pulse delay circuit is defined as second turnaround time. Average time required for the first pulse signal to pass through any of the first delay units is defined as first passage time, and average time required for the second pulse signal to pass through any of the second delay units is defined as second passage time. A difference between the first and second passage times enables a difference between the first and second turnaround times to be smaller as compared with a reference difference therebetween for a case where the first and second passage times are identical to each other.

An integrated circuit includes an analog-to-digital converter (ADC) having selectable first and second analog channel inputs and a digital output. A window comparator coupled to the digital output. The window comparator configured to compare a digital value on the digital output to first and second threshold values. A programmable clock circuit configured to provide a clock signal to the ADC. A controller that, response to assertion of the trigger signal, is configured to generate a sample rate control signal to the clock circuit to cause the clock circuit to increase the frequency of the clock signal and toggle selection between the first and second analog channel inputs. A result comparison circuit having a comparison input coupled to the digital output. The result comparison circuit is configured to compare a first digital conversion output from the ADC to a second digital conversion output from the ADC.

The disclosure concerns controlling circuitry operably connectable to a plurality of constituent analog-to-digital converters (sub-ADCs) of an asynchronous time-interleaved analog-to-digital converter (TI-ADC). The controlling circuitry is configured to maintain a set of a number of sub-ADCs currently available for processing of an input sample, wherein the set is a subset of the plurality. Maintenance of the set is achieved by reception, from each of one or more of the sub-ADCs of the plurality, of an availability signal indicative of availability of the corresponding sub-ADC, and (responsive to the reception of the availability signal) addition of the corresponding sub-ADC to the set. Maintenance of the set is further achieved by (for each new input sample) selection of a sub-ADC of the set for processing of the new input sample, and (responsive to the selection) removal of the selected sub-ADC from the set and causing of the selected sub-ADC to process the new input sample. Corresponding TI-ADC, wireless communication receiver, wireless communication node, method and computer program product are also disclosed.

A method of operating an analog-to-digital converter includes in a first sampling stage, switching a swap signal to a first level for a first selection circuit to reset a first capacitor array according to a first voltage configuration and for a second selection circuit to reset a second capacitor array according to the first voltage configuration, and in a second sampling stage, switching the swap signal to a second level for the first selection circuit to reset the first capacitor array according to the second voltage configuration and for the second selection circuit to reset the second capacitor array according to the second voltage configuration. A control logic circuit is used to switch the swap signal between the first level and the second level in a uniform order in a plurality of sampling stages.

A digital to analog conversion, DAC, device for converting digital signals to analog signals comprises a RF output for outputting the analog signals, a thermometer segment comprising a first number of data slices and a second number calibration slices, and a calibration controller, which electrically disconnects one of the data slices from the RF output and at the same time connects one of the calibration slices to the RF output as replacement slice for the respective data slice and performs a calibration of the disconnected data slice.

A device is provided comprising a first oscillator based analog-to-digital converter configured to receive an analog input signal and output a first digital signal and a second oscillator based analog-to-digital converter configured to receive an analog reference signal and output a second digital signal. The device further comprises output logic configured to generate a digital output signal based on the first digital signal and the second digital signal.

A method for non-linearity correction includes receiving a first output signal from a data signal path containing a first analog-to-digital converter and receiving a second output signal from a second analog-to-digital converter. The method also includes generating first non-linearity coefficients using the first output signal and generating second non-linearity coefficients using the first and second output signals. The method further includes applying, by a non-linearity corrector in the data signal path, the first and second non-linearity coefficients to compensate for non-linearity components in a digitized signal output from the first analog-to-digital converter to generate a corrected digitized signal.

There is disclosed herein analogue-to-digital converter circuitry, comprising a set of sub-ADC units each for carrying out analogue-to-digital conversion operations, the set comprising a given number of core sub-ADC units for carrying out said given number of core conversion operations. Also provided is control circuitry operable, when a said sub-ADC unit is determined to be a defective sub-ADC unit, to cause the core conversion operations to be carried by the sub-ADC units of the set sub-ADC units other than the defective sub-ADC unit.

An analog-to-digital converting circuit for converting an analog signal into a digital signal includes a plurality of reference voltage generators each generating a reference voltage, a plurality of reference voltage decoupling capacitors respectively corresponding to the reference voltage generators, and an analog-to-digital converter generating a comparison voltage based on the reference voltage and generating the digital signal corresponding to the analog signal based on a result of comparing the comparison voltage with the analog signal. At least one different combination of the reference voltage generators and the reference voltage decoupling capacitors is connected to the analog-to-digital converter in each of a plurality of conversion periods.

A time-interleaved analogue-to-digital converter including a first analogue-to-digital converter, a second analogue-to-digital converter, and a third analogue-to-digital converter, each arranged to sample an analogue input and produce a respective digital output based on the sampled analogue input, and also including a signal interleaving portion, arranged to combine the digital outputs from the analogue-to-digital converters to produce a digital output signal. The time-interleaved analogue-to-digital converter is configured for operation both in an operational mode, and in a compensation mode when the third analogue-to-digital converter is non-functional. In the operational mode, the first and second analogue-to-digital converter sample the analogue input respectively at a first frequency and a second frequency. In the compensation mode, the first and second analogue-to-digital converter sample the analogue input respectively at a third frequency and a fourth frequency. The third frequency is higher than the first frequency, and the fourth frequency is higher than the second frequency.