An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

An ADC system comprises a coarse ADC for determining a coarse word representing an input signal, and an incremental ADC for determining a fine word based on a combination of the input signal and a feedback signal. A first combiner generates a first intermediate output word by joining the coarse word and the fine word. A feedback path generates the feedback signal based on the first intermediate output word. A decimation filter generates a second intermediate output word by filtering the first intermediate output word. A correction block determines a correction word based on the coarse word, on the first and the second predetermined number of bits and conversion parameters of the incremental ADC. A second combiner generates an output word by addition of the second intermediate output word and the correction word.

An electronic device includes a precision reference circuit, which contains a bandgap reference circuit and an offset-correction circuit. The bandgap reference circuit has an output that is coupled to provide a bandgap reference voltage and an intermediate node that is separated from the output by a transimpedance resistor. The offset-correction circuit is coupled to the bandgap reference circuit and includes a DAC. The DAC is coupled to the intermediate node and is also coupled to receive an external digital value. The external digital value determines a fraction of a correction current that will be passed by the DAC.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into a plurality of first digital codes, in which a first converter circuitry in the converter circuitries is configured to perform a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate control signals, and determines whether to set the second digital code to be a second corresponding digital code in predetermined digital codes according to the control signals.

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into first digital codes. A first converter circuitry in the converter circuitries performs a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate first and second valid signals, and determines whether to set the second digital code to be a first predetermined digital code or a second predetermined digital code according to the first and the second valid signals. The second valid signal is a delay signal of the first valid signal.

Body text indent—does not have paragraph numbering turned on. Not needed in the Abstract. An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.

An electronic device may include an electronic display having multiple display pixels to display an image based on analog voltage signals. The electronic device may also include optical calibration circuitry to generate digital-to-analog converter (DAC) data based on image data associated with the image and dither circuitry to reduce a bit-depth of the DAC data, generating dithered DAC data. Additionally, the electronic device may include a gamma generator having one or more DACs to generate the analog voltage signals based on the dithered DAC data, which may instruct the gamma generator to generate the analog voltage signals indicative of the image data.

Techniques for facilitating analog-to-digital converter calibrations are provided. In one example, a method includes, for each of a plurality of time instances, generating a first ramp signal started at the time instance relative to a respective start of a first counter signal and generating a respective comparator output signal based on the first ramp signal and a first threshold signal. The method further includes capturing a respective first value of the first ramp signal in response to a transition of the respective comparator output signal. The method further includes determining a respective second counter value of a second counter signal based on the respective first value. The method further includes determining a scaling factor based on the second counter values and the time instances. Each of the first values is associated with the same counter value of the first counter signal. Related devices and systems are also provided.

An ADC system comprises a coarse ADC for determining a coarse word representing an input signal, and an incremental ADC for determining a fine word based on a combination of the input signal and a feedback signal. A first combiner generates a first intermediate output word by joining the coarse word and the fine word. A feedback path generates the feedback signal based on the first intermediate output word. A decimation filter generates a second intermediate output word by filtering the first intermediate output word. A correction block determines a correction word based on the coarse word, on the first and the second predetermined number of bits and conversion parameters of the incremental ADC. A second combiner generates an output word by addition of the second intermediate output word and the correction word.

An apparatus can include a digital-to-analog converter (DAC) and calibration circuitry including an oscillator. The calibration circuitry can be coupled to an output of the DAC, the calibration circuitry to sample and count DAC output pulses for at least two consecutive pulses using at least two separate counter circuits. The calibration circuitry can determine error between at least two consecutive pulses and provide a correction value based on the error. The apparatus can further include correction circuitry to provide a calibration signal to the DAC based on the correction value.