An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

A device includes a first compensation circuit configured to adjust an analog front end (AFE) output to generate a first adjusted AFE output, a first data slicer configured to output a first voltage based on the first adjusted AFE output. The first compensation circuit includes a first path between a voltage source and a ground, including a first transistor, a first adjustable current source, a first input voltage node configured to receive the AFE output, and a first output voltage node coupled to the first data slicer, a second path between the voltage source and the ground, including a second transistor, a second adjustable current source, a second input voltage node configured to receive the AFE output, and a second output voltage node coupled to the second data slicer, and a configurable resistance resistor and a configurable capacitance capacitor coupled in parallel across the first path and the second path.

A photodetection device according to the present disclosure includes: a pixel; a reference signal generation unit; a comparison circuit; and a first switch. The pixel is configured to generate a pixel signal. The reference signal generation unit is configured to generate a reference signal. The comparison circuit includes a first-stage amplifier circuit and a second-stage amplifier circuit that is coupled to the first-stage amplifier circuit through a connection node. The first-stage amplifier circuit is configured to output a first output signal corresponding to a comparison operation based on the pixel signal and the reference signal. The second-stage amplifier circuit is configured to output a second output signal corresponding to the first output signal outputted from the first-stage amplifier circuit through the connection node. The first switch has one end and another end. The one end is coupled to the connection node. The first switch allows impedance and a voltage at the connection node to change.

Apparatus includes an ADC configured to convert an analog signal to a digital signal, a comparator having a first input responsive to the analog signal, a second input responsive to the digital signal, and an output at which a comparison signal is provided, and an output checker configured to process the comparison signal to generate a fault signal indicative of whether a fault has occurred in the ADC. The comparator can be an analog comparator in which case the digital signal is converted to an analog signal for the comparison or a digital comparator in which case an additional ADC is provided to convert the analog signal into a digital signal for the comparison. Embodiments include more than one ADC in which case summation elements are provided to sum the analog signals and the digital signals for the comparison.

There is provided an imaging device including a pixel array section including pixel units two-dimensionally arranged in a matrix pattern, each pixel unit including a photoelectric converter, and a plurality of column signal lines disposed according to a first column of the pixel units. The imaging device further includes an analog to digital converter that is shared by the plurality of column signal lines.

Certain aspects of the present disclosure provide a digital-to-analog converter (DAC) system. The DAC system generally includes a plurality of current steering cells, each comprising a current source coupled to at least two current steering switches, wherein control inputs of the at least two current steering switches are coupled to an input path of the DAC system. The DAC system may also include a current source toggle circuit configured to selectively disable the current source of at least one of the plurality of current steering cells, and a feedforward path coupled between the input path and at least one control input of the current source toggle circuit.

A flicker detection circuit is provided. The flicker detection circuit may include a flicker detection correlated double sampling (FD CDS) circuit including first to sixth switches turned on or off based on a control signal, and first to fourth capacitors, the FD CDS circuit being configured to receive a flicker pixel signal output from at least one pixel, summate with an output offset signal, and amplify the summation based on a gain to form a flicker detection signal; and an analog-to-digital converter (ADC) configured to quantize the flicker detection signal.

A system and method for phase and gain calibration of a current sensor system. The system comprises a microcontroller configured to execute software in an energy measurement component and a calibration computer having a calibration application. The energy measurement component receives first and second digital signals representing current and voltage signals, respectively, received from a test source, and calculates active power and a power factor, and provides those values to the calibration computer. The power factor is converted to a converted phase angle. Based on the information received from the energy measurement component, the calibration application calculates parameters used to update components within the microcontroller to maximize the accuracy of the current sensor system.

Disclosed are a capacitance-to-digital conversion circuit, a capacitance-to-digital conversion method and an electronic chip. The capacitance-to-digital conversion circuit includes a first module, a comparator and an adaptive range-shift module; the first module includes a successive approximation unit, a first adder, a first digital-to-analog converter, a second adder, a third adder and an integrating unit. The first module further includes a second digital-to-analog converter connected to the third adder. The comparator, the adaptive range-shift module and the first adder are connected in series and the comparator is connected to the second digital-to-analog converter. By the present application, the adverse influence caused by the parasitic and interference is well avoided, the capacitance-to-digital conversion circuit may work in a harsh environment, the robustness of the circuit is significantly improved and the application range of the circuit is expanded.

The present disclosure discloses a sample and hold amplifier circuit that includes a positive and a negative terminal capacitor arrays, a positive and a negative terminal switch arrays and a differential output circuit. A second terminal of each of bit capacitors in the positive and the negative terminal capacitor arrays are respectively coupled to a positive and a negative output terminal. In a sampling time period, according to a first connection relation, each of the connected bit capacitors is controlled to receive a polarity input voltage to perform a gain modification. In a holding time period, according to a second connection relation, each of the connected bit capacitors is controlled to receive an offset modification voltage to perform an offset modification. A positive and a negative output voltages are generated at the positive and the negative output terminal to be outputted as a pair of differential output signals by the differential output circuit.