An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.

A receiver includes a variable resolution analog-to-digital converter (ADC) and variable resolution processing logic/circuitry. The processing logic may use feed-forward equalization (FFE) techniques to process the outputs from the ADC. When receiving data from a channel having low attenuation, distortion, and/or noise, the ADC and processing logic may be configured to sample and process the received signal using fewer bits, and therefore less logic, than when configured to receiving data from a channel having a higher attenuation, distortion, and/or noise. Thus, the number of (valid) bits output by the ADC, and subsequently processed (e.g., for FFE equalization) can be reduced when a receiver of this type is coupled to a low loss channel. These reductions can reduce power consumption when compared to operating the receiver using the full (i.e., maximum) number of bits the ADC and processing logic is capable of processing.

An analog-to-digital conversion device is provided that includes a front SAR ADC and a plurality of rear SAR ADCs. The front SAR ADC is configured to convert an analog input signal into a group of higher bits of a digital output signal in response to different time periods. Each of the rear SAR ADCs is electrically coupled to the front SAR ADC and is configured to receive the analog input signal and the corresponding group of higher bits in response to the different time periods. The rear SAR ADCs convert the analog input signal into a group of lower bits of the digital output signal corresponding to the time period of the group of higher bits.

An exemplary incremental two-step capacitance-to-digital converter (CDC) with a time-domain sigma-delta modulator (TDΔΣM) includes a voltage-controlled oscillator (VCO)-based integrator that can be used in a low-order loop configuration. Example prototypes are disclosed, which when fabricated in 40-nm CMOS technology, provides CDC resolution of 0.29 fF while dissipating only 0.083 nJ per conversion.

An analog-to-digital converter (ADC) includes a first ADC stage with a first sub-ADC stage configured to sample the analog input voltage in response to a first phase clock signal and output a first digital value corresponding to an analog input voltage in response to a second phase clock signal. A current mode DAC stage is configured to convert the analog input voltage and the first digital value to respective first and second current signals, determine a residue current signal representing a difference between the first and the second current signal, and convert the residue current signal to an analog residual voltage signal. A second ADC stage is coupled to the first ADC stage to receive the analog residual voltage signal, and convert the analog residue voltage signal to a second digital value. An alignment and digital error correction stage is configured to combine the first and the second digital values.

An analog-to-digital converter (ADC) circuit comprises one or more most-significant-bit (MSB) capacitors having first ends connected to a voltage comparator and one or more least-significant-bit (LSB) capacitors having first ends connected to the comparator. The circuit further comprises a first switching circuit for each MSB capacitor, configured to selectively connect the second end of the respective MSB capacitor to (a) an input voltage, for sampling, (b) a ground reference, during portions of a conversion phase, and (c) a first conversion reference voltage, for other portions of the conversion phase. The circuit still further comprises a second switch circuit, for each LSB capacitor, configured to selectively connect the second end of the respective LSB capacitor between (d) the ground reference, during portions of the conversion phase, and (e) a second conversion reference voltage, for other portions of the conversion phase, the second conversion reference voltage differing from the first.

An apparatus for analog-to-digital conversion is provided. The apparatus includes a first analog-to-digital converter (ADC) configured to receive an input signal and convert the input signal to a sequence of M-bit digital values. The apparatus further includes a second ADC including a plurality of time-interleaved sub-ADCs each being configured to receive the input signal and at least one M-bit digital value of the sequence of M-bit digital values. Further, each of the plurality of time-interleaved sub-ADCs is configured to convert the input signal to a respective sequence of B-bit digital values using the at least one M-bit digital value of the sequence of M-bit digital values. M and B are integers with M<B.

Disclosed are a capacitance-to-digital conversion circuit, a capacitance-to-digital conversion method and an electronic chip. The capacitance-to-digital conversion circuit includes a first module, a comparator and an adaptive range-shift module; the first module includes a successive approximation unit, a first adder, a first digital-to-analog converter, a second adder, a third adder and an integrating unit. The first module further includes a second digital-to-analog converter connected to the third adder. The comparator, the adaptive range-shift module and the first adder are connected in series and the comparator is connected to the second digital-to-analog converter. By the present application, the adverse influence caused by the parasitic and interference is well avoided, the capacitance-to-digital conversion circuit may work in a harsh environment, the robustness of the circuit is significantly improved and the application range of the circuit is expanded.

Numerous embodiments of analog neural memory arrays are disclosed. In one embodiment, an analog neural memory system comprises an array of non-volatile memory cells, wherein the cells are arranged in rows and columns, the columns arranged in physically adjacent pairs of columns, wherein within each adjacent pair one column in the adjacent pair comprises cells storing W+ values and one column in the adjacent pair comprises cells storing W− values, wherein adjacent cells in the adjacent pair store a differential weight, W, according to the formula W=(W+)−(W−). In another embodiment, an analog neural memory system comprises a first array of non-volatile memory cells storing W+ values and a second array storing W− values.

A mixed-signal integrated circuit that includes: a global reference signal source; a first summation node and a second summation node; a plurality of distinct pairs of current generating circuits arranged along the first summation node and the second summation node; a first current generating circuit of each of the plurality of distinct pairs that is arranged on the first summation node and a second current generating circuit of each of the plurality of distinct pairs is arranged on the second summation node; a common-mode current circuit that is arranged in electrical communication with each of the first and second summation nodes; where a local DAC adjusts a differential current between the first second summation nodes based on reference signals from the global reference source; and a comparator or a finite state machine that generates a binary output value current values obtained from the first and second summation nodes.