An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.

An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.

An input stage for an analog/digital converter, an analog/digital converter and a method for testing analog/digital converters with successive approximation are disclosed. At an input stage, an input signal is supplied via a first transistor arrangement of a sampling capacitor arrangement. The sampling capacitor arrangement can be optionally connected to ground or to a reference voltage by way of a second transistor arrangement and a switch apparatus.

An input stage for an analog/digital converter, an analog/digital converter and a method for testing analog/digital converters with successive approximation are disclosed. At an input stage, an input signal is supplied via a first transistor arrangement of a sampling capacitor arrangement. The sampling capacitor arrangement can be optionally connected to ground or to a reference voltage by way of a second transistor arrangement and a switch apparatus.

Herein disclosed is an example analog-to-digital converter (ADC) and methods that may be performed by the ADC. The ADC may derive a first code that approximates a combination of an analog input value of the ADC and a dither value for the ADC sampled on a capacitor array. The ADC may further derive a second code to represent a residue of the combination with respect to the first code applied to the capacitor array. The ADC may combine the numerical value of the first code and the numerical value of the second code to produce a combined code applied to the capacitor array for deriving a digital output code. Combining the numerical value of the first code and the numerical value of the second code in the digital domain can provide for greater analog-to-digital (A/D) conversion linearity.

A resistive matrix computation circuit and methods for using the same are disclosed. In one embodiment, a resistive matrix computation circuit includes a memory configured to store a first set of operands and a second set of operands, where the first set of input operands and the second set of input operands are programmable by a controller, and the first set of operands and the second set of operands are cross-multiplied to form a plurality of product pairs, a plurality of resistive multiplier circuits configured to generate a plurality of output voltages according to the plurality of product pairs; the controller is configured to control the plurality of resistive multiplier circuits to perform multiplications using the first set of operands and the second set of operands, and an aggregator circuit configured to aggregate the plurality of output voltages from the plurality of resistive multiplier circuits, where the plurality of output voltages represent an aggregated value of the plurality of product pairs.

A synchronous rectifier includes: an integrator configured to integrate a voltage across a secondary side winding of a transformer over an integral period having an expected zero integral value; a first comparator configured to detect an end of a demagnetization phase of the secondary side winding based on diode detection; and a digital circuit configured to adjust a channel gain of the synchronous rectifier based on an integration error at the end of the integral period, the integration error corresponding to the difference between the integrated voltage at the end of the integral period and the expected zero integral. Corresponding methods of gain tuning and a power converter are also described.

A synchronous rectifier includes: an integrator configured to integrate a voltage across a secondary side winding of a transformer over an integral period having an expected zero integral value; a first comparator configured to detect an end of a demagnetization phase of the secondary side winding based on diode detection; and a digital circuit configured to adjust a channel gain of the synchronous rectifier based on an integration error at the end of the integral period, the integration error corresponding to the difference between the integrated voltage at the end of the integral period and the expected zero integral. Corresponding methods of gain tuning and a power converter are also described.