H03M13/1575

INTERNET-OF-THINGS EDGE SERVICES FOR DEVICE FAULT DETECTION BASED ON CURRENT SIGNALS
20230047772 · 2023-02-16 ·

Methods, systems, and computer-readable storage media for receiving, by an anomalous operation detection service, current signal data representing a driving current applied to a device over a time period, processing, by an anomalous operation detection service, the current signal data through a deep neural network (DNN) module, a frequency spectrum analysis (FSA) module, and a time series classifier (TSC) module to provide a set of indications, each indication in the set of indications indicating one of normal operation of the device and anomalous operation of the device, processing, by an anomalous operation detection service, the set of indications through a voting gate to provide an output indication, the output indication indicating one of normal operation of the device and anomalous operation of the device, and selectively transmitting one or more of an alert and a message based on the output indication.

MEMORY DEVICE AND OPERATING METHOD THEREOF
20230037996 · 2023-02-09 ·

An operating method of a memory device includes storing position information regarding a codeword including an erasure and erasure information including position information regarding the erasure in a memory region, loading the position information regarding the codeword to a row decoder and a column decoder, determining whether a read address corresponding to a read instruction is identical to the position information regarding the codeword including the erasure, in response to the read instruction from a host, transmitting the position information of the erasure to an error correction code (ECC) decoder, when the read address is identical to the position information regarding the codeword including the erasure, and correcting, by the ECC decoder, an error in a codeword received from a memory cell array using the position information regarding the erasure.

Syndrome calculation for error detection and error correction
11711100 · 2023-07-25 · ·

A syndrome calculation circuit includes a matrix product calculation circuit. The matrix product calculation circuit is configured to generate syndrome bits in a composite field by calculating a matrix product of input data bits and a first arithmetic matrix. The first arithmetic matrix is a matrix product of a basis conversion matrix for converting a data string from a Galois field to the composite field and a second arithmetic matrix, which is at least a part of a parity check matrix.

Bit flipping low-density parity-check decoders with low error floor

A memory device having a Low-Density Parity-Check (LDPC) decoder that is energy efficient and has a low error floor. The decoder is configured to determine syndromes of bits in a codeword, select bits in the codeword based at least in part on the syndromes according to a first mode, and flip the selected bits in the codeword. The decoder can repeat the bit selection and flipping operations to iteratively improve the codeword and reduce parity violations. Further, the decoder can detect a pattern in parity violations of the codeword in its iterative bit flipping operations. In response, the decoder can change from the first mode to a second mode in bit selection for flipping. For example, the decoder can transmit from a dynamic syndrome mode to a static syndrome mode in response to the pattern of repeating a cycle of bit flipping iterations.

Optimizations for variable sector size in storage device namespaces

A method and apparatus for determining the sector size and concomitant host metadata size to determine the difference between total size of the data block to be stored, and using the difference for parity data. This allows an increase in parity bits available for smaller sector sizes and/or data with smaller host metadata sizes. Because the amount of space available for additional parity bits is known, data with lower numbers of parity bits may be assigned to higher quality portions a memory array written with longer programming trim times, and/or written to memory dies with good redundant columns, further increasing performance and reliability.

Address bits with reduced hamming distance
11705173 · 2023-07-18 · ·

Memory units are accessed using address bits. The address bits used to access memory units can have various formats. The address bits to access successive locations that are to be sequentially accessed can have a reduced Hamming distance binary code format to reduce a quantity of toggling to switch from one set of address bits to another set of address bits.

Quantum code for reduced frequency collisions in qubit lattices

A quantum computer includes a quantum processor that includes a first plurality of qubits arranged in a hexagonal lattice pattern such that each is substantially located at a hexagon apex, and a second plurality of qubits each arranged substantially along a hexagon edge. Each of the first plurality of qubits is coupled to three nearest-neighbor qubits of the second plurality of qubits, and each of the second plurality of qubits is coupled to two nearest-neighbor qubits of the first plurality of qubits. Each of the second plurality of qubits is a control qubit at a control frequency. Each of the first plurality of qubits is a target qubit at one of a first target frequency or a second target frequency. The quantum computer includes an error correction device configured to operate on the hexagonal lattice pattern of the plurality of qubits so as to detect and correct data errors.

BCH FAST SOFT DECODING BEYOND THE (D-1)/2 BOUND
20230223958 · 2023-07-13 ·

A method for Bose-Chaudhuri-Hocquenghem (BCH) soft error decoding includes receiving a codeword x, wherein the received codeword x has τ=t+r errors for some r≥1; computing a minimal monotone basis {λ.sub.i(x)}.sub.1≤i≤r+1.Math.F[x] of an affine space V={λ(x)∈F[x]:λ(x).Math.S(x)=λ′(x) (mod x.sup.2t), λ(0)=1, deg(λ(x)≤t+r}, wherein λ(x) is an error locator polynomial and S(x) is a syndrome; computing a matrix A≡(λ.sub.j(β.sub.i)).sub.i∈[w],j∈[r+1], wherein W={β.sub.1, . . . , β.sub.w} is a set of weak bits in x; constructing a submatrix of r+1 rows from sub matrices of r+1 rows of the subsets of A such that the last column is a linear combination of the other columns; forming a candidate error locating polynomial using coefficients of the minimal monotone basis that result from the constructed submatrix; performing a fast Chien search to verify the candidate error locating polynomial; and flipping channel hard decision at error locations found in the candidate error locating polynomial.

ITERATIVE DECODER FOR CORRECTING DRAM DEVICE FAILURES

Provided is a memory system comprising an error correction code (ECC) decoder configured to receive data from a memory. The ECC decoder includes a syndrome generator configured to calculate at least one of syndrome vector and an erasure value, the calculation being devoid of erasure location information and an error-location polynomial generator configured to determine error location and error/erasure value polynomials responsive to syndrome and erasure calculation values output from the syndrome generator. An error value generator confirms error values at one or more known error locations based upon the determined error/erasure value polynomials, and an error location generator search for an error evaluation value to confirm the known error locations based upon the determined error location polynomials. Outputs of the error value generator and the error location generator are combined to produce corrected data.

Method and system for providing minimal aliasing error correction code

Disclosed is a method and system for providing a minimal aliasing error correction code. In constructing a single error correction (SEC) code by constructing a parity check matrix H for a data length k applied to a device, as the SEC code is designed to be valid and minimize generation of aliasing by checking some bits rather than all bits when nonzero binary column matrices different from each other are arranged in the parity check matrix, destruction of information can be prevented, and reliability of a device applying the SEC, such as DRAM or the like, can be improved.