An impedance sensing circuit includes first and second current sources and first and second bias current sources that are appropriately coupled to first and second resistors. The impedance sensing circuit also includes a comparator that compares a first voltage based on the first terminal of the first resistor to a second voltage based on the first terminal of the second resistor to generate a comparator output signal. Either the comparator output signal or a digital signal based on the comparator output signal operates to regulate the current signals output from the first and second current sources so that the first voltage is same as the second voltage. The comparator output signal and the digital signal is representative of a difference between the first voltage and the second voltage that is based on an impedance difference between the first resistor and the second resistor.

An analog to digital converter (ADC) that is configured to service a photo-diode includes a capacitor and a self-referenced latched comparator. The capacitor produces a photo-diode voltage based on charging by a photo-diode current associated with the photo-diode and a digital to analog converter (DAC) source current and/or a DAC sink current. The self-referenced latched comparator generates a first digital signal that is based on a difference between the photo-diode voltage and a threshold voltage associated with the self-referenced latched comparator. Also, one or more processing modules executes operational instructions to process the first digital signal to generate a second digital signal and/or a third digital signal. An N-bit DAC generates the DAC source current based on the second digital signal, and an M-bit DAC generates the DAC sink current based on the third digital signal. The DAC source current and/or the DAC sink current tracks the photo-diode current.

An analog to digital converter (ADC) that is configured to service a photo-diode includes a capacitor and a self-referenced latched comparator. The capacitor produces a photo-diode voltage based on charging by a photo-diode current associated with the photo-diode and a digital to analog converter (DAC) source current and/or a DAC sink current. The self-referenced latched comparator generates a first digital signal that is based on a difference between the photo-diode voltage and a threshold voltage associated with the self-referenced latched comparator. Also, one or more processing modules executes operational instructions to process the first digital signal to generate a second digital signal and/or a third digital signal. An N-bit DAC generates the DAC source current based on the second digital signal, and an M-bit DAC generates the DAC sink current based on the third digital signal. The DAC source current and/or the DAC sink current tracks the photo-diode current.

A passive sigma-delta modulator including first modulator loop, a second modulator loop, and a digital combiner providing an output signal. The first modulator loop includes a first quantizer, a first passive summing junction, a first continuous-time passive analog loop filter, and a first feedback path. The second modulator loop includes a second quantizer, analog transfer circuitry, a second continuous-time passive summing junction, a second passive analog loop filter, a second feedback path, and digital transfer circuitry having a gain that is substantially a reciprocal of the analog transfer circuitry. A digital noise cancelation filter may be located between the first quantizer and the digital combiner, or an analog noise cancelation filter may be provided within the second modulator loop. Single-ended or differential configurations are contemplated.

A system and method of replicating and cancelling chopping folding error in delta-sigma modulators. The modulator may include a loop filter coupled to a quantizer providing a digital signal, chopper circuitry that chops analog signals of the loop filter at a chopping frequency, and chopping folding error cancellation circuitry that replicates and cancels a chopping folding error of the chopper circuitry to provide a corrected digital signal. A digital chopper or multiplier chops the digital signal to provide a chopped digital signal, and the chopped digital signal is either amplified or multiplied by a gain value or digitally filtered to replicate the chopping folding error, which is then subtracted from the digital signal for correction. The timing and duty cycle of the chopping frequency may be adjusted. Timing and duty cycle adjustment may be calibrated along with the filtering.

An analog to digital converter (ADC) senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. The digital output signal provided to the N-bit DAC is an inverse function of the load current. The ADC is operative to sense very low currents (e.g., currents as low as 1 s of pico-amps) and consume very little power (e.g., less than 2 .Math.W).

An apparatus comprises a sigma-delta analog-to-digital converter (ADC) circuit configured to convert an analog input signal to a digital value. The sigma-delta ADC circuit includes a loop filter circuit including at least one loop filter amplifier, a flash ADC circuit including multiple comparators, and a bias control circuit configured to change a biasing of the at least one loop filter amplifier according to outputs of the multiple comparators of the flash ADC circuit.

An analog to digital converter (ADC) that is configured to service a photo-diode includes a capacitor and a self-referenced latched comparator. The capacitor produces a photo-diode voltage based on charging by a photo-diode current associated with the photo-diode and a digital to analog converter (DAC) source current and/or a DAC sink current. The self-referenced latched comparator generates a first digital signal that is based on a difference between the photo-diode voltage and a threshold voltage associated with the self-referenced latched comparator. Also, one or more processing modules executes operational instructions to process the first digital signal to generate a second digital signal and/or a third digital signal. An N-bit DAC generates the DAC source current based on the second digital signal, and an M-bit DAC generates the DAC sink current based on the third digital signal. The DAC source current and/or the DAC sink current tracks the photo-diode current.

An integrator includes a first switch, a first capacitor, a second switch, a second capacitor, an amplifier, a third switch, a forth switch, a third capacitor, and a control circuit. The control circuit repeats a first phase and a second phase. In the first phase, the control circuit renders the first switch and the third switch to turn on and the second switch and the fourth switch to turn off. In the second phase, the control circuit renders the second switch and the fourth switch to turn on and the first switch and the third switch to turn off.

An analog to digital converter (ADC) senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. The digital output signal provided to the N-bit DAC is an inverse function of the load current. The ADC is operative to sense very low currents (e.g., currents as low as is of pico-amps) and consume very little power (e.g., less than 2 μW).