Systems, devices, and methods related to low-noise, high-accuracy single-ended continuous-time sigma-delta (CTSD) analog-to-digital converter (ADC) are provided. An example single-ended CTSD ADC includes a pair of input nodes to receive a single-ended input signal and input circuitry. The input circuitry includes a pair of switches, each coupled to one of the pair of input nodes; and an amplifier to provide a common mode signal at a pair of first nodes, each before one of the pair of switches. The single-ended CTSD ADC further includes digital-to-analog converter (DAC) circuitry; and integrator circuitry coupled to the input circuitry and the DAC circuitry via a pair of second nodes.

A circuit includes an operational amplifier and a resistor network coupled to an output of the operational amplifier. The resistor network includes a first set of resistors coupled between the output of the operational amplifier and a first node of the resistor network, wherein the resistors of the first set are electrically connected in series with each other, a second set of resistors coupled between the first node and a second node of the resistor network, wherein the resistors of the second set are electrically connected in series with each other and include a first number of resistors, a third set of resistors coupled between the second node and a third node of the resistor network, wherein the third node is coupled to a first voltage, and wherein the resistors of the third set are electrically connected in parallel with each other and include a second number of resistors, and a resistor coupled between the first node and the second node and arranged in parallel with the second set of resistors.

A differential delta-sigma-modulator has an integrator including a pair of single-ended amplifiers. A sample clock is driving a first switchable capacitor configuration and a second switchable capacitor configuration at a predetermined switching cycle. The first switchable capacitor configuration is adapted for sampling respective outputs from the pair of single-ended amplifiers on a pair of output sampling capacitors in the first part of the switching cycle. The second switchable capacitor configuration is adapted for charging a common mode capacitor with the average voltage of the voltage sampled by the pair of output sampling capacitors in the second part of the switching cycle. The voltage across the common mode capacitor represents the common mode voltage for the integrator.

A circuit includes an operational amplifier and a resistor network coupled to an output of the operational amplifier. The resistor network includes a first set of resistors coupled between the output of the operational amplifier and a first node of the resistor network, wherein the resistors of the first set are electrically connected in series with each other, a second set of resistors coupled between the first node and a second node of the resistor network, wherein the resistors of the second set are electrically connected in series with each other and include a first number of resistors, a third set of resistors coupled between the second node and a third node of the resistor network, wherein the third node is coupled to a first voltage, and wherein the resistors of the third set are electrically connected in parallel with each other and include a second number of resistors, and a resistor coupled between the first node and the second node and arranged in parallel with the second set of resistors.

A converter circuit includes an analog-to-digital signal conversion path. An input port receives an analog input signal having an offset, and an output port delivers a digital output signal quantized over M levels. The digital output signal is sensed by a digital-to-analog feedback path, which includes a digital-to-analog converter applying to the input port an analog feedback signal produced as a function of an M-bit digital word under control of a two-state signal having alternating first and second states. M-bit digital word generation circuitry coupled to the digital-to-analog converter and sensitive to the two-state signal produces, alternately, during the first states, a first M-bit digital word, which is a function of the digital output signal quantized over M levels, and, during the second states, a second M-bit digital word, which is a function a correction value of the offset in the analog input signal.

Apparatuses and methods for analog-digital conversion and corresponding systems having a sensor and an apparatus of this type are provided. Demodulation is executed with no variable preamplification, followed by continuous-time analog-digital conversion, at least in time segments, which further employs chopper techniques.

Disclosed is an input impedance boosting apparatus. More particularly, an input impedance boosting apparatus including an analog-to-digital converter; an input capacitor connected to an input terminal of the analog-to-digital converter and a ground line and including a first shielding metal formed thereunder; a feedback capacitor connected onto a positive feedback loop of the analog-to-digital converter and including a second shielding metal formed thereunder; and an impedance booster connected to both ends of the feedback capacitor and configured to boost an input impedance based on a first parasitic component formed between the input capacitor and the first shielding metal and a second parasitic component formed between the feedback capacitor and the second shielding metal is provided.

Apparatuses and methods for analog-digital conversion and corresponding systems having a sensor and an apparatus of this type are provided. Demodulation is executed with no variable preamplification, followed by continuous-time analog-digital conversion, at least in time segments, which further employs chopper techniques.

In one embodiment, an analog-to-digital converter includes: a sum circuit to receive an analog input signal and a feedback reference signal and generate a sum signal; a feedback circuit coupled to the sum circuit to provide the feedback reference signal to the sum circuit; a filter coupled to the sum circuit to receive the sum signal and generate a filtered signal; and a punctured quantizer coupled to the filter to receive the filtered signal and quantize the filtered signal to a digital output and to output the digital output and to provide the digital output to the feedback circuit.

A signal processing system may include a sensor readout channel configured to convert an electronic signal into a digital quantity, the sensor readout channel comprising an analog-to-digital converter (ADC) having an input and an output, first outside chopping switches located at the input of the ADC, and second outside chopping switches located at the output of the ADC. The ADC may comprise a memory element, first inside chopping switches located at the input of the memory element, and second inside chopping switches located at the output of the memory element. The first outside chopping switches, the second outside chopping switches, the first inside chopping switches, and the second inside chopping switches may be switched at the same frequency such that the memory element is swapped periodically in synchronization with the first outside chopping switches and second outside chopping switches.