Techniques for facilitating non-uniformity correction calibrations are provided. In one example, an infrared imaging system includes an infrared imager and a logic device. The infrared imager is configured to capture a first set of infrared images of a reference object using a first integration time. The infrared imager is further configured to capture a second set of infrared images of the reference object using a second integration time different from the first integration time. The logic device is configured to determine a dark current correction map based on the second set of infrared images. The logic device is further configured to generate a non-uniformity correction map based on the dark current correction map. Related devices and methods are also provided.

A method for calibrating a photodetector array supplying a video stream includes: a determination step, wherein an offset table is determined for each current image of the video stream based on at least two corrections from among the following: a first correction from a comparison of the current image to a corresponding predetermined reference table; a second correction from a calculation of a column error of the current image; and a third correction from a high-pass temporal filtering of the video stream; and a calculation step, wherein a current value of an offset table, equal to a sum between a previous value of the offset table and a weighted sum of at least two corrections, is calculated, with each coefficient of the offset table being associated with a respective photodetector of the array.

A system for providing high resolution image output for pilotage and two color operation for threat detection is disclosed. The system comprises a focal plane array comprising a plurality of pixels arranged into groups of equal numbers, wherein each pixel comprises at least two detectors for receiving electromagnetic energy and a readout integrated circuit.

An image processing apparatus is configured to: acquire a correction factor from a recording unit for recording, for each of a plurality of pixels, the correction factor for correcting a difference in pixel value corresponding to a difference between a spectral sensitivity and a preset reference spectral sensitivity in a predetermined wavelength range at a pixel of interest, based on image data generated by an image sensor, the image sensor having the plurality of pixels on which color filters of a plurality of colors with different spectral transmittances are respectively located, the color filters forming a predetermined array pattern; calculate a correction amount for correcting a pixel value of the pixel of interest based on the correction factor at the pixel of interest and pixel values of pixels surrounding the pixel of interest; and correct the pixel value of the pixel of interest by using the correction amount.

A radiation detector includes control and data lines extending respectively in mutually-orthogonal first and second directions, photoelectric conversion parts respectively in regions defined by the control and data lines, noise detecting parts outside a region including the photoelectric conversion parts, a control circuit inputting control signals to first and second thin film transistors located respectively in the photoelectric conversion and noise detecting parts, a signal detection circuit reading image data and noise signals respectively from the photoelectric conversion and noise detecting parts, and an image configuration circuit configuring a radiation image based on the signals that are read. The signals from the photoelectric conversion parts adjacent to the noise detecting parts are not read and/or are not used by the image configuration circuit when configuring the radiation image, and/or the photoelectric conversion parts adjacent to the noise detecting parts are not electrically connected with the control and/or signal detection circuits.

A radiation detector includes control and data lines extending respectively in mutually-orthogonal first and second directions, photoelectric conversion parts respectively in regions defined by the control and data lines, noise detecting parts outside a region including the photoelectric conversion parts, a control circuit inputting control signals to first and second thin film transistors located respectively in the photoelectric conversion and noise detecting parts, a signal detection circuit reading image data and noise signals respectively from the photoelectric conversion and noise detecting parts, and an image configuration circuit configuring a radiation image based on the signals that are read. The signals from the photoelectric conversion parts adjacent to the noise detecting parts are not read and/or are not used by the image configuration circuit when configuring the radiation image, and/or the photoelectric conversion parts adjacent to the noise detecting parts are not electrically connected with the control and/or signal detection circuits.

An imaging pixel formed by a photodetector connected to a reading circuit comprising: an integration capacitance, a transistor for resetting the integration capacitance, a coupling transistor between the photodetector and the integration capacitance, a memorisation capacitance, a second transistor for resetting the memorisation capacitance, a memorisation switch between the integration capacitance and the memorisation capacitance, to enable different configurations corresponding to different phases of assessing parameters of the pixel and in particular a ratio R=Cint/Cmem.

In a solid-state imaging element equipped with per-column ADCs, noise is reduced. A test signal source generates a test signal of a predetermined level. An analog-to-digital converter increases/decreases an analog signal according to an analog gain selected from among a plurality of analog gains, and converts the increased/decreased analog signal to a digital signal. An input switching section inputs, as the analog signal, either a test signal or a pixel signal to the analog-to-digital converter. A correction value calculation section obtains, on the basis of the test signal and the digital signal, a correction value for correcting an error in the selected analog gain, and outputs the correction value. A correction section corrects the digital signal according to the outputted correction value.

In a solid-state imaging element equipped with per-column ADCs, noise is reduced. A test signal source generates a test signal of a predetermined level. An analog-to-digital converter increases/decreases an analog signal according to an analog gain selected from among a plurality of analog gains, and converts the increased/decreased analog signal to a digital signal. An input switching section inputs, as the analog signal, either a test signal or a pixel signal to the analog-to-digital converter. A correction value calculation section obtains, on the basis of the test signal and the digital signal, a correction value for correcting an error in the selected analog gain, and outputs the correction value. A correction section corrects the digital signal according to the outputted correction value.

Technologies are described herein that are configured to generate a corrected image by addressing photo response nonuniformity (PRNU) in a camera having a global shutter. A calibration procedure is described, where correction factors for each pixel in an image sensor are computed and subsequently employed to generate improved images.