A signal processing apparatus that processes image data output from a photoelectric conversion unit including a light-receiving region and a light-blocking region. The apparatus includes a control data generation unit that outputs control data used to generate correction data for correcting the image data using a trained model generated through machine learning, and a signal processing unit that generates the correction data on the basis of light-blocked image data and the control data, the light-blocked image data being image data, among the image data, that is from the light-blocking region, and corrects light-received image data in accordance with the correction data without applying the trained model, the light-received image data being image data, among the image data, that is from the light-receiving region.

A signal processing apparatus that processes image data output from a photoelectric conversion unit including a light-receiving region and a light-blocking region. The apparatus includes a control data generation unit that outputs control data used to generate correction data for correcting the image data using a trained model generated through machine learning, and a signal processing unit that generates the correction data on the basis of light-blocked image data and the control data, the light-blocked image data being image data, among the image data, that is from the light-blocking region, and corrects light-received image data in accordance with the correction data without applying the trained model, the light-received image data being image data, among the image data, that is from the light-receiving region.

An abnormal-pixel detecting device includes an image sensor and an image processor. The image sensor is configured to capture an image of a subject. The image processor is configured to calculate: a ratio between a first plurality of pixel values captured by the image sensor and a second plurality of pixel values whose reference position is shifted relative to the first plurality of pixel values in a main scanning direction to obtain a third plurality of pixel values; and detect an abnormal pixel in the third plurality of pixel values.

Provided are a light-emitting apparatus that can suppress manufacturing cost to a low level and perform light emission with high uniformity using a simple configuration, a calibration coefficient calculation method using the light-emitting apparatus, and a method for calibrating a captured image of an inspection target object. A plurality of light-emitting diodes arranged at equal intervals on the circumference of a virtual circle, and a milky white-colored emission window, which is provided on a top surface portion separated from the light-emitting diodes, has an outer edge that is smaller than the circumference on which the light-emitting diodes are arranged, and allows light of the light-emitting diodes to pass therethrough, are included. The diameter of the virtual circle on which the light-emitting diodes are arranged and a separation distance between the light-emitting diodes and the emission window are set to predetermined distances.

Technologies are described herein that are configured to generate a corrected image by addressing photo response nonuniformity (PRNU) in a camera having a global shutter. A calibration procedure is described, where correction factors for each pixel in an image sensor are computed and subsequently employed to generate improved images.

Bias circuit elements for applying voltages/currents to a photodetector are described. Bias circuit elements described are active devices, e.g. mosfets, directly connected to the photodetector signal point, which inject noise that will be amplified/integrated. Lowering 1/f noise in these bias devices uses multiple parallel mosfets and switching the parallel mosfets gates between a bias activation level signal and a voltage sufficient to drive the mosfet into accumulation Gate switching may be accomplished by at least two partially out of phase clocking signals, with at least one parallel mosfet applying bias while another is in accumulation in continuously switched time periods. Gate switching at a frequency higher than the imaging bandwidth, will have negligible effect on the image signal. During the accumulation phase traps present within the conducting channel of each MOSFET will be depopulated, essentially resetting the MOSFET's 1/f noise, allowing for long integration times while controlling 1/f noise.

A non-uniformity correction (NUC) calibration method comprises obtaining image data for a plurality of images with an image sensor, wherein each image in the plurality of images is obtained at a different respective global pixel gain setting and global expose in the image sensor; and using the image data for non-uniformity correction calibration to compute pixel NUC values for the pixels in the image sensor. The method can further include storing the pixel NUC values and obtaining further image data corrected by the stored pixel NUC values. In embodiments, the method can include moving a platform based on the further image data. In certain embodiments, the platform can be a guided munition.

To improve the image quality of image data in a solid-state imaging device that reads a signal according to a potential difference between respective floating diffusion regions of a pair of pixels. A pixel unit is provided with a plurality of rows each including a plurality of pixels. A readout row selection unit selects any of the plurality of rows as a readout row every time a predetermined period elapses, and causes each of the plurality of pixels in the readout row to generate a signal potential according to a received light amount. A reference row selection unit selects a row different from a previous row from among the plurality of rows as a current reference row every time the predetermined period elapses, and causes each of the plurality of pixels in the reference row to generate a predetermined reference potential. A readout circuit unit reads a voltage signal according to a difference between the signal potential and the reference potential.

A system for dark current compensation in SPAD imagery is configurable to capture an image frame with the SPAD array and generate a temporally filtered image by performing a temporal filtering operation using the image frame and at least one preceding image frame. The at least one preceding image frame is captured by the SPAD array at a timepoint that temporally precedes a timepoint associated with the image frame. The system is also configurable to obtain a dark current image frame. The dark current image frame includes data indicating one or more SPAD pixels of the plurality of SPAD pixels that detect an avalanche event without detecting a corresponding photon. The system is also configurable to generate a dark current compensated image by performing a subtraction operation on the temporally filtered image or the image frame based on the dark current image frame.

A system for dark current compensation in SPAD imagery is configurable to capture an image frame with the SPAD array and generate a temporally filtered image by performing a temporal filtering operation using the image frame and at least one preceding image frame. The at least one preceding image frame is captured by the SPAD array at a timepoint that temporally precedes a timepoint associated with the image frame. The system is also configurable to obtain a dark current image frame. The dark current image frame includes data indicating one or more SPAD pixels of the plurality of SPAD pixels that detect an avalanche event without detecting a corresponding photon. The system is also configurable to generate a dark current compensated image by performing a subtraction operation on the temporally filtered image or the image frame based on the dark current image frame.