Patent classifications
H05G1/52
SYSTEM FOR AT LEAST ONE OF CALIBRATION OR QUALITY CONTROL OF AN FFS X-RAY SYSTEM
One or more example embodiments relates to a system for calibration and/or for quality control of an FFS X-ray system, a corresponding FFS X-ray system, a control facility suitable for it and to a method for calibration and/or for quality control of the FFS X-ray system.
X-RAY TUBE FOR A STEREOSCOPIC IMAGING
Some example embodiments provide an x-ray tube for a stereoscopic imaging having an evacuated x-ray tube housing; an electron emitter apparatus in the x-ray tube housing, the electron emitter apparatus including a first field effect emitter with a first emitter surface and a second field effect emitter with a second emitter surface, at least one of the first emitter surface or the second emitter surface being segmented such that a portion of the at least one of the first emitter surface or the second emitter surface can be set relative to the respective overall emitter surface by selectively switching emitter segments of the at least one of the first emitter surface or the second emitter surface; an anode unit in the x-ray tube housing, the anode unit configured to generate x-ray radiation for the stereoscopic imaging as a function of electrons striking two focal points; and a control unit.
AUTOMATIC REGULATION OF A POSITION OF AN X-RAY FOCUS OF AN X-RAY IMAGING SYSTEM
In a method for regulating a position of an X-ray focus on the anode of an X-ray source of a scan unit of an X-ray imaging system, a combined actual position of the X-ray focus is determined by a combination of a measured position of the X-ray focus and a model-based position of the X-ray focus, which is determined based on a measured value of a deflection current. On the basis of the combined actual position and a target position, a manipulated variable is determined. On the basis of the determined manipulated variable, a regulation is performed to correct a deviation of the position of the X-ray focus from the target position.
Fiber-optic communication for embedded electronics in x-ray generator
An x-ray source includes an optical communications link to provide a galvanically isolated communication between a system controller and a gun controller. In specific examples, the link is provided through one or more fibers. In addition, the gun controller is preferably remote programmed by the system controller during startup. This addresses the problem of reprogramming a processor in a hard to access location/environment. A watchdog timer is also useful for the gun digital processor of the gun controller.
Systems and methods for correction of position of focal point
Systems and methods for determining an offset of a position of a focal point of an X-ray tube is provided. The methods may include obtaining at least one parameter associated with an X-ray tube during a scan of a subject. The methods may further include determining a target offset of a position of a focal point based on the at least one parameter and a target relationship between a plurality of reference parameters associated with the X-ray tube and a plurality of reference offsets of reference positions of the focal point. The methods may further include causing, based on the target offset, a correction on the position of the focal point of the X-ray tube.
System and method for tracking x-ray tube focal spot position
Methods and devices for tracking an x-ray tube focal spot position are described. As successive images are captured by an image capturing system that includes the x-ray tube, the focal spot may change position. To track the change, one or more artificial targets may be arranged relative to the image capturing system such that an initial image is received that includes the artificial targets at a first position in the initial image. A gain map may be generated based on the initial image, and applied to a subsequent image received that also includes the artificial targets to generate a normalized subsequent image. A shift of the artificial targets from the first position in the initial image to a second position in the normalized subsequent image may be identified, where the shift corresponds to the focal spot's position change. Mathematical and/or physical adjustments may be made to correct for the change.
System and method for tracking x-ray tube focal spot position
Methods and devices for tracking an x-ray tube focal spot position are described. As successive images are captured by an image capturing system that includes the x-ray tube, the focal spot may change position. To track the change, one or more artificial targets may be arranged relative to the image capturing system such that an initial image is received that includes the artificial targets at a first position in the initial image. A gain map may be generated based on the initial image, and applied to a subsequent image received that also includes the artificial targets to generate a normalized subsequent image. A shift of the artificial targets from the first position in the initial image to a second position in the normalized subsequent image may be identified, where the shift corresponds to the focal spot's position change. Mathematical and/or physical adjustments may be made to correct for the change.
Method and device for producing and using multiple origins of x-radiation
An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam. Such isolated images of an object's feature, each having different fringe locations, allows for post-acquisition “fringe-mapping” analysis of the feature's full interaction with x-rays, including refraction, scattering, and absorption.
Beam alignment systems and method
The present disclosure relates to a downhole tool that includes a first photon flux detector disposed at a first radial position about a longitudinal axis of the downhole tool that measures a first signal indicative of an x-ray flux of the x-ray photons. The downhole tool also includes a second photon flux detector disposed at a second radial position about the longitudinal axis of the downhole tool that measures a second signal indicative of the x-ray flux of the x-ray photons. Further, the downhole tool includes a controller communicatively coupled to the first photon flux detector and the second photon flux detector that determines a condition associated with the electron beam based at least in part on a relative x-ray flux from the first photon flux detector and the second photon flux detector.
Beam alignment systems and method
The present disclosure relates to a downhole tool that includes a first photon flux detector disposed at a first radial position about a longitudinal axis of the downhole tool that measures a first signal indicative of an x-ray flux of the x-ray photons. The downhole tool also includes a second photon flux detector disposed at a second radial position about the longitudinal axis of the downhole tool that measures a second signal indicative of the x-ray flux of the x-ray photons. Further, the downhole tool includes a controller communicatively coupled to the first photon flux detector and the second photon flux detector that determines a condition associated with the electron beam based at least in part on a relative x-ray flux from the first photon flux detector and the second photon flux detector.