A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also a corresponding liquid metal jet X-ray source.

A device and method for creating beam formed X-Ray radiation using radio frequency (RF) modulated field emission X-ray sources is described. A radio frequency RF source generates a RF control signal which is supplied to an array of phase delay elements to generate multiple individually controlled phase delayed RF signals. These are then directly provided to each of a plurality of field emission sources (via a matching circuit) to generate a plurality of RF modulated electron current, or beam, each at the same frequency and phase delay of the phase delayed RF signals. Each of the electron beams impacts a target anode to generate X-rays also at the same frequency and phase delay of the phase delayed RF signals. By controlling each of the phase delay elements a beamformed X-ray radiation pattern can be generated.

Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.

Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.

A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also a corresponding liquid metal jet X-ray source.

Various methods and systems are provided for an x-ray imaging system. In one example, a method for decelerating a rotor of an x-ray tube of an imaging system includes controlling and/or monitoring a speed and position of the rotor, passing the rotor through a first position where a force exerted on the rotor, is less than Earth's gravitational pull, the force due to a combination of gravity and radial acceleration, and initiating a predefined deceleration profile to decelerate the rotor to a halt when the x-ray tube passes through the first position.

An X-ray source for emitting an X-ray beam is proposed. The X-ray source comprises an anode and an emitter arrangement comprising a cathode for emitting an electron beam towards the anode and an electron optics for focusing the electron beam at a focal spot on the anode. The X-ray source further comprises a controller configured to determine a switching action of the emitter arrangement and to actuate the emitter arrangement to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot on the anode, a size of the focal spot, and a shape of the focal spot. The controller is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot expected after the switching action. Further, the controller is configured to actuate the electron optics to compensate for a change of the size and the shape of the focal spot induced by the switching action.

An X-ray source for emitting an X-ray beam is proposed. The X-ray source comprises an anode and an emitter arrangement comprising a cathode for emitting an electron beam towards the anode and an electron optics for focusing the electron beam at a focal spot on the anode. The X-ray source further comprises a controller configured to determine a switching action of the emitter arrangement and to actuate the emitter arrangement to perform the switching action, the switching action being associated with a change of at least one of a position of the focal spot on the anode, a size of the focal spot, and a shape of the focal spot. The controller is further configured to predict before the switching action is performed, based on the determined switching action, the size and the shape of the focal spot expected after the switching action. Further, the controller is configured to actuate the electron optics to compensate for a change of the size and the shape of the focal spot induced by the switching action.

One or more example embodiments relates to a method for calibrating an X-ray emitter having a cathode, an anode and a coil, wherein the coil is connected to a conductor arrangement through which an electrical function current is guided through the coil. The method comprises measuring an induction current that is induced in the coil at the conductor arrangement of the coil; calculating a compensation current for an effecting coil of the X-ray emitter based on the measured induction current, the effecting coil configured to change an electron beam between the cathode and the anode, wherein the compensation current is calculated such that a magnetic field that induces the induction current during the measuring is compensated using a magnetic field that is produced by the compensation current in the effecting coil; and applying the compensation current in the effecting coil.

One or more example embodiments relates to a method for calibrating an X-ray emitter having a cathode, an anode and a coil, wherein the coil is connected to a conductor arrangement through which an electrical function current is guided through the coil. The method comprises measuring an induction current that is induced in the coil at the conductor arrangement of the coil; calculating a compensation current for an effecting coil of the X-ray emitter based on the measured induction current, the effecting coil configured to change an electron beam between the cathode and the anode, wherein the compensation current is calculated such that a magnetic field that induces the induction current during the measuring is compensated using a magnetic field that is produced by the compensation current in the effecting coil; and applying the compensation current in the effecting coil.