Methods, systems, and devices for refresh counters in a memory system are described. In some examples, a memory device may include two or more counters configured to increment a respective count based on refresh operations performed on a memory array. A comparison may be made between two or more of the respective counts, which may include determining a difference between the respective counts or a difference in rate of incrementing. A memory device may transmit an indication to a host device based on determining a difference between counters, and the memory device, the host device, or both, may perform various operations or enter various operational modes based on the determined difference.

A method described herein involves identifying a first time associated with a read operation that retrieves data of a write unit at a memory sub-system, identifying a second time associated with a write operation that stored the data of the write unit at the memory sub-system, and performing a refresh operation for the data of the write unit at the memory sub-system based on a difference between the first time associated with the read operation and the second time associated with the write operation.

Techniques manage a redundant array of independent disks. In such a technique, a response time of a first storage device in the RAID is compared to a first threshold. In response to the response time of the first storage device exceeding the first threshold, the first storage device is configured as a pseudo-degraded storage device, such that the pseudo-degraded storage device is responsive to write requests only.

A control method for a solid state drive is provided. The solid state drive includes a non-volatile memory with plural blocks. In a step (a1), a block is opened. In a step (a2), a program action is performed to store a valid write data into the open block. Then, a step (a3) is performed to judge whether an amount of the valid write data in the open block reaches a predetermined capacity. In a step (a4), if the amount of the valid write data in the open block does not reach the predetermined capacity, the step (a2) is performed again. In a step (a5), if the amount of the valid write data in the open block reaches the predetermined capacity, the open block is closed and the step (a1) is performed again. The predetermined capacity is lower than a capacity of one block.

The present disclosure relates to method for checking the reading phase of a non-volatile memory device including at least an array of memory cells and with associated decoding and sensing circuitry and a memory controller, the method comprises: storing in a dummy row associated to said memory block at least internal block variables and a known pattern; performing a reading of said dummy row; comparing a result of the reading with the known pattern; trimming the parameters of the reading and/or swapping the used memory block based on the result of the comparing.

A method includes receiving a command to write data to a memory device and writing the data to a first memory tier of the memory device. The first memory tier of the memory device is a dynamic memory tier that utilizes single level cells (SLCs), multi-level cells (MLCs), and triple level cells (TLCs). The method further includes migrating the data from the first memory tier of the memory device to a second memory tier of the memory device. The second memory tier of the memory device is a static memory tier that utilizes quad level cells (QLCs).

Embodiments of the present disclosure provide a system for testing multicore firmware (FW) in a memory system and a method thereof. A test system includes a test device and a storage device including a plurality of flash translation layer (FTL) cores, each FTL core associated with multiple memory blocks. The test device generates test preconditions for the plurality of FTL cores and provides the test preconditions to the plurality of FTL cores, the test preconditions being different from each other. Each of the plurality of FTL cores performs one or more test operations based on a corresponding test precondition of the test preconditions.

A solid state drive (SSD) includes a first storage region classified as byte addressable NV storage region and a controller communicatively coupled to the first storage region by a bus. The controller detects a reduced storage capacity of the first storage region, and in response to the detection, reclassifies the first storage region as a block addressable NV storage region. The SSD dynamically changes byte addressable NV storage regions to block addressable NV storage regions as the byte addressable NV storage regions are degraded, thereby extending the longevity of the SSD.

A processor of a memory sub-system can select a data retention profile from among a plurality of data retention profiles corresponding to the memory device. The processor can also adjust a wear life indicator based on the selected data retention profile.

A plurality of zone reset counters and a global reset counter are maintained. A zone reset counter represents a number of times a respective zone of a memory device has been reset. The global reset counter represents a measure of central tendency of the plurality of zone reset counters. A write command directed to a target zone of the memory device is received, and responsive to determining that a target portion of the target zone is not open, a value of the zone reset counter of het target zone is compared to the value of the global reset counter. If the value of the target zone reset counter equals or exceeds the value of the global reset counter, a portion from a free block list is allocated to the target zone. The allocated portion has a highest program erase count among the one or more portions in free block list.