The present disclosure provides a display substrate and a manufacturing method thereof, and a display device. In the display substrate of the present disclosure, a first transistor comprises a first gate electrode, a first electrode, a second electrode, and a first active layer; and a second transistor comprises a second gate electrode, a third electrode, a fourth electrode, and a second active layers, wherein the first active layer comprises a silicon material, the second active layer comprises an oxide semiconductor material, and wherein the third electrode and the first gate electrode are disposed in the same layer, and the fourth electrode and the first electrode, the second electrodes are disposed in the same layer.

One of the objects is to improve display quality by reduction in malfunctions of a circuit. In a driver circuit formed using a plurality of pulse output circuits having first to third transistors and first to fourth signal lines, a first clock signal is supplied to the first signal line; a preceding stage signal is supplied to the second signal line; a second clock signal is supplied to the third signal line; an output signal is output from the fourth signal line. Duty ratios of the first clock signal and the second clock signal are different from each other. A period during which the second clock signal is changed from an L-level signal to an H-level signal after the first clock signal is changed from an H-level signal to an L-level signal is longer than a period during which the preceding stage signal is changed from an L-level signal to an H-level signal.

The present disclosure provides in some embodiments an array substrate, a method for manufacturing the same, and a display device. The array substrate includes a base substrate, an insulating layer, a via hole and a first blockage pattern; wherein the insulating layer is arranged on the base substrate, the via hole runs through the insulating layer; and an orthographic projection of the first blockage pattern on the base substrate partially or entirely covers an orthographic projection of the via hole on the base substrate.

A peeling method at low cost with high mass productivity is provided. A silicon layer having a function of releasing hydrogen by irradiation with light is formed over a formation substrate, a first layer is formed using a photosensitive material over the silicon layer, an opening is formed in a portion of the first layer that overlaps with the silicon layer by a photolithography method and the first layer is heated to form a resin layer having an opening, a transistor including an oxide semiconductor in a channel formation region is formed over the resin layer, a conductive layer is formed to overlap with the opening of the resin layer and the silicon layer, the silicon layer is irradiated with light using a laser, and the transistor and the formation substrate are separated from each other.

A thin film transistor (TFT) substrate, a manufacturing method thereof, a display panel are disclosed. The TFT substrate includes: a substrate; an active layer disposed above the substrate and including a channel region, a source region, and a drain region, wherein the channel region is made of an oxide semiconductor, the source region and the drain region are made of a conductive oxide semiconductor; a gate insulating layer and a gate sequentially disposed on the channel region; a titanium oxide layer covering the source region and the drain region; and a source and a drain disposed above the titanium oxide layer.

The disclosure provides a thin film transistor, a manufacturing method thereof, a display substrate and a display apparatus. The thin film transistor comprises a base substrate, and an active layer disposed on the base substrate, and the active layer comprises a channel region, and a source contact region and a drain contact region respectively positioned at two sides of the channel region; and a portion of at least one of the source contact region and the drain contact region close to the channel region includes a plurality of first sub-grooves disposed at a side of the active layer proximal to the base substrate and a plurality of second sub-grooves disposed at a side of the active layer distal to the base substrate, and the plurality of first sub-grooves and the plurality of second sub-grooves being alternately disposed along a direction parallel to an extension of the channel region.

A display apparatus includes a thin film transistor facing a substrate with a buffer layer therebetween and including a semiconductor layer, a channel region, a source region, a drain region, and a gate electrode; a conductive pattern between the substrate and the semiconductor layer and connected to the semiconductor layer, the conductive pattern facing the semiconductor layer with the buffer layer therebetween; a contact hole in the buffer layer and exposing the conductive pattern to outside the buffer layer; and a display element which is electrically connected to the thin film transistor. The source region or the drain region extends through the contact hole in the buffer layer, to contact the conductive pattern and connect the semiconductor layer to the conductive pattern.

A thin film transistor panel according to an exemplary embodiment includes: a substrate; a first transistor disposed on the substrate and including a first semiconductor layer including a low temperature polysilicon and a first control electrode overlapping the first semiconductor layer; a second transistor disposed on the substrate and including a second semiconductor layer including an oxide semiconductor and a second control electrode overlapping the second semiconductor layer; a first gate insulation layer disposed between the first semiconductor layer and the first control electrode of the first transistor and including a first insulation layer and a second insulation layer; and a second gate insulation layer disposed between the second semiconductor layer and the second control electrode of the second transistor and including the second insulation layer, wherein the density of the first insulation layer may be higher than the density of the second insulation layer, the first semiconductor layer of the first transistor may be in contact with the first insulation layer, and the second semiconductor layer of the second transistor may be in contact with the second insulation layer.

In the present disclosure, a photodiode structure is used as a photosensor in an array substrate. The semiconductor structure in the photosensor includes a N-type heavily doped amorphous silicon layer, an amorphous silicon layer, and a P-type heavily doped amorphous silicon layer, thereby realizing the integration of photosensors into large-sized devices, the enhancement of device sensitivity, and the reduction of costs.

An active matrix substrate includes a thin film transistor that includes a gate electrode, a first inorganic insulating film that covers the gate electrode, a second inorganic insulating film that is disposed on the first inorganic insulating film and that has an opening overlapping the gate electrode, a source electrode and a drain electrode disposed on the second inorganic insulating film, and a semiconductor layer that overlaps the gate electrode in an opening of the first inorganic insulating film and that covers the source electrode and the drain electrode. Regarding a surface of the first inorganic insulating film in a first region overlapping the opening of the first inorganic insulating film and a surface in a second region other than the first region, the surfaces being arranged nearer to the second inorganic insulating film, the surface in the first region is lower than the surface in the second region.