An electronic component and a method of manufacturing an electronic component, the method including surface mounting electronic components to a printed circuit board (PCB), applying a flip-chip die integrated circuit (IC) to the PCB and underfilling the flip-chip IC to secure the PCB. The method also includes sintering a copper block to the PCB, where the copper block is in thermal communication with the IC and acts as a thermal path for removing heat generated by the flip-chip IC.

A semiconductor device includes a heat sink, an integrated component in which a ceramic terminal having a microstrip line and a matching circuit are integrated into one unit, a lead fixed to the ceramic terminal, a matching substrate fixed to the heat sink, a semiconductor chip fixed to the heat sink, a plurality of wires configured to connect the matching circuit and the matching substrate and to connect electrically the matching substrate and the semiconductor chip, a frame configured to surround the matching substrate and the semiconductor chip in a plan view, and a cap provided on the frame.

Provided is a semiconductor module including: a reverse conducting first switching element which is provided on one of an upper arm and a lower arm; a reverse conducting second switching element which is provided on another of the upper arm and the lower arm; a first path member which is electrically connected to one of a gate electrode and an emitter electrode of the first switching element; and a second path member which is electrically connected to another of the gate electrode and the emitter electrode of the first switching element. The first path member is provided to be closer to the second switching element than the second path member, and current flowing through the first path member flows in antiparallel with a reverse recovery current of an arm provided with the second switching element.

A semiconductor device includes an insulating substrate having a main surface, a semiconductor element, a case member, and a sealing resin as a sealing material. The case member includes a recess that is continuous with a connection portion of the case member connected to the insulating substrate, and that faces the internal region. The recess includes a facing surface as an inner wall portion facing the main surface of the insulating substrate. A distance from the main surface of the insulating substrate to the facing surface as the inner wall portion is greater than a distance from the main surface to an upper surface of the semiconductor element.

An electronic component and a method of manufacturing an electronic component, the method including surface mounting electronic components to a printed circuit board (PCB), applying a flip-chip die integrated circuit (IC) to the PCB and underfilling the flip-chip IC to secure the PCB. The method also includes sintering a copper block to the PCB, where the copper block is in thermal communication with the IC and acts as a thermal path for removing heat generated by the flip-chip IC.

A power electronics module includes a substrate with a substrate metallization layer, which is separated into conducting areas for providing conducting paths for the power electronics module; a semiconductor switch chip bonded with a first power electrode to a first conducting area of the substrate metallization layer; a conductor plate bonded to a second power electrode of the semiconductor switch chip opposite to the first power electrode.

A power semiconductor module includes an insulating substrate, a first conductive circuit pattern, a second conductive circuit pattern, a first semiconductor device, a second semiconductor device, a sealing member, and a first barrier layer. The sealing member seals the first semiconductor device, the second semiconductor device, the first conductive circuit pattern, and the second conductive circuit pattern. At least one of the first barrier layer and the sealing member includes a first stress relaxation portion. This configuration improves the reliability of the power semiconductor module.

A camera device includes a lens assembly, a driver, and a photosensitive assembly. The driver drives the lens assembly. The photosensitive assembly is mounted to the lens assembly. The photosensitive assembly includes a filter, a photosensitive chip, a first circuit board, and a second circuit board. The first circuit board defines a first through hole. The photosensitive chip is received in the first through hole. The filter is fixed to a side of the first circuit board and covers the first through hole. The second circuit board is fixed to a side of the first circuit board facing away from the filter and is electrically coupled to the first circuit board. The photosensitive chip is electrically coupled to the second circuit board.

A camera device includes a lens assembly, a driver, and a photosensitive assembly. The driver drives the lens assembly. The photosensitive assembly is mounted to the lens assembly. The photosensitive assembly includes a filter, a photosensitive chip, a first circuit board, and a second circuit board. The first circuit board defines a first through hole. The photosensitive chip is received in the first through hole. The filter is fixed to a side of the first circuit board and covers the first through hole. The second circuit board is fixed to a side of the first circuit board facing away from the filter and is electrically coupled to the first circuit board. The photosensitive chip is electrically coupled to the second circuit board.

In an embodiment of the present invention, a load sensor package includes a housing having a cap, a column, a peripheral structure, and a base. The base includes a major surface configured to mount a stress sensor, while the cap includes a cap major surface configured to receive a load to be measured. The column is configured to transfer a predetermined fraction of the load to be measured to the base through the stress sensor. The peripheral structure is configured to transfer the remaining fraction of the load to be measured to the base.