An arrangement of a 3D measurement device according to the invention comprises an image source in order to produce consecutive images on a surface of an object, a camera to take pictures of the surface, and a processor unit in order to compare the pictures of the camera with said images. The arrangement comprises also a first area and a second area on the images. The arrangement further comprises at least one double detector in order to detect the illuminated first area and the illuminated second area, and a drive unit in order to trigger at least one camera. The drive unit is arranged to trigger the camera if the double detector indicates that a state of the first area changes and a state of the second area changes.

The present disclosure relates to structured illumination. The teachings thereof may be embodied in devices for reconstruction of a three-dimensional surface of an object by means of a structured illumination for projection of measurement patterns onto the object. For example, a device may include: a projector unit for diffractive projection of a measurement pattern comprising a plurality of measurement points onto the surface; an acquisition unit for acquiring the measurement pattern from the surface; and a computer unit for reconstruction of the surface from a respective distortion of the measurement pattern. All possible positions of measurement elements are contained in the measurement pattern in repeating groups, in which a respective combination of measurement points represents a respective location in the measurement pattern.

An optoelectronic apparatus includes a heat sink, which is shaped to define a base, a first platform at a first elevation above the base, and a second platform alongside the first platform at a second elevation above the base, which is different from the first elevation. A first monolithic emitter array is mounted on the first platform and is configured to emit first optical beams. A second monolithic emitter array is mounted on the second platform and is configured to emit second optical beams. An optical element is configured to direct both the first and the second optical beams toward a target region.

A computer that includes a processor and a memory, the memory including instructions executable by the processor can activate a plurality of light sources in an alternating pattern at an illumination frequency and acquire image data depicting light reflected from an object at a timing corresponding to the alternating pattern at the illumination frequency. In response to variations in the light impinging upon the object from the alternating pattern, an object contour can be determined based on estimating one or more object surface normals based on photometric stereo. One or more of object identity and object depth can be determined based on combining the object contour with the image data.

A three-dimensional measuring device is a three-dimensional measuring device that performs three-dimensional measurement of an object using a laser beam. The three-dimensional measuring device includes a laser emitter disposed in a movable section of a robot and configured to irradiate a region including the object with the laser beam, a laser emission controller configured to control driving of the laser emitter, an image capturing device configured to image the object, on which the laser beam is irradiated, and acquire image data, and a point cloud generator configured to generate, based on the image data, three-dimensional point cloud of the region including the object. The laser emitter includes a laser beam source and a diffuser configured to diffuse the laser beam emitted from the laser beam source.

A moiré pattern imaging device includes a light-transmitting film and an optical sensor. The light-transmitting film includes a plurality of microlenses, and a light-incident surface and a light-exit surface opposite to each other. The plurality of microlenses are disposed on the light-incident surface, the light-exit surface or a combination thereof, and the plurality of microlenses are arranged in two dimensions to form a microlens array. The optical sensor includes a photosurface. The photosurface faces the light-exit surface of the light-transmitting film, the photosurface is provided with a plurality of pixels, and the plurality of pixels are arranged in two dimensions to form a pixel array. The microlens array and the pixel array correspondingly form a moiré pattern effect to produce an imaging magnification effect, and the photosurface of the optical sensor senses light and forms a moiré pattern magnification image.

A structured light projection module and a depth camera are provided. The structured light projection module includes: a light source array including a plurality of sub-light sources arranged in a two-dimensional pattern and configured to transmit array beams corresponding to the two-dimensional pattern; a lens configured to receive and converge the array beams; and a diffractive optical element configured to receive the array beams that are emitted after being converged by the lens and project beams in a structured light speckle pattern. The structured light speckle pattern is formed through staggered superposition of at least two secondary structured light speckle patterns. Each secondary structured light speckle pattern is formed through a tiling arrangement of multiple sub-speckle patterns generated by a portion of the sub-light sources, and comprises speckles formed by diffracting an individual sub-light source via the diffractive optical element.

A dot pattern projector includes a light source array, a lens and a diffracting unit. The light source array includes a plurality of light sources that emit light beams. The lens is configured to collimate the light beams. The diffracting unit is configured to diffract the collimated light beams thereby to project an illumination pattern, wherein the illumination pattern is formed by overlapping multiple dot patterns that are projected by different light sources or interlacing multiple dot patterns that are projected by different light sources.

A line pattern projector includes a light source array, a lens and a diffractive microlens array. The light source array includes a plurality of light sources that emit light beams, wherein the plurality of light sources are arranged along a first direction. The lens is configured to collimate the light beams. The diffractive microlens array (MLA) is configured to diffract the collimated light beams thereby to project an illumination pattern, wherein a lens pitch of the diffractive MLA with respect to the first direction is wider than a lens pitch of the diffractive MLA with respect to a second direction. The illumination pattern is formed by overlapping multiple dot patterns that are projected by the light sources; and the illumination pattern includes a plurality of line light patterns in the first direction.

An optical assembly (13) for a three-dimensional measurement device is equipped with: an optical lens (320) that forms a pair of conjugate planes having an optically conjugate relationship; an optical device (341) that is disposed on one of the pair of conjugate planes; a temperature sensor (354) for detecting the temperature of the optical lens (320); a heater (350) for heating the optical lens (320); and a control part that controls the operation of the heater (350) on the basis of the result of the detection made by the temperature sensor (354) such that the optical lens (320) reaches a constant temperature.