Patent classifications
G01B15/045
METHOD FOR MONITORING AND/OR CALIBRATING A DEVICE DESIGNED FOR THE THREE-DIMENSIONAL X-RAY OPTICAL INSPECTION OF SEEDLINGS IN DIFFERENT GROWTH PHASES
A method for monitoring and/or calibrating a device designed for three-dimensional X-ray optical inspection of seedlings in different growth phases may optically or X-ray optically measure natural seedlings in three dimensions at predetermined times during their growth phase. The method may create a control program for a device which is designed for the three-dimensional printing of artificial seedlings as reference samples which are replicas of the natural seedlings in each case using the recorded measured values. The method may also produce artificial seedlings with a plastic using the device in accordance with the created control program. The artificial seedlings thus produced may be measured three-dimensionally by X-ray optics and the measured values thus acquired may be recorded in a control chart or an already created control chart is adapted, with which control chart monitoring and/or calibration of the device designed for the three-dimensional X-ray optical inspection of seedlings is performed.
Dimension measurement method using projection image obtained by X-ray CT apparatus
In measuring a dimension of an object to be measured W made of a single material, a plurality of transmission images of the object to be measured W are obtained by using an X-ray CT apparatus, and then respective projection images are generated. The projection images are registered with CAD data used in designing the object to be measured W. The dimension of the object to be measured W is calculated by using a relationship between the registered CAD data and projection images. In such a manner, high-precision dimension measurement is achieved by using several tens of projection images and design information without performing CT reconstruction.
Method and device for measuring dimensions by X-rays, on empty glass containers running in a line
The invention concerns a method for measuring the dimensions of empty glass containers (2) consisting in: selecting at least one region to be inspected of the container, transporting the containers, positioning, on either side of the region to be inspected, at least one focus of an X-ray generator tube and image sensors, acquiring, using image sensors, for each container during its displacement, at least three radiographic images of the inspected region, analyzing the at least three radiographic images so as to determine the three-dimensional coordinates of a set of points to deduce at least one inner diameter of the neck and/or one thickness of the body.
Multi-energy x-ray system and method for golf ball inspection
Systems and methods for measuring the concentricity of golf balls using varying energy levels to gather and analyze data on concentricity.
Method and facility for the in-line dimensional control of manufactured objects
A measurement method comprises acquiring, using image sensors (Cji) for each object during its displacement, at least three radiographic images of the region to be inspected. The images are obtained from at least three radiographic projections of the region to be inspected, the directions of projection (Dji) of which are different from each other. A computer system is provided with an a priori geometric model of the region to be inspected for the series of objects. Using the computer system and considering a constant attenuation coefficient and, from the a priori geometric model, at least three radiographic images of the region to be inspected, a digital geometric model of the region to be inspected is determined. For each object of the series, from the digital geometric model of the region to be inspected, at least one linear dimension measurement of the region to be inspected is determined.
Determining the thickness profile of work products
A processing system (10) and a corresponding method are provided for processing work products (WP), including food items, to locate and quantify voids, undercuts and similar anomalies in the work products. The work products are conveyed past an X-ray scanner (14) by a conveyance device (12). Data from the X-ray scanning is transmitted to control system (18). Simultaneously with the X-ray scanning of the work product, the work product is optically scanned at the same location on the work product where X-ray scanning is occurring. The data from the optical scanner is also transmitted to the control system. Such data is analyzed to develop or generate the thickness profile of the work product. From the differences in the thickness profiles generated from the X-ray scanning data versus the optical scanning data, the location of voids, undercuts and similar anomalies can be determined by the control system. This information is used by the processing system (10) to process the work product as desired, including adjusting for the locations and sizes of voids, undercuts and similar anomalies present in the work product.
Method and device for additive manufacturing utilizing simulation test results of a workpiece
Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.
Measuring device, measuring method, and semiconductor storage device
A measuring device includes a measuring stage on which a subject is placed, an X-ray irradiation unit, an X-ray detection unit that detects scattered X-rays generated from the subject and an analysis unit that analyzes the diffraction image obtained by photo-electrically converting scattered X-rays and presumes (estimates) the three-dimensional shape of the subject. In the subject, holes are formed in the ON stack film from the opening of the etching mask film formed on the ON stack film. The analysis unit presumes the three-dimensional shape of the subject based a plurality of the diffraction images acquired while changing a rotation angle of the measuring stage and the measurement data of the subject by at least one of measuring methods of a multi-wavelength light measurement and a laser ultrasonic wave measurement.
COMPUTER-IMPLEMENTED METHOD FOR MONITORING THE STATUS OF A DEVICE FOR INVESTIGATING OBJECTS
Described is a computer-implemented method for monitoring the status of a device for investigating objects, wherein the investigation of an object involves determining measurement data by measuring the object and operating data of the device is determined during the investigation of the object. The method includes: determining measurement data of the object by means of the device; determining operating data of the device during the determining measurement data of the object; determining at least one quality parameter from the measurement data; analysing the operating data and the at least one quality parameter; and determining a status characteristic value based on the analysing in order to monitor the status of the device, wherein the status characteristic value indicates a status of the device. The computer-implemented method comparatively easily monitors the functionality of devices for investigating objects during adaptive measurements.
METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS
In one embodiment, an automatic high-speed X-ray system may generate a high-resolution X-ray image of an inspected sample at a direction substantially orthogonal to a plane of the inspected sample. The system may determine a first cross-sectional shape of a first portion of a first element of interest in the inspected sample based on grayscale values of the X-ray image associated with the first element of interest. The system may determine a second cross-sectional shape of a second portion of the first element of interest in the inspected sample. The second cross-sectional shape may be determined based on the grayscale values of the X-ray image associated with the first element of interest. The system may determine one or more first metrological parameters associated with the first element of interest in the inspected sample based a comparison of the first cross-sectional shape and the second cross-sectional shape.