A single ion imaging-based detection method and device are provided. After being reflected by an electromodulation singularity coupling differential imaging reaction unit, a probe beam from a total internal reflection ellipsometry imager converges on a CCD or CMOS detector, the acquired sensing surface image data is transmitted to a signal processing unit, the common mode noise is eliminated by performing spectral analysis on differential signals of a working sensing surface and a reference sensing surface, the peak intensity of a modulating signal is selected on the spectrum for wave filtering to obtain a real-time signal of interaction of single ions or charged molecules at a solid-liquid interface. Based on the singularity effect at a surface plasma resonance angle of an ellipsometry phase and a corresponding optical signal noise suppression scheme, the present application can achieve real-time observation of the adsorption of single ions or charged molecules at a solid surface.

A system is provided. The system has a femtosecond oscillator to generate pulses used for pump and probe beams. A photonic crystal fiber is disposed in a path of the probe beam and produces pulses for a chirped probe beam. A high NA objective receives the pump and the chirped probe beam, redirects the received beams through a dielectric substrate towards an interface between a sample and the dielectric substrate to cause total internal reflection (TIR) at the sample-substrate interface, and produces corresponding evanescent waves in a portion of the sample adjacent to the sample-substrate interface, and collects a backward-propagating beam of pulses of responsive light. The portion of the sample illuminated by the evanescent waves emits responsive light. The dielectric substrate is transparent to the responsive light, the pump and the chirped probe beam. An image is produced having a specific image size using the received backward-propagating beam.

A system is provided. The system has a femtosecond oscillator to generate pulses used for pump and probe beams. A photonic crystal fiber is disposed in a path of the probe beam and produces pulses for a chirped probe beam. A high NA objective receives the pump and the chirped probe beam, redirects the received beams through a dielectric substrate towards an interface between a sample and the dielectric substrate to cause total internal reflection (TIR) at the sample-substrate interface, and produces corresponding evanescent waves in a portion of the sample adjacent to the sample-substrate interface, and collects a backward-propagating beam of pulses of responsive light. The portion of the sample illuminated by the evanescent waves emits responsive light. The dielectric substrate is transparent to the responsive light, the pump and the chirped probe beam. An image is produced having a specific image size using the received backward-propagating beam.

A single ion imaging-based detection method and device are provided. After being reflected by an electromodulation singularity coupling differential imaging reaction unit, a probe beam from a total internal reflection ellipsometry imager converges on a CCD or CMOS detector, the acquired sensing surface image data is transmitted to a signal processing unit, the common mode noise is eliminated by performing spectral analysis on differential signals of a working sensing surface and a reference sensing surface, the peak intensity of a modulating signal is selected on the spectrum for wave filtering to obtain a real-time signal of interaction of single ions or charged molecules at a solid-liquid interface. Based on the singularity effect at a surface plasma resonance angle of an ellipsometry phase and a corresponding optical signal noise suppression scheme, the present application can achieve real-time observation of the adsorption of single ions or charged molecules at a solid surface.

Systems, methods, and computer-readable storage media are disclosed for providing a structured total internal reflection fluorescence (sTIRF) imaging system providing improved out of focus blur rejection and improved image contrast. The sTIRF imaging system may be configured to illuminate a sample using two beams of light (e.g., a primary beam of light and an interfering beam of light). The interfering beam of light may be configured to create interference with respect to the primary beam of light. The sTIRF imaging system may be configured to capture a plurality of intermediate images of the sample during the illuminating, and to generate a final image of the sample based on the plurality of intermediate images. The interference caused by the two beams of light may enable the sTIRF imaging system to reject out of focus blur based on detection of whether fluorescence emissions from the sample being imaged fluctuate or remain static.

The present invention relates to a rotating-compensator ellipsometer, comprising the following elements in the light path in this order according to the propagation direction of light: a light source (1); a polarizer (2); a compensator (3a), arranged in a supporting and rotating assembly (4) and comprising an optical axis (O); an analyzer (5); a detector (6), wherein the rotating-compensator ellipsometer further comprises a control unit (7) that is operably connected to at least one of the above elements, wherein the compensator (3a) is a concave prism, having at least five planar surfaces that are perpendicular to a median plane of the prism, said median plane including the optical axis (O), wherein a first planar surface (301) of the prism is perpendicular to the optical axis (O); a second planar surface (302) of the prism forms an angle of 90- with the optical axis (O); a third planar surface (303) of the prism is parallel with the optical axis (O), is perpendicular to the first planar surface (301) and is provided with a reflective coating; a fourth planar surface (304) of the prism forms an angle of 90- with the optical axis (O); a fifth planar surface (305) of the prism is parallel with the first planar surface (301) and is perpendicular to the third planar surface (303), and wherein 45<<65.

Methods and systems for imaging precision ellipsometry of a sample are provided. The method includes shining a source of linearly polarised light on a surface of the sample wherein light reflected off the surface of the sample has elliptic polarisation. The method further includes converting polarisation of the light reflected off the surface of the sample into linear polarisation suitable for a polarisation modulator by a retarder and oscillating a polarisation modulator to measure the polarisation rotation of the polarised light passing through the retarder. In addition, the method includes synchronising acquisition of images of the light from the retarder with oscillations of the polarisation modulator to acquire first array images during positive half-periods of oscillations of the polarisation modulator and to acquire second array images during negative half-periods of the oscillations of the polarisation modulator. Finally, the method includes differential image processing of the first array images and the second array images to generate difference images comprising a plurality of pixels, the value of each of the plurality of pixels in each of the difference images being proportional to the polarisation rotation of the light reaching the polarisation modulator from the sample.

Various embodiments may provide an optical sensing device based on surface plasmon resonance (SPR). The optical sensing device may include an optical arrangement configured to provide a first polarization light beam and a second polarization light beam, and a first optical member including a sensing surface, the first optical member configured to receive the first and second polarization light beams and reflect the first and second polarization light beams at the sensing surface. The optical sensing device may further include a second optical member arranged to receive the reflected first and second polarization light beams from the first optical member and configured to separate the reflected first and second polarization light beams in a first direction and a second direction, respectively. The optical device may additionally include a detector arrangement configured to detect the reflected first and second polarization light beams from the second optical member.

Methods and systems for imaging precision ellipsometry of a sample are provided. The method includes shining a source of linearly polarised light on a surface of the sample wherein light reflected off the surface of the sample has elliptic polarisation. The method further includes converting polarisation of the light reflected off the surface of the sample into linear polarisation suitable for a polarisation modulator by a retarder and oscillating a polarisation modulator to measure the polarisation rotation of the polarised light passing through the retarder. In addition, the method includes synchronising acquisition of images of the light from the retarder with oscillations of the polarisation modulator to acquire first array images during positive half-periods of oscillations of the polarisation modulator and to acquire second array images during negative half-periods of the oscillations of the polarisation modulator. Finally, the method includes differential image processing of the first array images and the second array images to generate difference images comprising a plurality of pixels, the value of each of the plurality of pixels in each of the difference images being proportional to the polarisation rotation of the light reaching the polarisation modulator from the sample.

Various embodiments may provide an optical sensing device based on surface plasmon resonance (SPR). The optical sensing device may include an optical arrangement configured to provide a first polarization light beam and a second polarization light beam, and a first optical member including a sensing surface, the first optical member configured to receive the first and second polarization light beams and reflect the first and second polarization light beams at the sensing surface. The optical sensing device may further include a second optical member arranged to receive the reflected first and second polarization light beams from the first optical member and configured to separate the reflected first and second polarization light beams in a first direction and a second direction, respectively. The optical device may additionally include a detector arrangement configured to detect the reflected first and second polarization light beams from the second optical member.