A method of assessing tissue health comprises the steps of obtaining depth-resolved spectra of a selected area of in vivo tissue, and assessing the health of the selected area based on the depth-resolved structural information of the scatterers. Obtaining depth-resolved spectra of the selected area comprises directing a sample beam towards the selected area at an angle, and receiving an angle-resolved scattered sample beam. The angle-resolved scattered sample beam is cross-correlated with the reference beam to produce an angle-resolved cross-correlated signal about the selected area, which is spectrally dispersed to yield an angle-resolved, spectrally-resolved cross-correlation profile having depth-resolved information about the selected area. The angle-resolved, spectrally-resolved cross-correlation profile is processed to obtain depth-resolved information about scatterers in the selected area.

A method of processing a glass material includes guiding and/or focusing light from a light source to glass material in a hot stage of a processing system, where the light source provides light at a wavelength λ that interacts with crystals that may be formed in the glass material. The method includes collecting and/or guiding light directed from the glass material in the hot stage to a wavelength separator, and separating the light directed from the glass material to provide a spectrum δ having wavelengths that are within about twenty nanometers of the wavelength λ. The method includes observing with a detector light of the spectrum δ to identify nano-scale shifts in the wavelength λ caused by interaction with crystals, if present, within the glass material in the hot stage of the processing system.

A method and an LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate are described. The method comprises the steps of i) providing an LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source (A) that emits over the whole range of 8 to 14 micrometers, b) an LWIR detecting device (B) and c) a ToF distance sensor (C), ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, ii) irradiating the provided substrate with the infrared light emitting source and iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.

Apparatuses and methods are described for detecting inclusions in glass. The apparatuses and methods employ a laser that is configured to project a laser sheet at a first angle from one side of a glass sheet, and a camera configured to capture images from a second angle from another side of the glass sheet. The glass sheet is moved thorough the laser sheet while the camera captures images. One or more processing devices execute image processing algorithms to identify areas of the glass sheet containing inclusions based on the captured images. In some examples, the identified areas of the glass sheet are revisited to confirm they contain inclusions.

Apparatus and methods for spectral analysis of a sample are described, for example for carrying out Raman or other optical or spectroscopic analysis of samples such as pharmaceutical dosage forms, including oral solid dosage forms such as tablets or capsules. Such apparatus may comprise delivery optics arranged to direct probe light to a delivery region of the sample, collection optics arranged to collect probe light scattered from a collection region of the sample, and a spectrometer having an entrance port, the spectrometer being arranged to receive the collected probe light from the collection optics at the entrance port of the spectrometer, and to detect spectral features in the received probe light. In particular, the collection optics may comprise Koehler integration optics arranged to process the collected probe light such that the collected light from each point of the collection region is distributed across the entrance port of the spectrometer.

The disclosure relates to system and method for determining at least one property of a porous medium and includes performing a first measurement on a sample of the porous medium obtaining an optical path through pores of the porous medium using a first sensor applied utilizing a first optical technology; performing a second measurement on the sample of the porous medium obtaining a total optical path through the porous medium using a second sensor utilizing a second optical technology different from the first optical technology; and calculating an optical porosity of the porous medium based on the optical path through the pores and the total optical path through the porous medium.

The present invention relates to a method for evaluating the thermal expansion properties of a titania-containing glass body. On the basis of measured values, obtained at a certain temperature, for a physical parameter that changes depending on the titania concentration and a physical parameter that changes depending on the fictive temperature, the thermal expansion coefficient of the titania-containing silica glass body and the slope of the thermal expansion coefficient are calculated using a linear relational expression represented by a plurality of physical properties. The thermal expansion properties of the titania-containing silica glass body are evaluated on the basis of the calculated thermal expansion coefficient and thermal expansion coefficient slope.

A system for detecting microbes is provided. In the system for detecting microbes, light is emitted to a sample through a light emission module, a sensor module detects speckles generated when the emitted light is scattered by motion of bacteria or microbes contained in the sample, and a controller stores and analyzes images detected by the sensor module to test microbial detection, wherein controller may include a light emission controller connected to the light emission module and configured to control an emission period and an emission intensity of light emitted by the light emission module; an imaging collector connected to the sensor module and configured to store a speckle image generated through multiple scattering by the bacteria or microbes contained in the sample; a corrector configured to correct a deviation caused by a difference in the amount of light when the light emission module emits the light; and an estimator configured to estimate, in real-time, presence or absences of the bacteria or microbes in the sample or a concentration of the bacteria or microbes.

The invention provides a defect inspection apparatus. The defect inspection apparatus includes: an illumination optical system configured to irradiate a sample with an illumination spot; a detection unit configured to detect, from a plurality of directions, reflected light from the sample irradiated with the illumination spot of the illumination optical system; a control unit configured to control a scan of the sample with the illumination spot of the illumination optical system by overlapping detection regions such that the detection regions partially overlap, the detection regions being detected by the detection unit configured to execute a detection from the plurality of directions when the sample is scanned with the illumination spot of the illumination optical system; and a signal processing unit configured to process a signal obtained by detecting the reflected light from the sample by the detection unit to detect a defect. The signal processing unit includes: a data integration unit configured to synthesize an integrated signal by processing the signal detected a plurality of times by overlapping the reflected light of the sample for each detection region by the detection unit; and a defect detection unit configured to detect the defect on a surface of the sample based on the integrated signal synthesized by the data integration unit.

An optoelectronic device may include an arrangement having a plurality of emitter elements configured to sequentially emit light of different wavelength ranges. The arrangement may include a plurality of time-of-flight detector elements configured to detect the light emitted by the emitter elements and reflected at a sample and to carry out a measurement for determining the distance of the reflection point of the light at the sample from the respective time-of-flight detector element. The device further includes an evaluation unit configured to generate a three-dimensional image of the sample for each wavelength range emitted by the emitter elements on the basis of the light detected by the time-of-flight detector elements and the distance of the reflection point of the light from the respective time-of-flight detector element and to determine the distribution of a substance in the sample from the images.