G01R1/06788

CONDUCTIVE TEST PROBE
20180003738 · 2018-01-04 · ·

A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

CLAMP-TYPE PROBE DEVICE
20180011146 · 2018-01-11 · ·

A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

Automated method to check electrostatic discharge effect on a victim device

Some aspects of this disclosure are directed to an automated method to check electrostatic discharge (ESD) effect on a victim device. For example, some aspects of this disclosure relate to a method, including determining a probe point, in a circuit design, for determining effective resistance between the probe point and ground, where the probe point is on an ESD path of in the circuit design. The method includes determining voltage between the probe point and the ground. The method further includes comparing, by a processing device, a resistance value of the ESD path determined based a predefined electric current value at a source point and the measured voltage with a target resistance value range. The method further includes reporting a violation upon determining that the determined resistance value of the ESD path is outside the target resistance value range.

PROBE CABLE ASSEMBLY AND METHOD
20230024181 · 2023-01-26 ·

The present disclosure provides a probe cable assembly comprising a probe interface configured to couple to a measurement interface and to receive a differential signal, a measurement output interface configured to output the differential signal, and a cable arrangement electrically arranged between the probe interface and the measurement output interface and configured to conduct the differential signal between the probe interface and the measurement output interface, the cable arrangement comprising a cable, a plurality of magnetic elements arranged around at least a section of the length of the cable, wherein each magnetic element is separated by a gap from adjacent magnetic elements, and a plastically deformable guiding element configured to fix the cable arrangement with a predetermined relative position between the probe interface and the measurement output interface.

Current sensor with reduced voltage coupling
11703525 · 2023-07-18 · ·

A current sensor includes a current sense coil disposed about a conductive lead, the current sense coil configured to sense a current passing through the conductive lead. The current sense coil includes: a first outer coil configured to detect a first magnetic field generated by the current; a second outer coil configured to detect the first magnetic field, the second outer coil further configured to cancel an electrical field induced in the first outer coil; and an inner conductor disposed between the first outer coil and the second outer coil, the inner conductor configured to detect a second magnetic field generated by the current.

Non-Contact Voltage Tester Lightbulb Socket Adapter
20230213364 · 2023-07-06 ·

A lightbulb socket adapter for a hand-held non-contact voltage tester is disclosed. The adaptor having a first engagement feature configured to at least partially couple with a hand-held non-contact voltage tester and a second engagement feature configured to be at least partially disposed within a lightbulb socket. A first embodiment has an adaptor with a male Edison screw, and a second embodiment has an adaptor with protrusions on elastically deformable limbs configured to snap down into a female Edison screw and unscrew out.

Test Shunt Clamp Device
20230213557 · 2023-07-06 ·

The present invention relates to a test shunt clamp device for testing railroad tracks by creating either a hard-wired effect or an impedance. The device has at least two clamps that can be attached to a rail track of a railroad track. Once attached, a toggle switch can be placed in the “HW” or “0.06” position such that the switchable choice between hard-wire and a resistor (that the first and second wires are connected to) delivers a hard-wired effect or a 0.06 ohm impedance to each rail track via a first pointed member of the first clamp attached to the first wire and a second pointed member of the second clamp attached to the second wire.

Voltage Sensing Mechanism
20220349372 · 2022-11-03 ·

The present disclosure relates to voltage sensing mechanisms. One example embodiment includes a voltage-measurement device. The voltage-measurement device includes a housing. The voltage-measurement device also includes an extendible gripper configured to be removably attached to a wire under test. Additionally, the voltage-measurement device includes at least one power supply. Further, the voltage-measurement device includes a power management chip electrically coupled to the at least one power supply and configured to manage a range of input voltages from the at least one power supply. The power management chip comprises a synchronous boost voltage regulator. Additionally, the voltage-management device has a microprocessor electrically coupled to the power management chip and the extendible gripper. The microprocessor is configured to receive electrical power from the power management chip. The microprocessor is also configured to receive an electrical signal from the extendible gripper indicative of a voltage associated with the wire under test.

Non-invasive current sensing device
11614470 · 2023-03-28 · ·

A current sensing device includes a housing with a head adapted for releasably holding a wire of an electrical circuit without breaking the electrical circuit. The head has one or more current sensors configured to sense direct current in the wire without breaking the electrical circuit. The housing includes an alarm to indicate if the current sensing device senses a current in the electrical wire above a predefined threshold current. The head has a clip base and clip member that form an internal channel to closely receive the electrical wire and to releasably hold the electrical wire for testing. In some embodiments, the head has an internal channel that intersects the outer surface of the head and forms a longitudinal opening to allow insertion of the wire into the internal channel. The current sensing device has a processor programed to calibrate the current sensing device to compensate for electrical noise.

Protection adapter for oscilloscope probes

Systems and methods for monitoring current anomaly are described. In an example, a device can measure first current flowing along a first liner between an instrument to an equipment. The device can measure second current flowing along a second line between the equipment to the instrument. The device can compare the measurements of the first current and the second current. The device can identify a presence of current anomaly based on the comparison of the measurements of the first and second currents. The device can, in response to the presence of the current anomaly, disconnect the instrument from the equipment.