The present invention relates to resistive leakage current in a surge arrester that measures not voltage but leakage current alone in the surge arrester to obtain a resistive leakage current included in the leakage current so as to compensate for shortcomings in conventional metal-oxide surge arresters. The present invention performs a reference point detecting step (S20) to select a reference point by performing pattern analysis based on a characteristic pattern shown in a total leakage current (I.sub.T) when an applied voltage is 0V, a resistive leakage current calculating step (S30) to calculate a resistive leakage current by Fourier series-expanding the total leakage current (I.sub.T) starting at the reference point, and reference point verifying/correcting steps (S40 and S41) to correct the reference point until a characteristic pattern of the resistive leakage current (I.sub.R) according to non-linear resistance characteristics of the surge arrester (1) is shown so that the resistive leakage current (I.sub.R) is recalculated, and the present invention determines that the resistive leakage current (I.sub.R) calculated based on the completely corrected reference point is the resistive leakage current of the surge arrester (1).

A method of controlling a multi-phase power converter having a plurality of power stage circuits coupled in parallel, can include: obtaining a load current of the multi-phase power converter; enabling corresponding power stage circuits to operate in accordance with the load current, such that a switching frequency is maintained within a predetermined range when the load current changes; and controlling the power stage circuits to operate under different modes in accordance with the load current, such that the switching frequency is maintained within the predetermined range when the load current changes.

A shoot-through protection circuit includes a current sensor providing a sensor signal connected to a comparator input via at least a burden resistor. A switch protection circuit including a protection input connected to an output of the comparator and a plurality of outputs. Each of the outputs is connected to a corresponding switch in a plurality of stacked switches. Wherein the switch protection circuit is configured to drive each switch of the plurality of stacked switches open in response to a positive output signal from the comparator.

The present invention relates to a method for diagnosing the state of the capacitor in a modular converter. The method for diagnosing the state of the capacitor in a modular converter includes determining a FIT table depending on the input voltage and temperature of an internal capacitor for multiple sample modular converters; detecting, by an input voltage detection unit, the input voltage of the capacitor in a target modular converter, the state of the capacitor of which is to be diagnosed, during a preset period; detecting, by a temperature detection unit, the temperature of the capacitor of the target modular converter during the preset period; calculating the cumulative mean for the input voltage and the temperature, which are respectively detected by the input voltage detection unit and the temperature detection unit during the preset period; and selecting, by a control unit, a FIT value corresponding to the cumulative mean of the input voltage and the temperature, from the FIT table; and extracting the MTBF of the capacitor from the FIT table.

A method of detecting self-clearing, sub-cycle faults comprises sensing a current condition and a voltage condition at a location along a power cable. The sensed conditions are relayed to an analyzing device, the analyzing device including a current peak detector. The presence of a measured current value is determined. If the measured current value is greater than a current threshold value, a faulted circuit indicator (FCI) analysis is performed to determine the presence or absence of an FCI fault. If an FCI fault is absent, an incipient fault analysis is performed, wherein the RMS current values before and after a threshold event are compared and the voltage total harmonic distortion (THD) before and after the event are compared. If the two current values are within a first predetermined percentage and the THD values differ by a second predetermined percentage, then an incipient fault is reported. If either the two current values are not within the first predetermined percentage or the THD values do not differ by at least the second predetermined percentage,

In an example, a system includes a first power stage including a first power field effect transistor (FET) and a first sense transistor coupled to the first power FET. The system also includes a second power stage including a second power FET and a second sense transistor coupled to the second power FET, where the second power stage is smaller than the first power stage. The system includes a first switch coupled to a gate and a drain of the first power FET and a second switch coupled to the first power stage and the second power stage. The system also includes a sense amplifier coupled to the second switch, where the first power stage, the second power stage, and the sense amplifier are coupled to a load terminal.

An electronic fuse circuit includes an electronic switch with a load current path coupled between an output node and a supply node and that connects or disconnects the output node and the supply node in accordance with a drive signal. The circuit includes a control circuit to generate the drive signal based on an input signal. A monitoring circuit is included in the control circuit to receive a current sense signal representing the load current passing through the load current path and to determine a first protection signal based on the current sense signal and a wire parameter. The first protection signal is indicative of whether to disconnect the output node from supply node. The control circuit changes from normal mode to idle mode when the load current is below a given current threshold and another criterion is fulfilled.

A current measurement apparatus for a three-phase inverter, according to one embodiment of the present invention, comprises: a current detection element connected to a lower end of one of three lower switches constituting the inverter; a current measurement unit measuring currents by using the current detection element and the two lower switches that are not connected to the current detection element; and a current correction unit for correcting, on the basis of the relationship between a first current value measured by means of the current detection element and second and third current values measured by means of the two lower switches, the second and third current values.

A memory system includes a connector through which power for the memory system is to be supplied from an external device, a controller, a nonvolatile memory device, a power source circuit connected to the controller and the nonvolatile memory device by power lines through which power is supplied to the controller and the nonvolatile memory device, and a power source control circuit that receives a supply of power from the external device through the connector and supplies the power to the power control circuit. The power source control circuit is configured to detect using a divided voltage of a voltage of the power supplied thereto, that the voltage of the power supplied thereto is higher than a predetermined voltage and interrupt the power supplied to the power control circuit if the voltage of the power supplied thereto is higher than the predetermined voltage.

According to one embodiment, a multichannel switch integrated circuit (IC) includes a multichannel switch circuit and a common test terminal. The multichannel switch circuit includes a plurality of switch circuitries. Each of the switch circuitries includes: an output transistor that outputs an output signal through an output terminal; an overcurrent detection circuit that detects a detection current according to a current flowing through the output transistor; and a diode having an anode that receives the detection current. The common test terminal is connected to each channel switch circuitry, connected to the overcurrent detection circuit through the diode, and connected to a cathode of the diode.