A method of using a resonant cavity for measuring a complex permittivity ε and identifying of a sample (solid or liquid) of microliter volume size includes using a network analyzer to measure over a defined millimeter wave frequency range, a first resonance frequency at a cavity resonance mode, and calculating an unloaded quality factor of an enclosed resonant waveguide cavity of a defined internal dimensions, placing a sample on a surface of a bottom wall of the resonant waveguide cavity and measure a second resonance frequency and calculating a loaded quality factor; determining, a resonance frequency shift Δf=(f.sub.s−f.sub.o), determining a complex permittivity ε of the sample according to the resonance frequency shift Δf, the loaded quality factor, the unloaded quality factor and the defined internal dimensions; and identifying the sample using a database through the complex permittivity ε.

A method and system of a method of measuring complex dielectric constant and permeability includes directing two polarizations onto a material under test and measuring one or more values of reflection coefficients. Further, the method includes integrating a p-wave reflection coefficient and a s-wave reflection coefficient and calculating, based on the measured one or more values of the reflection coefficients in association with a Brewster's angle, one or more of a complex dielectric constant and permeability.

An automated resonant waveguide cavity system for determining one or complex permittivity measurements of a sample is provided. The automated resonant waveguide cavity system includes a resonant cavity, a waveguide coupled to the resonant cavity, a programmable network analyzer (PNA) coupled to the waveguide, and a computing device. The computing device includes a memory storing processor executable code for a determination engine and a processor executing the processor executable code to cause the determination engine to obtain data from the PNA. The data is respective to the sample within the resonant cavity. The determination engine further integrates a plurality of analytical and modeling functions in determining the complex permittivity values of the sample from the data.

An automated resonant waveguide cavity system for determining one or complex permittivity measurements of a sample is provided. The automated resonant waveguide cavity system includes a resonant cavity, a waveguide coupled to the resonant cavity, a programmable network analyzer (PNA) coupled to the waveguide, and a computing device. The computing device includes a memory storing processor executable code for a determination engine and a processor executing the processor executable code to cause the determination engine to obtain data from the PNA. The data is respective to the sample within the resonant cavity. The determination engine further integrates a plurality of analytical and modeling functions in determining the complex permittivity values of the sample from the data.

A balanced-type circular disk resonator includes a circular conductive layer, a conductive member including a first conductive portion provided on a first surface of the circular conductive layer to enable a first dielectric board, a dielectric property of which is measured, to be placed between the first conductive portion and the circular conductive layer, and a second conductive portion provided on a second surface of the circular conductive layer to enable a second dielectric board, a dielectric property of which is measured, to be placed between the second conductive portion and the circular conductive layer, the second surface being opposite to the first surface with regard to the circular conductive layer, and a temperature adjustment unit coupled to the conductive member and configured to adjust temperatures of the first conductive portion and the second conductive portion.

A balanced-type circular disk resonator includes a circular conductive layer, a conductive member including a first conductive portion provided on a first surface of the circular conductive layer to enable a first dielectric board, a dielectric property of which is measured, to be placed between the first conductive portion and the circular conductive layer, and a second conductive portion provided on a second surface of the circular conductive layer to enable a second dielectric board, a dielectric property of which is measured, to be placed between the second conductive portion and the circular conductive layer, the second surface being opposite to the first surface with regard to the circular conductive layer, and a temperature adjustment unit coupled to the conductive member and configured to adjust temperatures of the first conductive portion and the second conductive portion.

Disclosed is a TDR measuring apparatus for determining the dielectric constant and material properties derived therefrom of a medium flowing through a pipeline. The apparatus includes signal generation electronics which generate TDR measurement signals, transmitting and receiving electronics, a coupling-in/coupling-out apparatus which couples the TDR measurement signals into and out of an electrically conductive measuring probe of a predefined length, and control/evaluation electronics which use the propagation time of the TDR measurement signals to determine the dielectric constant. The measuring probe is arranged in an electrically insulated manner outside of the pipeline. Alternately, the measuring probe is placed in the pipeline such that the outer surface of the measuring probe facing the medium terminates flush with the inner surface of the pipeline and is configured such that the propagation time and the amplitude of the measurement signals on the measuring probe are dependent on the dielectric constant of the medium.

A specific conductivity measurement method includes: performing first measurement to obtain a resonance frequency f.sub.1 that is outputted to a measuring device when the first and second dielectric flat plates each have a thickness t.sub.1, and an unloaded Q.sub.u1 that corresponds to the resonance frequency f.sub.1; performing second measurement to obtain a resonance frequency f.sub.2 that is outputted to the measuring device when the first and second dielectric flat plates each have a thickness t.sub.2 that is different from the thickness t.sub.1, and an unloaded Q.sub.u2 that corresponds to the resonance frequency f.sub.2; and calculating a specific conductivity σ.sub.r of the copper foil and the first and second conductor flat plates based on an arithmetic equation that includes the resonance frequency the unloaded Q.sub.u1, the resonance frequency f.sub.2, and the unloaded Q.sub.u2.

Disclosed is a TDR measuring apparatus for determining the dielectric constant and material properties derived therefrom of a medium flowing through a pipeline. The apparatus includes signal generation electronics which generate TDR measurement signals, transmitting and receiving electronics, a coupling-in/coupling-out apparatus which couples the TDR measurement signals into and out of an electrically conductive measuring probe of a predefined length, and control/evaluation electronics which use the propagation time of the TDR measurement signals to determine the dielectric constant. The measuring probe is arranged in an electrically insulated manner outside of the pipeline. Alternately, the measuring probe is placed in the pipeline such that the outer surface of the measuring probe facing the medium terminates flush with the inner surface of the pipeline and is configured such that the propagation time and the amplitude of the measurement signals on the measuring probe are dependent on the dielectric constant of the medium.

An input device is disclosed that provides reduced electromagnetic emissions while detecting the presence of an input object. In one embodiment, a first set of sensor electrodes is driven with a first modulated signal while a second set of sensor electrodes is driven with a second set of modulated signals that is based on an inverted first modulated signal. The first set of sensor electrodes may determine a capacitance value while the second set of sensor electrodes may reduce electromagnetic emissions associated with the first set of sensor electrodes.